المؤلفون: Wikner, Evelina, 1987

المصدر: Ageing mechanisms & how to prolong battery life in vehicle and energy storage applications’ Åldringsmekanismer och hur man förlänger livet på batterier i fordon och stationära applikationer.

مصطلحات موضوعية: Battery lifetime tests, Physics-based modelling, Plug-in Hybrid Electric Vehicle (PHEV), Empiric model, Calendar ageing

وصف الملف: electronic

URL الوصول: https://research.chalmers.se/publication/512004
https://research.chalmers.se/publication/512004/file/512004_Fulltext.pdf

المؤلفون: Spöri, Camillo Wolfgang, Kwan, Jason Tai Hong, Bonakdarpour, Arman, Wilkinson, David P., Strasser, Peter

مصطلحات موضوعية: 540 Chemie und zugeordnete Wissenschaften, accelerated lifetime tests, iridium, membranes, oxygen evolution reaction, water splitting

وصف الملف: application/pdf

Relation: https://depositonce.tu-berlin.de/handle/11303/9676; http://dx.doi.org/10.14279/depositonce-8719

الاتاحة: https://depositonce.tu-berlin.de/handle/11303/9676
https://doi.org/10.14279/depositonce-8719

المؤلفون: Skima, Haithem, Medjaher, Kamal, Varnier, Christophe, Zerhouni, Noureddine

المساهمون: Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) (FEMTO-ST), Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Centre National de la Recherche Scientifique (CNRS)-Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté COMUE (UBFC)-Université Bourgogne Franche-Comté COMUE (UBFC), Laboratoire Génie de Production (LGP), Ecole Nationale d'Ingénieurs de Tarbes (ENIT), Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Université de Toulouse (UT)

المصدر: Proceedings of CoDIT 2017, 4th InternationaConference on Control, Decision and Information Technologies ; CoDIT 2017, 4th InternationaConference on Control, Decision and Information Technologies ; https://hal.science/hal-01977347 ; CoDIT 2017, 4th InternationaConference on Control, Decision and Information Technologies, Apr 2017, Barcelona, Spain. pp.0

مصطلحات موضوعية: Prognostics and health management, Micro-Electro-Mechanical systems, Accelerated lifetime tests, Data acquisition, Fault detection, [INFO.INFO-MO]Computer Science [cs]/Modeling and Simulation

جغرافية الموضوع: Spain

Time: Barcelona, Spain

Relation: hal-01977347; https://hal.science/hal-01977347; https://hal.science/hal-01977347/document; https://hal.science/hal-01977347/file/Skima_18696.pdf; OATAO: 18696

الاتاحة: https://hal.science/hal-01977347
https://hal.science/hal-01977347/document
https://hal.science/hal-01977347/file/Skima_18696.pdf

المؤلفون: Wikner, Evelina, 1987

المصدر: Åldringsmekanismer och hur man förlänger livet på batterier i fordon och stationära applikationer Ageing mechanisms & how to prolong battery life in vehicle and energy storage applications’.

مصطلحات موضوعية: Physics-based modeling, Electric Vehicle (EV), Battery lifetime tests, Hybrid Electric Vehicle (HEV), Plug-in Hybrid Electric Vehicle (PHEV), Calendar aging

وصف الملف: electronic

URL الوصول: https://research.chalmers.se/publication/249356
http://publications.lib.chalmers.se/records/fulltext/249356/249356.pdf

المؤلفون: Gafurov, Eldar, Smirnov, Evgenii

مصطلحات موضوعية: accelerated lifetime tests, reliability, матрицы лазерных диодов, надежность, ускоренные ресурсные тесты, Arrhenius model, QCW laser diode arrays, модель Аррениуса

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::01778a781eacf8a9cf119f12bbbfd6b2

المؤلفون: Schletz, Andreas

مصطلحات موضوعية: power module, characterizing tests, environmental tests, lifetime tests, power cycle

Time: 670, 620, 530

وصف الملف: application/pdf

Relation: Tutorial "Wide-Bandgap User Training" 2021; https://publica.fraunhofer.de/handle/publica/411243

