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1Report
المؤلفون: Wang, Liancheng, Guo, Enqing, Liu, Zhiqiang, Yi, Xiaoyan, Wang, Guohong, Wang, L.(wanglc@semi.ac.cn)
مصطلحات موضوعية: Gallium Nitride, Leakage Currents, Light Emission, Light Emitting Diodes, Metallizing, Polarization, Testing, Water Analysis, 半导体材料, electromagnetic wave polarisation, examinations, water--analysis, optical emission, leds (light emitting diodes), led, organic light emitting diodes, oled, polymer led, superluminescent diodes, led (diodes), light-emitting diodes, leds, organic led, light emitting diode, metalization, metalizing, metallization, metallizing (for plating), metallisation (sous-couche pour revetement), metallisieren
Relation: Journal of Semiconductors; Wang, Liancheng; Guo, Enqing; Liu, Zhiqiang; Yi, Xiaoyan; Wang, Guohong. Electrical characteristics of a vertical light emitting diode with N-type contacts on a selectively wet-etching roughened surface, Journal of Semiconductors,2011,32(2):24009; http://ir.semi.ac.cn/handle/172111/23150
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2Academic Journal
المؤلفون: Sun LJ, Ling X, Li XD, Li, XD (reprint author), Tsinghua Univ, CNMM, AML, Dept Engn Mech, Beijing 100084, Peoples R China
مصطلحات موضوعية: Cu Interconnects, Damage, Electromigration, Metallization, Frequency, Mechanism, Failure, Lines, Films, Instruments & Instrumentation, Physics, Applied, 二类/Q2, electrodiffusion, metallizing, lithography, electron beam, fracture, failures, photography--films, finite volume method, 损伤, electrotransport, elektrotransport, transport electrique, metalization, metalizing, metallizing (for plating), metallisation (sous-couche pour revetement), metallisieren
Relation: Review of Scientific Instruments; Sun LJ,Ling X,Li XD. Alternating-current induced thermal fatigue of gold interconnects with nanometer-scale thickness and width[J]. Review of Scientific Instruments,2011,82(10):103903.; http://dspace.imech.ac.cn/handle/311007/44903; http://dx.doi.org/10.1063/1.3650459