المؤلفون: Guo, H. (Haipeng), Montes Garcia, V. (Verónica), Peng, H. (Haijun), Samorì, P. (Paolo), Ciesielski, A. (Artur)

مصطلحات موضوعية: Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

الاتاحة: https://onlinelibrary.wiley.com/doi/10.1002/smll.202310338

المؤلفون: Valentini, C. (Cataldo), Montes Garcia, V. (Verónica), Cusin, L. (Luca), Pakulski, D. (Dawid), Wlazło, M. (Mateusz), Samorì, P. (Paolo), Ciesielski, A. (Artur)

مصطلحات موضوعية: Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

الاتاحة: https://onlinelibrary.wiley.com/doi/10.1002/smsc.202400031

المؤلفون: Banhart, F. (Florian)

مصطلحات موضوعية: Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

الاتاحة: https://onlinelibrary.wiley.com/doi/10.1002/smll.202310462

المؤلفون: BANTIGNIES, Claire, ROUFFAUD, R., BUSE, Gabriel, VEBER, P., CABANE, Hugues, BORTA-BOYON, Ana, PHAM THI, Mai, MAUCHAMP, Pascal, LEJEUNE, A., MAGLIONE, Mario, COLIN, Laurent, BALÉ, Antoine, FLESCH, Martin, LEVASSORT, F.

مصطلحات موضوعية: Chimie/Matériaux, Sciences de l'ingénieur [physics]/Acoustique [physics.class-ph], Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

الاتاحة: https://doi.org/10.1109/TUFFC.2023.3278034

المؤلفون: DUFOUR, Isabelle, IGLESIAS HERNANDEZ, Luis, SHANMUGAM, Priyadarshini, MICHAUD, Jean-François, COLIN, Laurent, ALQUIER, Daniel, CERTON, Dominique, MANRIQUE-JUAREZ, Maria-Dolores, LEICHLE, Thierry, MATHIEU, Fabrice, MAZENQ, Laurent, NICU, Liviu, NGUYEN, Luan, CHENOT, Sébastien, PORTAIL, Marc, BERTRAND, Johan

مصطلحات موضوعية: Resonant MEMS, CMUT, Microcantilever, Gas detection, Resonant frequency, Quality factor, Time of flight, Viscosity, Mass density, Sound attenuation, Hydrogen detection, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/173227

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/173227
https://hdl.handle.net/20.500.12278/173227
https://doi.org/10.1109/EFTF/IFCS54560.2022.9850611

المؤلفون: POITTEVIN, Arnaud, O'CONNOR, Ian, MARCHAND, Cedric, BOSIO, Alberto, MANEUX, Cristell, MUKHERJEE, Chhandak, LARRIEU, Guilhem, KUMAR, Abhishek

مصطلحات موضوعية: VNWFET, junction-less, logic cell, routing, predictive, simulation, technology, TCAD, Manhattan, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique, Informatique [cs]/Technologies Émergeantes [cs.ET], Informatique [cs]/Modélisation et simulation

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/172116

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/172116
https://hdl.handle.net/20.500.12278/172116
https://doi.org/10.1109/NEWCAS52662.2022.9842100

المؤلفون: DUMONT, Romane, DE MATOS, Magali, CATHELIN, Andreia, DEVAL, Yann

مصطلحات موضوعية: Quadrature, ILO, Millimeter-wave (mm-W), Low-phase-noise, Differential injection, Fifth-generation (5G), Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: 2375-0995, 1529-2517; https://oskar-bordeaux.fr/handle/20.500.12278/172115

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/172115
https://hdl.handle.net/20.500.12278/172115
https://doi.org/10.1109/RFIC54546.2022.9863081

المؤلفون: HOSSAIN, Md Sazzad, MOREIRA, Mateus Bernardino, SANDREZ, Francois, RIVET, Francois, LAPUYADE, Herve, DEVAL, Yann

مصطلحات موضوعية: Phase noise, Frequency locked loops, Power demand, Circuits and systems, Silicon-on-insulator, Frequency conversion, Energy efficiency, Clocks, Flip-flops, Frequency dividers, Low-power electronics, Phase locked loops, TSPC, FDSOI, Drequency dividers, De-counter, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/173667

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/173667
https://hdl.handle.net/20.500.12278/173667
https://doi.org/10.1109/LASCAS53948.2022.9789073

المؤلفون: AYOUB, Bassel, MOREAU, S., LHOSTIS, S., LAMONTAGNE, P., COMBEAU, H., MATTEI, J. G., FREMONT, Helene

المصدر: crossref

مصطلحات موضوعية: Cu/SiO2 Hybrid Bonding, Failure analysis, TDDB, 1/E model, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: oai:crossref.org:10.1109/irps48227.2022.9764446; https://oskar-bordeaux.fr/handle/20.500.12278/140402

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140402
https://hdl.handle.net/20.500.12278/140402
https://doi.org/10.1109/irps48227.2022.9764446

المؤلفون: VOISIN, Steeven, KNOPIK, Vincent, KERHERVE, Eric

المصدر: crossref

مصطلحات موضوعية: RTPS, millimeter wave integrated circuits, phase shifter, Beamforming, 5G, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: oai:crossref.org:10.23919/eumic50153.2022.9783836; https://oskar-bordeaux.fr/handle/20.500.12278/140586

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140586
https://hdl.handle.net/20.500.12278/140586
https://doi.org/10.23919/eumic50153.2022.9783836

