المؤلفون: Bo Wan, Ye Wang, Yutai Su, Guicui Fu

المصدر: IEEE Access, Vol 8, Pp 188154-188170 (2020)

مصطلحات موضوعية: Maximum entropy principle, multi-mechanism failure, physics-of-failure, semiconductor device reliability, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9223700/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/a4991bd1e26046d08274e10850d789a8

المؤلفون: Guicui Fu, Bo Wan, Ye Wang, Yutai Su

المصدر: IEEE Access, Vol 8, Pp 188154-188170 (2020)

مصطلحات موضوعية: 010302 applied physics, physics-of-failure, 021103 operations research, multi-mechanism failure, General Computer Science, Computer science, Principle of maximum entropy, Monte Carlo method, 0211 other engineering and technologies, General Engineering, Process (computing), Sampling (statistics), 02 engineering and technology, Maximum entropy principle, 01 natural sciences, Reliability engineering, 0103 physical sciences, Log-normal distribution, semiconductor device reliability, Physics of failure, General Materials Science, lcsh:Electrical engineering. Electronics. Nuclear engineering, lcsh:TK1-9971, Reliability (statistics), Weibull distribution

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64da0f41af552433c3a350006964aec9
https://ieeexplore.ieee.org/document/9223700/