الاتاحة: https://publica.fraunhofer.de/handle/publica/411243
https://doi.org/10.24406/publica-fhg-411243

المؤلفون: Schletz, Andreas

مصطلحات موضوعية: power module, characterizing tests, environmental tests, lifetime tests, power cycle

Time: 670, 620, 530

وصف الملف: application/pdf

Relation: Tutorial "Wide-Bandgap User Training" 2020; https://publica.fraunhofer.de/handle/publica/409022

الاتاحة: https://publica.fraunhofer.de/handle/publica/409022
https://doi.org/10.24406/publica-fhg-409022

المؤلفون: Ben Dhia, Sonia, Boyer, Alexandre, Li, Binhong, Ndoye Cisse, Amadou

المساهمون: Équipe Intégration de Systèmes de Gestion de l'Énergie (LAAS-ISGE), Laboratoire d'analyse et d'architecture des systèmes (LAAS), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT), Laboratoire Toulousain de Technologie et d'Ingénierie des Systèmes (LATTIS), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-IUT Toulouse 2 Blagnac, Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université de Toulouse (UT)-Université Toulouse - Jean Jaurès (UT2J)

المصدر: ISSN: 0013-5194.

مصطلحات موضوعية: Integrated circuits, Electromagnetic Compatibility, Aging, Accelerated lifetime tests, [SPI.TRON]Engineering Sciences [physics]/Electronics

Relation: hal-00669745; https://hal.science/hal-00669745; https://hal.science/hal-00669745/document; https://hal.science/hal-00669745/file/BenDhia_2010_-_Charac_of_EMC_drifts_of_nanoscale_IC_after_accelerated_life_tests.pdf

الاتاحة: https://hal.science/hal-00669745
https://hal.science/hal-00669745/document
https://hal.science/hal-00669745/file/BenDhia_2010_-_Charac_of_EMC_drifts_of_nanoscale_IC_after_accelerated_life_tests.pdf
https://doi.org/10.1049/el.2010.2885

المؤلفون: Noureddine Zerhouni, Kamal Medjaher, Haithem Skima, Christophe Varnier

المساهمون: Centre National de la Recherche Scientifique - CNRS (FRANCE), Ecole Nationale Supérieure de Mécanique et des Microtechniques - ENSMM (FRANCE), Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE), Université de Franche-Comté (FRANCE), Université de Technologie de Belfort-Montbéliard - UTBM (FRANCE), Institut National Polytechnique de Toulouse - INPT (FRANCE), Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) (FEMTO-ST), Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Génie de Production (LGP), Ecole Nationale d'Ingénieurs de Tarbes

المصدر: CoDIT
Proceedings of CoDIT 2017, 4th InternationaConference on Control, Decision and Information Technologies
CoDIT 2017, 4th InternationaConference on Control, Decision and Information Technologies
CoDIT 2017, 4th InternationaConference on Control, Decision and Information Technologies, Apr 2017, Barcelona, Spain. pp.0

مصطلحات موضوعية: 010302 applied physics, Microelectromechanical systems, Engineering, business.industry, 020208 electrical & electronic engineering, Data acquisition, 02 engineering and technology, Modélisation et simulation, [INFO.INFO-MO]Computer Science [cs]/Modeling and Simulation, 01 natural sciences, Accelerated lifetime tests, Fault detection and isolation, Micro-Electro-Mechanical systems, Reliability engineering, Prognostics and health management, Monitoring data, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Prognostics, business, Fault detection, Reliability (statistics)

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::075d7e0e0785d70f3716b32cccc3ac4e
https://doi.org/10.1109/codit.2017.8102566

المؤلفون: Pustějovský, Zdeněk

المساهمون: Blata, Jan, Jakubec, Josef

مصطلحات موضوعية: Online systém, Vibrodiagnostika, Životnostní zkoušky, online system, vibrodiagnostics, Lifetime tests

وصف الملف: 3951814 bytes; application/pdf

Relation: OSD002; http://hdl.handle.net/10084/114872; S2723; PUS0042_FS_B2341_2301R023_2016

الاتاحة: http://hdl.handle.net/10084/114872

المؤلفون: Romer, Achim

المساهمون: Bertsche, Bernd (Univ.-Prof. Dr.-Ing.)

