المؤلفون: Pellegrino O., Pires C., Filipe E.

المصدر: International Journal of Metrology and Quality Engineering, Vol 2, Iss 1, Pp 1-4 (2011)

مصطلحات موضوعية: luminous intensity, illuminance, illuminance responsivity, metrological traceability, internal verification of measurement method, Technology

وصف الملف: electronic resource

Relation: https://www.metrology-journal.org/articles/ijmqe/pdf/2011/01/ijmqe2011001.pdf; https://doaj.org/toc/2107-6839; https://doaj.org/toc/2107-6847

URL الوصول: https://doaj.org/article/a5d3386e0d654a88bb1bfc5a799f66c2

المؤلفون: Pons Aglio, Alicia, Campos Acosta, Joaquín, Tártalo, Carlos, Corróns, Antonio

مصطلحات موضوعية: mismatch correction factor, illuminance meter, illuminance responsivity

وصف الملف: 381636 bytes; application/pdf

Relation: Proceedings of Light and Lighting 2009 Conference; http://hdl.handle.net/10261/23137

الاتاحة: http://hdl.handle.net/10261/23137

المؤلفون: O. Pellegrino, E. Filipe, C. Pires

المصدر: International Journal of Metrology and Quality Engineering, Vol 2, Iss 1, Pp 1-4 (2011)

مصطلحات موضوعية: Measurement method, Technology, Traceability, Computer science, Metrological traceability, illuminance responsivity, Illuminance, internal verification of measurement method, Photometry (optics), Systems engineering, metrological traceability, Internal validation, illuminance, Safety, Risk, Reliability and Quality, luminous intensity, Remote sensing

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41b1b2754a9596677d0459d4ee0bec4d
https://www.metrology-journal.org/articles/ijmqe/pdf/2011/01/ijmqe2011001.pdf

المؤلفون: C. C. Miller, T. C. Larason, Y. Ohno

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.nist.gov/customcf/get_pdf.cfm?pub_id=902807.

مصطلحات موضوعية: calibration, illuminance responsivity, photometry, spectral

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.424.4476; http://www.nist.gov/customcf/get_pdf.cfm?pub_id=902807

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.424.4476
http://www.nist.gov/customcf/get_pdf.cfm?pub_id=902807