المؤلفون: Ian C Flores, Yenny L Casallas-Moreno, Ángel Sacramento, Magali Ramírez-Como, Marlene Camacho-Reynoso, Víctor Cabrera, Yuriy Kudriavtsev, Carlos Rivera-Rodríguez, Luis M Reséndiz

المصدر: Materials Research Express, Vol 11, Iss 12, p 125103 (2024)

مصطلحات موضوعية: non-fullerene acceptor stability, inverted organic solar cells (iOSC), PM6:Y7 active layer degradation, TOF-SIMS, XPS depth profiling, Materials of engineering and construction. Mechanics of materials, TA401-492, Chemical technology, TP1-1185

Relation: https://doi.org/10.1088/2053-1591/ad9c1a; https://doaj.org/toc/2053-1591; https://doaj.org/article/fed25ce239644bb28f44f4981821d2df

الاتاحة: https://doi.org/10.1088/2053-1591/ad9c1a
https://doaj.org/article/fed25ce239644bb28f44f4981821d2df