المؤلفون: Zeltmann, Steven E, Hsu, Shang-Lin, Brown, Hamish G, Susarla, Sandhya, Ramesh, Ramamoorthy, Minor, Andrew M, Ophus, Colin

مصطلحات موضوعية: Macromolecular and Materials Chemistry, Chemical Sciences, Physical Sciences, Scanning transmission electron microscopy, Electron diffraction, Nanobeam electron diffraction, 4D-STEM, Atomic, Molecular, Nuclear, Particle and Plasma Physics, Optical Physics, Other Physical Sciences, Microscopy, Biochemistry and cell biology, Physical chemistry, Condensed matter physics

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/5tc6399v
https://escholarship.org/content/qt5tc6399v/qt5tc6399v.pdf

المؤلفون: Ophus, Colin, Zeltmann, Steven E, Bruefach, Alexandra, Rakowski, Alexander, Savitzky, Benjamin H, Minor, Andrew M, Scott, Mary C

المصدر: Microscopy and Microanalysis. 28(2)

مصطلحات موضوعية: Biochemistry and Cell Biology, Engineering, Materials Engineering, Biological Sciences, automated crystal orientation mapping, four-dimensional scanning transmission electron microscopy, nanobeam electron diffraction, open-source software, scanning electron nanodiffraction, CSD-46-All CSGB, Condensed Matter Physics, Microscopy, Biochemistry and cell biology, Materials engineering

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/3fh6j9b0
https://escholarship.org/content/qt3fh6j9b0/qt3fh6j9b0.pdf

المؤلفون: Allen, Frances I, Pekin, Thomas C, Persaud, Arun, Rozeveld, Steven J, Meyers, Gregory F, Ciston, Jim, Ophus, Colin, Minor, Andrew M

المصدر: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 27(4)

مصطلحات موضوعية: 4D-STEM, NNMF, PCA, grain orientation mapping, scanning nanobeam electron diffraction, Stem Cell Research, Bioengineering, physics.app-ph, cond-mat.mtrl-sci, Microscopy, Condensed Matter Physics, Biochemistry and Cell Biology, Materials Engineering

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/78s2p398

المؤلفون: Guan-Hua Chen, Yu-Rui Chen, Zefu Zhao, Jia-Yang Lee, Yun-Wen Chen, Yifan Xing, Rachit Dobhal, C. W. Liu

المصدر: IEEE Journal of the Electron Devices Society, Vol 11, Pp 752-758 (2023)

مصطلحات موضوعية: Hf₀.₅Zr₀.₅O₂, nanobeam electron diffraction (NBD), Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10329931/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/0d5acf9cc4164bc4b4c0cf65b40af955

المؤلفون: Zeltmann, Steven E, Müller, Alexander, Bustillo, Karen C, Savitzky, Benjamin, Hughes, Lauren, Minor, Andrew M, Ophus, Colin

مصطلحات موضوعية: Quantum Physics, Physical Sciences, Bioengineering, Scanning transmission electron microscopy, Strain mapping, Electron diffraction, Nanobeam electron diffraction, 4D-STEM, physics.app-ph, cond-mat.mtrl-sci, Atomic, Molecular, Nuclear, Particle and Plasma Physics, Optical Physics, Other Physical Sciences, Microscopy, Biochemistry and cell biology, Physical chemistry, Condensed matter physics

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/76r6s147
https://escholarship.org/content/qt76r6s147/qt76r6s147.pdf

المؤلفون: Pekin, TC, Gammer, C, Ciston, J, Ophus, C, Minor, AM

مصطلحات موضوعية: Nanobeam electron diffraction, Strain measurement, Scanning/transmission electron microscopy, Planar slip, Materials, Condensed Matter Physics, Materials Engineering, Mechanical Engineering

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/0pg184d8

المؤلفون: Pekin, Thomas C, Gammer, Christoph, Ciston, Jim, Ophus, Colin, Minor, Andrew M

مصطلحات موضوعية: Engineering, Materials Engineering, Nanobeam electron diffraction, Strain measurement, Scanning/transmission electron microscopy, Planar slip, Condensed Matter Physics, Mechanical Engineering, Materials, Materials engineering, Mechanical engineering, Condensed matter physics

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/0pg184d8
https://escholarship.org/content/qt0pg184d8/qt0pg184d8.pdf

المساهمون: Ophus, Colin [Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy, Molecular Foundry]