مصطلحات موضوعية: Zuverlässigkeit , Vorwissen , Betriebsfest , Lastkollektiv , Konfidenzintervall , Hardware-in-the-loop, Weibayes , beschleunigte Lebensdauerprüfung , Lebensdauermodell , Fehlermechanismus, accelerated lifetime tests , failure mechanisms

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0ffc6248cd3435b3394e481fd7ddc80e
http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-93148

المؤلفون: Karter, Stanley, Ivanov, Tony

المساهمون: ARMY RESEARCH LAB ADELPHI MD SENSORS AND ELECTRON DEVICES DIRECTORATE

المصدر: DTIC

مصطلحات موضوعية: Electrical and Electronic Equipment, MICROELECTROMECHANICAL SYSTEMS, ELECTRONIC SWITCHES, FIELD PROGRAMMABLE GATE ARRAYS, LIFE TESTS, RELIABILITY, RADIOFREQUENCY, LIFETIME TESTS, RF-MEMS, info

Relation: http://www.dtic.mil/docs/citations/ADA538269

الاتاحة: http://www.dtic.mil/docs/citations/ADA538269

المؤلفون: Romer, Achim

المساهمون: Bertsche, Bernd (Univ.-Prof. Dr.-Ing.)

مصطلحات موضوعية: Zuverlässigkeit, Vorwissen, Betriebsfest, Lastkollektiv, Konfidenzintervall, Hardware-in-the-loop, Weibayes, beschleunigte Lebensdauerprüfung, Lebensdauermodell, Fehlermechanismus, accelerated lifetime tests, failure mechanisms

Time: 620

Relation: Berichte aus dem Institut für Maschinenelemente;154; 409602426; http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-93148; http://elib.uni-stuttgart.de/handle/11682/4595; http://dx.doi.org/10.18419/opus-4578

الاتاحة: https://doi.org/10.18419/opus-4578
http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-93148
http://elib.uni-stuttgart.de/handle/11682/4595

المؤلفون: S. Ben Dhia, A. Cisse Ndoye, B. Li, Alexandre Boyer

المساهمون: Équipe Intégration de Systèmes de Gestion de l'Énergie (LAAS-ISGE), Laboratoire d'analyse et d'architecture des systèmes (LAAS), Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées, Laboratoire Toulousain de Technologie et d'Ingénierie des Systèmes (LATTIS), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-IUT Toulouse 2 Blagnac, Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse - Jean Jaurès (UT2J), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-IUT Toulouse 2 Blagnac, Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université de Toulouse (UT)-Université Toulouse - Jean Jaurès (UT2J)

المصدر: Electronics Letters
Electronics Letters, IET, 2010, 46 (4), p. 278-280. ⟨10.1049/el.2010.2885⟩
Electronics Letters, 2010, 46 (4), p. 278-280. ⟨10.1049/el.2010.2885⟩

مصطلحات موضوعية: Engineering, Aging, Integrated circuits, 02 engineering and technology, Integrated circuit, Electromagnetic emission, 01 natural sciences, Accelerated lifetime tests, law.invention, Reliability (semiconductor), law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Electrical and Electronic Engineering, 010302 applied physics, business.industry, 020208 electrical & electronic engineering, Electromagnetic compatibility, Durability, Accelerated aging, [SPI.TRON]Engineering Sciences [physics]/Electronics, CMOS, Radio frequency, Electromagnetic Compatibility, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b0936d15c2def83c8e0340bac3a2a3cc
https://hal.archives-ouvertes.fr/hal-00669745

المؤلفون: Ende, D.A. van den, Bos, B., Groen, W.A., Dortmans, L.M.J.G.

