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1Academic Journal
المؤلفون: Kyunghwan Song, Jongwook Kim, Hyunwoong Kim, Seonghi Lee, Jangyong Ahn, Andres Brito, Hyunsik Kim, Minho Park, Seungyoung Ahn
المصدر: Electronics; Volume 10; Issue 13; Pages: 1590
مصطلحات موضوعية: signal integrity (SI), high-speed signaling channel, tabbed routing, far-end crosstalk (FEXT), insertion loss, time domain reflectometer (TDR), time domain transmission (TDT), 3D EM simulation
وصف الملف: application/pdf
Relation: Circuit and Signal Processing; https://dx.doi.org/10.3390/electronics10131590