المؤلفون: Daniel Gil-Tomas, Luis J. Saiz-Adalid, Joaquin Gracia-Moran, J. Carlos Baraza-Calvo, Pedro J. Gil-Vicente

المصدر: IEEE Access, Vol 12, Pp 70662-70675 (2024)

مصطلحات موضوعية: Error correcting codes, random multiple-bit upsets, radiation-hardened cells, soft errors, static RAM, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10534066/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/cd14b11c9f6444d29f32238e58df0e5d

المؤلفون: Zhang Xiaolin, Ding Lei, Gu Liming

المصدر: Dianzi Jishu Yingyong, Vol 44, Iss 4, Pp 61-64 (2018)

مصطلحات موضوعية: fault tolerance, multiple bit upsets(MBU), dynamic partial reconfiguration(DPR), temporal redundancy, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: http://www.chinaaet.com/article/3000080387; https://doaj.org/toc/0258-7998

URL الوصول: https://doaj.org/article/ce6d41502084480180d6124bee776a74

المؤلفون: Raffaele Giordano, Dario Barbieri, Sabrina Perrella, Roberto Catalano

المصدر: Instruments; Volume 3; Issue 4; Pages: 56

مصطلحات موضوعية: radiation effects, single event effects, single event upsets, multiple bit upsets, soft errors, FPGA, radiation testing, proton

وصف الملف: application/pdf

Relation: https://dx.doi.org/10.3390/instruments3040056

الاتاحة: https://doi.org/10.3390/instruments3040056

المؤلفون: Clemente Barreira, Juan Antonio, Rezaei, Mohammadreza, Franco Peláez, Francisco Javier

مصطلحات موضوعية: Single Event Effects, Multiple Bit Upsets, Error Correction Codes, SRAM, Electrónica (Física), Física nuclear, Hardware, Electrónica (Informática), 2207 Física Atómica y Nuclear, 2203 Electrónica

وصف الملف: application/pdf

Relation: PID2020-112916GB-I00; https://hdl.handle.net/20.500.14352/65264

الاتاحة: https://hdl.handle.net/20.500.14352/65264

المؤلفون: Roberto Catalano, G. Milluzzo, Sabrina Perrella, Dario Barbieri, Raffaele Giordano

المساهمون: Giordano, Raffaele, Barbieri, Dario, Perrella, Sabrina, Catalano, Roberto, Milluzzo, Giuliana

المصدر: IEEE Transactions on Nuclear Science. 65:2691-2698

مصطلحات موضوعية: Triple modular redundancy, Nuclear and High Energy Physics, Scrubber, soft error, 01 natural sciences, 03 medical and health sciences, 0302 clinical medicine, single event upset, 0103 physical sciences, Redundancy (engineering), Static random-access memory, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electrical and Electronic Engineering, radiation testing, Field-programmable gate array, Field-programmable gate array (FPGA), Nuclear and High Energy Physic, radiation effect, 010308 nuclear & particles physics, business.industry, Detector, Self repair, single event effect, multiple-bit upsets (MBUs), Nuclear Energy and Engineering, 030220 oncology & carcinogenesis, Benchmark (computing), business, Computer hardware, proton

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::52a268315cdb465649e3ff32ac73657c
https://doi.org/10.1109/tns.2018.2868992

المؤلفون: Giordano, Raffaele, Barbieri, Dario, Perrella, Sabrina, Catalano, Roberto, Milluzzo, Giuliana

المساهمون: Giordano, Raffaele, Barbieri, Dario, Perrella, Sabrina, Catalano, Roberto, Milluzzo, Giuliana

مصطلحات موضوعية: Field-programmable gate array (FPGA), multiple-bit upsets (MBUs), proton, radiation effect, radiation testing, single event effect, single event upset, soft error, Nuclear and High Energy Physic, Nuclear Energy and Engineering, Electrical and Electronic Engineering

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000447830800003; volume:65; issue:10; firstpage:2691; lastpage:2698; numberofpages:8; journal:IEEE TRANSACTIONS ON NUCLEAR SCIENCE; http://hdl.handle.net/11588/747989; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85052901462; http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23

