المؤلفون: Belmonte, Attilio, Kim, W, Chan, B. T, Heylen, N, Fantini, Andrea, Houssa, Michel, Jurczak, M, Goux, L

مصطلحات موضوعية: Conductive-bridging, CBRAM, ECM, low-power memory, memory disturb, high performance memory

Relation: 2013 5TH IEEE INTERNATIONAL MEMORY WORKSHOP (IMW) pages:26-29; 5th IEEE International Memory Workshop (IMW) location:Monterey: CA date:MAY 26-29, 2013; https://lirias.kuleuven.be/handle/123456789/430368

الاتاحة: https://lirias.kuleuven.be/handle/123456789/430368

المؤلفون: Belmonte, Attilio, Celano, Umberto, Redolfi, Augusto, Fantini, Andrea, Muller, Robert, Vandervorst, Wilfried, Houssa, Michel, Jurczak, Malgorzata, Goux, Ludovic

مصطلحات موضوعية: Charge-transfer reaction, conductive-atomic-force microscopy (C-AFM), conductive-bridging, conductive-bridging random access memory (CBRAM), constant voltage stress (CVS), ECM, memory disturb, quantum point contact (QPC), read endurance, voltage-time dilemma

Relation: IEEE Transactions on Electron Devices vol:62 issue:6 pages:2007-2013; https://lirias.kuleuven.be/handle/123456789/518843; https://lirias.kuleuven.be/bitstream/123456789/518843/3//Belmonte-TED-2015.pdf

الاتاحة: https://lirias.kuleuven.be/handle/123456789/518843
https://lirias.kuleuven.be/bitstream/123456789/518843/3//Belmonte-TED-2015.pdf