المؤلفون: Nolze, Gert, Tokarski, Tomasz, Rychłowski, Łukasz, 3AGH University of Science and TechnologyAcademic Centre for Materials and NanotechnologyMickiewicza 30 Krakow 30-059 Poland

مصطلحات موضوعية: ddc:548, mean atomic number, Kikuchi patterns, lattice parameters, automated Bragg angle determination, lattice parameter determination, dynamical theory of electron diffraction, electron backscatter diffraction, Funk transform

Relation: http://resolver.sub.uni-goettingen.de/purl?gldocs-11858/10900

الاتاحة: https://doi.org/10.1107/S1600576723000146
http://resolver.sub.uni-goettingen.de/purl?gldocs-11858/10900

المساهمون: Canfield, P. [Ames Lab., Ames, IA (United States); Iowa State Univ., Ames, IA (United States). Dept. of Physics and Astronomy]

المصدر: Philosophical Magazine (2003, Print); 96; 20

وصف الملف: Medium: ED; Size: p. 2115-2124

URL الوصول: http://www.osti.gov/scitech/servlets/purl/1326833

المؤلفون: Nolze, Gert, Tokarski, Tomasz, Rychłowski, Łukasz, 3AGH University of Science and TechnologyAcademic Centre for Materials and NanotechnologyMickiewicza 30 Krakow 30-059 Poland

المصدر: Journal of Applied Crystallography. 56:349-360

مصطلحات موضوعية: Bragg angles, lattice parameters, Kikuchi bands, Kikuchi patterns, first derivative, lattice parameter determination, electron backscatter diffraction, ddc:548, General Biochemistry, Genetics and Molecular Biology, Bravais lattice type, Radon transform

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7ce82a97b9c2d33e007ad311507b2c1c
https://doi.org/10.1107/s1600576723000134

المؤلفون: Kenji Tsuda, Masami Terauchi, Michiyoshi Tanaka, Takayuki Akaogi, 寺内 正己, 津田 健治, 田中 通義, 赤荻 隆之

المصدر: まてりあ / Materia Japan. 2006, 45(12):887

المؤلفون: Jesche, A., Fix, M., Kreyssig, Andreas, Meier, William, Canfield, Paul

المساهمون: Ames National Laboratory, Ames Laboratory, Physics and Astronomy

المصدر: archive/lib.dr.iastate.edu/physastro_pubs/550/2016_CanfieldPaul_XRayDiffraction.pdf|||Sat Jan 15 00:55:38 UTC 2022 ; 10.1080/14786435.2016.1192725

مصطلحات موضوعية: Materials Science and Engineering, Physics, X-Ray diffraction, single crystal, lattice parameter determination, powder diffractometer

وصف الملف: application/pdf

Relation: archive/lib.dr.iastate.edu/physastro_pubs/550/; 1560; physastro_pubs/550; https://dr.lib.iastate.edu/handle/20.500.12876/57333

الاتاحة: https://dr.lib.iastate.edu/handle/20.500.12876/57333
https://hdl.handle.net/20.500.12876/57333

المؤلفون: Martin, Yannick, Rouviere, Jean-Luc, Zuo, J. M., Favre-Nicolin, Vincent

المساهمون: Laboratoire d'Etude des Matériaux par Microscopie Avancée (LEMMA), Modélisation et Exploration des Matériaux (MEM), Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), University of Illinois at Urbana-Champaign Urbana (UIUC), University of Illinois System, Nanostructures et Rayonnement Synchrotron (NRS)

المصدر: ISSN: 0304-3991 ; Ultramicroscopy ; https://cea.hal.science/cea-01851578 ; Ultramicroscopy, 2016, 160, pp.64-73. ⟨10.1016/j.ulisamic.2014.12.009⟩.

مصطلحات موضوعية: Lattice parameter determination, Gradient Tensor, CBED Patterns, Strain-Measurements, Holz Lines, EBSD, [PHYS]Physics [physics]

الاتاحة: https://cea.hal.science/cea-01851578
https://doi.org/10.1016/j.ulisamic.2014.12.009

المصدر: Other Information: In Annual scientific report, 1970. UNCL. Orig. Receipt Date: 31-DEC-72

وصف الملف: Medium: X; Size: Pages: 17

URL الوصول: http://www.osti.gov/scitech/biblio/4656199