المصدر: Ultramicroscopy; 176; C

وصف الملف: Medium: ED; Size: p. 170-176

URL الوصول: http://www.osti.gov/scitech/servlets/purl/1379825

المؤلفون: Mengkun Tian, Wesley D. Tennyson, Mina Yoon, Alexander A. Puretzky, David B. Geohegan, Gerd Duscher, Gyula Eres

مصطلحات موضوعية: Biophysics, Medicine, Physiology, Biotechnology, Immunology, Developmental Biology, Computational Biology, Chemical Sciences not elsewhere classified, Information Systems not elsewhere classified, significant performance improvement, key factor responsible, conventional metal catalysts, carbon 123 <, nanobeam electron diffraction, high corrosion resistance, electronic structure transformations, doped carbon nanostructures, previous work (<, b doping enhances, oxidation resistance, electronic structures, electron energy, doped flgs, use aberration, transition features, stabilizing boron, nanoscale corrugation, loss spectroscopy, layer graphene, increased stability

Relation: https://figshare.com/articles/journal_contribution/Role_of_Curvature_in_Stabilizing_Boron-Doped_Nanocorrugated_Graphene/24857216

الاتاحة: https://doi.org/10.1021/acsami.3c10664.s001
https://figshare.com/articles/journal_contribution/Role_of_Curvature_in_Stabilizing_Boron-Doped_Nanocorrugated_Graphene/24857216

المؤلفون: Pekin, Thomas C, Gammer, Christoph, Ciston, Jim, Minor, Andrew M, Ophus, Colin

المصدر: Ultramicroscopy. 176

مصطلحات موضوعية: Nanobeam electron diffraction, Strain measurement, Microscopy, Optical Physics, Other Physical Sciences, Atomic, Molecular, Nuclear, Particle and Plasma Physics, Atomic, Molecular, Nuclear, Particle and Plasma Physics

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/5pc374hf

المؤلفون: Johansson, Malin B., Xie, Ling, Kim, Byeong Jo, Thyr, Jakob, Kandra, Timo, Johansson, Erik M. J., Göthelid, Mats, Edvinsson, Tomas, Boschloo, Gerrit

المصدر: Nano Energy. 78

مصطلحات موضوعية: High-angle annular dark-field imaging, MAPbI3 crystal growth, Nano-beam electron diffraction, Perovskite solar cells, PL mapping, Crystal growth, Crystallites, Crystallization, Energy dispersive spectroscopy, Energy efficiency, Fabrication, Grain boundaries, Layered semiconductors, Lead compounds, Lead metallography, Morphology, Nanocrystalline materials, Optical properties, Perovskite, Shells (structures), Single crystals, Solvents, Thin film solar cells, Thin films, Transmission electron microscopy, Vacuum evaporation, Crystalline thin films, Energy dispersive X ray spectroscopy, Flexible manufacturing, Grain boundary effects, Nanobeam electron diffraction, Scanning transmission electron microscopes, Solar cell fabrication, Solar cell performance, Crystal structure

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-287900
https://doi.org/10.1016/j.nanoen.2020.105346

المؤلفون: Chun-Yuan Wang (1499881), Chin-I Wang (8676417), Sheng-Han Yi (10573292), Teng-Jan Chang (8676420), Chun-Yi Chou (2163553), Yu-Tung Yin (2106286), Hsin-Chih Lin (6116120), Miin-Jang Chen (1397377)

مصطلحات موضوعية: Medicine, Biotechnology, Developmental Biology, Computational Biology, Space Science, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, nanobeam electron diffraction, ZrO 2, film, back-end-of-line process integration, dielectric properties, ZrO 2 Tailoring, X-ray photoelectron spectroscopy, paraelectric-to-antiferroelectric p., nanoscale TiN layer, TiO x N y, strain

Relation: https://figshare.com/articles/journal_contribution/Impact_of_a_TiN_Capping_Layer_on_Phase_Transformation_and_Capacitance_Enhancement_in_ZrO_sub_2_sub_/14388602

الاتاحة: https://doi.org/10.1021/acsaelm.1c00161.s001

المؤلفون: Miroslav Slouf, Radim Skoupy, Ewa Pavlova, Vladislav Krzyzanek

المصدر: Materials; Volume 14; Issue 24; Pages: 7550

مصطلحات موضوعية: nanoparticle analysis, powder nanobeam electron diffraction, 4D-STEM

وصف الملف: application/pdf

Relation: Advanced Materials Characterization; https://dx.doi.org/10.3390/ma14247550