الاتاحة: http://hdl.handle.net/11588/747989
https://doi.org/10.1109/TNS.2018.2868992
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23

المؤلفون: Giordano, Raffaele, Perrella, Sabrina, Izzo, Vincenzo, Milluzzo, Giuliana, Aloisio, Alberto

المساهمون: Giordano, Raffaele, Perrella, Sabrina, Izzo, Vincenzo, Milluzzo, Giuliana, Aloisio, Alberto

مصطلحات موضوعية: Field programmable gate array (FPGA), multiple bit upsets (MBUs), proton, radiation effect, radiation testing, single event effect, single event upset, soft error, Nuclear and High Energy Physic, Nuclear Energy and Engineering, Electrical and Electronic Engineering

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000411029500005; volume:64; issue:9; firstpage:2497; lastpage:2504; numberofpages:8; journal:IEEE TRANSACTIONS ON NUCLEAR SCIENCE; http://hdl.handle.net/11588/706998; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85028926707; http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23

الاتاحة: http://hdl.handle.net/11588/706998
https://doi.org/10.1109/TNS.2017.2730960
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23

المؤلفون: Frenkel, Charlotte, Legat, Jean-Didier, Bol, David, 10th International Symposium on Reconfigurable Communication-centric Systems-on-Chip ( ReCoSoC 2015)

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

مصطلحات موضوعية: Fault tolerance, Multiple-Bit Upsets (MBU), Dynamic Partial Reconfiguration (DPR), Space applications, Lowpower, Temporal redundancy, System-on-Chip FPGA

Relation: boreal:163825; http://hdl.handle.net/2078.1/163825

الاتاحة: http://hdl.handle.net/2078.1/163825
https://doi.org/10.1109/ReCoSoC.2015.7238095

المؤلفون: Vincenzo Izzo, Raffaele Giordano, G. Milluzzo, Alberto Aloisio, Sabrina Perrella

المساهمون: Giordano, Raffaele, Perrella, Sabrina, Izzo, Vincenzo, Milluzzo, Giuliana, Aloisio, Alberto

مصطلحات موضوعية: Nuclear and High Energy Physics, Engineering, multiple bit upsets (MBUs), soft error, 01 natural sciences, Data acquisition, 0103 physical sciences, single event upset, Electronic engineering, Redundancy (engineering), Static random-access memory, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electrical and Electronic Engineering, Field-programmable gate array, radiation testing, Nuclear and High Energy Physic, 010302 applied physics, radiation effect, 010308 nuclear & particles physics, business.industry, Detector, Reconfigurability, Reconfigurable computing, single event effect, Nuclear Energy and Engineering, Embedded system, Field programmable gate array (FPGA), business, Data scrubbing, proton

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a890f66a3d4524adf61464c50deb196d
http://hdl.handle.net/11588/706998

المؤلفون: Gill, B., Nicolaidis, M., Papachristou, C.

المساهمون: Dept. of EECS, Case Western Reserve Univ. (DEPT. OF EECS, CASE WESTERN RESERVE UNIV.), Case Western Reserve University Cleveland, iROc Technologies (IROC TECHNOLOGIES), Cadence Connection-EDA Consortium-FSA-Cubic Micro, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)

المصدر: 11th-IEEE-International-On-Line-Testing-Symposium.
https://hal.science/hal-00013715
11th-IEEE-International-On-Line-Testing-Symposium., 2005, French-Riviera, France. pp.266-71, ⟨10.1109/IOLTS.2005.59⟩

مصطلحات موضوعية: radiation-induced-single-word-multiple-bit-upsets-correction, SRAM-, built-in-current-sensor, Hamming-codes, PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: French-Riviera, France

الاتاحة: https://hal.science/hal-00013715
https://doi.org/10.1109/IOLTS.2005.59

المؤلفون: Michael Nicolaidis, B.S. Gill, Christos A. Papachristou

المساهمون: Dept. of EECS, Case Western Reserve Univ. (DEPT. OF EECS, CASE WESTERN RESERVE UNIV.), Case Western Reserve University [Cleveland], iROc Technologies (IROC TECHNOLOGIES), Cadence Connection-EDA Consortium-FSA-Cubic Micro, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)