المساهمون: TNO Industrie en Techniek

المصدر: Journal of Electroceramics, 1-3, 22, 163-170

مصطلحات موضوعية: Failure analysis, Mechanical stress, Electric properties, PZT, Piezoelectric materials, Humidity effects, Piezoelectricity, Adhesive interlayers, Material properties, Lifetime tests, Numerical simulations, Piezoelectric actuators, Microstructure, Piezoelectric transducers, Actuator designs, Stress development, Computer simulation, Piezoceramic, Quality assurance, Semiconducting lead compounds, Actuator performance, Multilayers, Piezo-ceramic actuators, Multilayer actuators, Electrical properties, Safety factor, Electronics, Piezoelectric properties, Actuators

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::45c2fb161fd42f789b304fce95250bf8
http://resolver.tudelft.nl/uuid:9697672e-e763-4d98-a2ce-7ed9e18b33b2

مصطلحات موضوعية: Failure analysis, Mechanical stress, Electric properties, PZT, Piezoelectric materials, Humidity effects, Piezoelectricity, Adhesive interlayers, Material properties, Lifetime tests, Numerical simulations, Piezoelectric actuators, Microstructure, Piezoelectric transducers, Actuator designs, Stress development, Computer simulation, Piezoceramic, Quality assurance, Semiconducting lead compounds, Actuator performance, Multilayers, Piezo-ceramic actuators, Multilayer actuators, Electrical properties, Safety factor, Electronics, Piezoelectric properties, Actuators

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dris___00893::4f4e9e8434173eb008218cc5e0b09d3d
http://resolver.tudelft.nl/uuid:9697672e-e763-4d98-a2ce-7ed9e18b33b2

المؤلفون: Helmut Schröder, Denny Wernham, Paul Allenspacher, Yngve Lien, Wolfgang Riede

المصدر: SPIE Proceedings.

مصطلحات موضوعية: aromatic hydrocarbons, Analytical chemistry, Partial pressure, Laser, lifetime tests, Toluene, Q-switching, Laser-induced contamination, law.invention, chemistry.chemical_compound, toluene partial pressure, vacuum chamber, chemistry, X-ray photoelectron spectroscopy, law, Transmission electron microscopy, Vacuum chamber, Deposition (law)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::db2e5ccd27ba0271c329461c75cedcc2
https://doi.org/10.1117/12.638765

المؤلفون: Looser, Raphael, Vivar, Marta, Everett, Vernie

المصدر: Applied Energy

مصطلحات موضوعية: Keywords: Accelerated lifetime tests, Concentrator, Electrical conversion efficiencies, Feasible alternatives, Long term performance, Photovoltaic, Spectral-splitting, UV light exposures, Chemical stability, Cooling systems, Filters (for fluids), Fluids, Food proce Concentrator, Heat transfer fluids, Liquid filter, Optical transmittance

Relation: http://hdl.handle.net/1885/77279; https://openresearch-repository.anu.edu.au/bitstream/1885/77279/5/f5625xPUB6180_2014.pdf.jpg; https://openresearch-repository.anu.edu.au/bitstream/1885/77279/7/01_Looser_Spectral_characterisation_and_2014.pdf.jpg

الاتاحة: http://hdl.handle.net/1885/77279
https://doi.org/10.1016/j.apenergy.2013.09.001
https://openresearch-repository.anu.edu.au/bitstream/1885/77279/5/f5625xPUB6180_2014.pdf.jpg
https://openresearch-repository.anu.edu.au/bitstream/1885/77279/7/01_Looser_Spectral_characterisation_and_2014.pdf.jpg

المساهمون: Gayte, B

المصدر: Other Information: From 2nd International Conference on Thermionic Electrical Power Generation, Stresa, Italy. UNCL. Orig. Receipt Date: 31-DEC-69

وصف الملف: Medium: X

URL الوصول: http://www.osti.gov/scitech/biblio/4812309

المؤلفون: Martonka Rudolf, Fliegel Vítězslav

مصطلحات موضوعية: Car seats, Exposed to, Lifetime tests, Long life, Short term, Vibration

Relation: https://dspace.tul.cz/handle/15240/30184

الاتاحة: https://dspace.tul.cz/handle/15240/30184