المؤلفون: DUBOIS, Stanislas, LELONG, Bruno, HODE, Jean-Michel, FERRE, Guillaume, DALLET, Dominique

المصدر: crossref

مصطلحات موضوعية: Power Amplifier, Characterization, Modeling, Test-bench, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: oai:crossref.org:10.1109/i2mtc48687.2022.9806582; https://oskar-bordeaux.fr/handle/20.500.12278/140582

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140582
https://hdl.handle.net/20.500.12278/140582
https://doi.org/10.1109/i2mtc48687.2022.9806582

المؤلفون: CABBIA, Marco, FREGONESE, Sebastien, YADAV, Chandan, ZIMMER, Thomas

المصدر: crossref

مصطلحات موضوعية: S-paramater measurement, Semiconductor Devices, HBT, Sub-THz frequency, THz frequency, on-wafer TRL calibration, calibration kit structures design, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: oai:crossref.org:10.1109/gsmm53818.2022.9792326; https://oskar-bordeaux.fr/handle/20.500.12278/140613

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140613
https://hdl.handle.net/20.500.12278/140613
https://doi.org/10.1109/gsmm53818.2022.9792326

المؤلفون: SHANMUGAM, Priyadarshini, IGLESIAS, Luis, PORTAIL, Marc, DUFOUR, Isabelle, CERTON, Dominique, ALQUIER, Daniel, MICHAUD, Jean François

مصطلحات موضوعية: Silicon carbide, 3C-SiC microcantilevers, physical gas detector, hydrogen sensor, MEMS, electromagnetic actuation and inductive detection, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/140610

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140610
https://hdl.handle.net/20.500.12278/140610
https://doi.org/10.4028/p-m048qs

المؤلفون: ROMDHANE, E. Ben, ROUMANILLE, P., GUEDON-GRACIA, A., PIN, S., NGUYEN, P., FREMONT, H.

مصطلحات موضوعية: Geometry, Thermomechanical processes, Failure analysis, Tin, Lead, Fatigue, Finite element analysis, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/140398

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140398
https://hdl.handle.net/20.500.12278/140398
https://doi.org/10.1109/EuroSimE54907.2022.9758868

المؤلفون: MISCHLER, Leo, CARTAILLER, Vivien, DUCHAMP, Genevieve, FREMONT, Helene, IMBERT, Gregory, MOULARD, J., KERMARREC, Olivier

مصطلحات موضوعية: Micromechanical devices, Moisture, Capacitance, Numerical simulation, Numerical models, Dielectrics, Microelectronics, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/140420

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140420
https://hdl.handle.net/20.500.12278/140420
https://doi.org/10.1109/EuroSimE54907.2022.9758882

المؤلفون: TOMAS, Ariane, LAMBERT, Benoit, FREMONT, Helene, MALBERT, Nathalie, LABAT, Nathalie

مصطلحات موضوعية: Silicon compounds, Micromechanical devices, Bending, Predictive models, Packaging, Electromagnetic compatibility, Finite element analysis, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/140392

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140392
https://hdl.handle.net/20.500.12278/140392
https://doi.org/10.1109/EuroSimE54907.2022.9758842

المؤلفون: AKODA, K., GUEDON-GRACIA, A., LEBRAUD, E., DELETAGE, J.-Y., PLANO, B., FREMONT, H.

مصطلحات موضوعية: Corrosion, Salt spray test, Solder ball, Sn-Ag-Cu alloy, Dynamics, Simulation, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/140391

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140391
https://hdl.handle.net/20.500.12278/140391
https://doi.org/10.1109/EuroSimE54907.2022.9758896

المؤلفون: TABLATI, A., ALAYLI, N., ARABI, F., EL BOUBAKARI, K., YOUSSEF, T., THEOLIER, L., WOIRGARD, E.

مصطلحات موضوعية: Thermomechanical processes, Multichip modules, Numerical simulation, Etching, Robustness, Numerical models, Copper, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

Relation: https://oskar-bordeaux.fr/handle/20.500.12278/140399

الاتاحة: https://oskar-bordeaux.fr/handle/20.500.12278/140399
https://hdl.handle.net/20.500.12278/140399
https://doi.org/10.1109/EuroSimE54907.2022.9758892

المؤلفون: Zhang, K., Hanf, M. (Marie-Christine), Sciacca, D., Bernard, R., Borensztein, Y., Resta, A., Garreau, Y., Vlad, A., Coati, A., Lefebvre, I., Derivaz, M. (Mickael), Pirri, C. (Carmelo), Sonnet, P. (Philippe), Stephan, R. (Regis), Prévot, G.

مصطلحات موضوعية: Physique [physics]/Matière Condensée [cond-mat], Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

الاتاحة: https://link.aps.org/doi/10.1103/PhysRevB.106.045412

المؤلفون: Mhanna, R. (Rana), Durand, N. (Nicolas), Savel, P. (Paul), Akdas-Kiliç, H. (Huriye), Abdallah, S. (Stephania), Versace, D. (Davy-Louis), Soppera, O. (Olivier), Fillaut, J. (Jean-Luc), Sojic, N. (Neso), Malval, J. (Jean-Pierre)

مصطلحات موضوعية: Chimie/Chimie de coordination, Chimie/Polymères, Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique

الاتاحة: http://xlink.rsc.org/?DOI=D2CC04159F