المصدر: 11th-IEEE-International-On-Line-Testing-Symposium.
11th-IEEE-International-On-Line-Testing-Symposium., 2005, French-Riviera, France. pp.266-71, ⟨10.1109/IOLTS.2005.59⟩
IOLTS

مصطلحات موضوعية: Computer science, 02 engineering and technology, Hamming-codes, 01 natural sciences, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, System on a chip, radiation-induced-single-word-multiple-bit-upsets-correction, Static random-access memory, Hardware_ARITHMETICANDLOGICSTRUCTURES, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Very-large-scale integration, Hardware_MEMORYSTRUCTURES, 010308 nuclear & particles physics, business.industry, 020202 computer hardware & architecture, Built-in self-test, Single event upset, PACS 85.42, built-in-current-sensor, Error detection and correction, business, Hamming code, Word (computer architecture), Computer hardware, SRAM

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fbe39284ac6ed2303180689e22561383
https://hal.archives-ouvertes.fr/hal-00013715

المؤلفون: Koga, R., Pinkerton, S. D., Lie, T. J., Crawford, K. B.

المساهمون: AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS

المصدر: DTIC AND NTIS

مصطلحات موضوعية: Electrical and Electronic Equipment, Computer Hardware, RANDOM ACCESS COMPUTER STORAGE, MICROELECTRONICS, RADIATION EFFECTS, VULNERABILITY, HEAVY IONS, SPACEBORNE, SINGLE EVENT UPSET, SRAM(STATIC RANDOM ACCESS MEMORIES), SMUS(SINGLE WORD MULTIPLE BIT UPSETS)

وصف الملف: text/html

Relation: http://www.dtic.mil/docs/citations/ADA345734

الاتاحة: http://www.dtic.mil/docs/citations/ADA345734
http://oai.dtic.mil/oai/oai?&verb=getRecord&metadataPrefix=html&identifier=ADA345734

المؤلفون: AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS, Koga, R., Pinkerton, S. D., Lie, T. J., Crawford, K. B.

المصدر: DTIC AND NTIS

مصطلحات الفهرس: Electrical and Electronic Equipment, Computer Hardware, RANDOM ACCESS COMPUTER STORAGE, MICROELECTRONICS, RADIATION EFFECTS, VULNERABILITY, HEAVY IONS, SPACEBORNE., SINGLE EVENT UPSET, SRAM(STATIC RANDOM ACCESS MEMORIES), SMUS(SINGLE WORD MULTIPLE BIT UPSETS), Text

URL: https://apps.dtic.mil/docs/citations/ADA345734

المؤلفون: Clemente Barreira, Juan Antonio, Rezaei, Mohammadreza, Franco Peláez, Francisco Javier

مصطلحات الفهرس: Single Event Effects, Multiple Bit Upsets, Error Correction Codes, SRAM, Electrónica (Física), Física nuclear, Hardware, Electrónica (Informática), 2207 Física Atómica y Nuclear, 2203 Electrónica, journal article

URL: https://hdl.handle.net/20.500.14352/65264
PID2020-112916GB-I00

المؤلفون: Dept. of EECS, Case Western Reserve Univ. (DEPT. OF EECS, CASE WESTERN RESERVE UNIV.) ; Case Western Reserve University, iROc Technologies (IROC TECHNOLOGIES) ; Cadence Connection - EDA Consortium - FSA - Cubic Micro, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA) ; CNRS - Université Joseph Fourier - Grenoble I - Institut National Polytechnique de Grenoble (INPG), Gill, B., Nicolaidis, M., Papachristou, C.

المصدر: 11th-IEEE-International-On-Line-Testing-Symposium.; 11th-IEEE-International-On-Line-Testing-Symposium., Dec 2004, French-Riviera, France. IEEE Computer Society, Los Alamitos, CA, USA, pp.266-71, <10.1109/IOLTS.2005.59>

مصطلحات الفهرس: Hamming-codes, built-in-current-sensor, SRAM, radiation-induced-single-word-multiple-bit-upsets-correction, PACS 85.42, [SPI.NANO] Engineering Sciences/Micro and nanotechnologies/Microelectronics, Conference papers