يعرض 1 - 13 نتائج من 13 نتيجة بحث عن '"multi-die"', وقت الاستعلام: 0.38s تنقيح النتائج
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    Conference

    المساهمون: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Temasek Laboratories

    وصف الملف: application/pdf

    Relation: Kor, K. H. B., Liu, Q., & Gan, C. L. (2020). Sample preparation for deprocessing of 3D multi-die stacked package. Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 1-6. doi:10.1109/IPFA49335.2020.9260707; https://hdl.handle.net/10356/144906

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    Conference

    المصدر: The 27th IEEE International Symposium On Field-Programmable Custom Computing Machines ; 86 ; 78

    جغرافية الموضوع: San Diego

    Relation: 2019 IEEE 27th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM); http://hdl.handle.net/10044/1/69950

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