الاتاحة: https://doi.org/10.3390/ma14247550

المؤلفون: Miroslav Slouf, Radim Skoupy, Ewa Pavlova, Vladislav Krzyzanek

المصدر: Nanomaterials; Volume 11; Issue 4; Pages: 962

مصطلحات موضوعية: nanoparticle analysis, powder nanobeam electron diffraction, 4D-STEM/PNBD

وصف الملف: application/pdf

Relation: https://dx.doi.org/10.3390/nano11040962

الاتاحة: https://doi.org/10.3390/nano11040962

المؤلفون: Paul F. Rottmann, Kevin J. Hemker

المصدر: Materials Research Letters, Vol 6, Iss 4, Pp 249-254 (2018)

مصطلحات موضوعية: Nanobeam electron diffraction, strain measurement, transmission electron microscopy, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2166-3831

URL الوصول: https://doaj.org/article/c63b5ddfb0414ba9aff24f251bddc3ff

المؤلفون: Niemeyer, Tobias Wolfgang Günter

المساهمون: Seibt, Michael Prof. Dr., Hofsäss, Hans Christian Prof. Dr.

مصطلحات موضوعية: Physik (PPN621336750), FIB preparation, Transmission electron microscopy, Gallium nitride, Nanobeam electron diffraction, Twinning

Time: 530

Relation: http://resolver.sub.uni-goettingen.de/purl?ediss-11858/14939; http://dx.doi.org/10.53846/goediss-10160; urn:nbn:de:gbv:7-ediss-14939-1

الاتاحة: http://resolver.sub.uni-goettingen.de/purl?ediss-11858/14939
https://doi.org/10.53846/goediss-10160
https://nbn-resolving.org/urn:nbn:de:gbv:7-ediss-14939-1

المؤلفون: Pekin, Thomas Christopher

مصطلحات موضوعية: Materials Science, electron microscopy, in situ microscopy, materials characterization, mechanical behavior of materials, metals, nanobeam electron diffraction

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/297770x9

المؤلفون: Radim Skoupy, Vladislav Krzyzanek, Ewa Pavlova, Miroslav Slouf

المصدر: Materials
Materials, Vol 14, Iss 7550, p 7550 (2021)
Materials; Volume 14; Issue 24; Pages: 7550

مصطلحات موضوعية: Technology, Microscopy, QC120-168.85, powder nanobeam electron diffraction, QH201-278.5, Engineering (General). Civil engineering (General), nanoparticle analysis, 4D-STEM, Article, TK1-9971, Descriptive and experimental mechanics, General Materials Science, Electrical engineering. Electronics. Nuclear engineering, TA1-2040

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::767a6825e52a35aa5494337f23fa5bd5
https://pubmed.ncbi.nlm.nih.gov/34947146

المؤلفون: Colin Ophus, Steven E. Zeltmann, Alexandra Bruefach, Alexander Rakowski, Benjamin H. Savitzky, Andrew M. Minor, Mary C. Scott

المصدر: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol 28, iss 2

مصطلحات موضوعية: Microscopy, Condensed Matter - Materials Science, four-dimensional scanning transmission electron microscopy, automated crystal orientation mapping, nanobeam electron diffraction, open-source software, scanning electron nanodiffraction, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, Biochemistry and Cell Biology, Materials Engineering, Condensed Matter Physics, Instrumentation

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f4ceb2afc5c4772ffb3f8a215fa7c317
http://arxiv.org/abs/2111.00171

المؤلفون: Colin Ophus, Gregory F. Meyers, Thomas C. Pekin, Steven J. Rozeveld, Frances I. Allen, Arun Persaud, Andrew M. Minor, Jim Ciston

المصدر: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol 27, iss 4

مصطلحات موضوعية: Diffraction, Materials science, FOS: Physical sciences, Bioengineering, Applied Physics (physics.app-ph), Non-negative matrix factorization, Matrix decomposition, NNMF, Scanning transmission electron microscopy, Instrumentation, Image resolution, Condensed Matter - Materials Science, PCA, Microscopy, grain orientation mapping, Resolution (electron density), Materials Science (cond-mat.mtrl-sci), Physics - Applied Physics, scanning nanobeam electron diffraction, Materials Engineering, Stem Cell Research, Condensed Matter Physics, cond-mat.mtrl-sci, Electron diffraction, Principal component analysis, Biochemistry and Cell Biology, Biological system, physics.app-ph, 4D-STEM

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ed9fb556a0b5084f015e5654cc2c2fe
https://escholarship.org/uc/item/78s2p398