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1Academic Journal
المؤلفون: Chongyu Wang, Yinyin Chao, Jiujiu Liang, Bing Yan, Xiaohao Wang, Kai Ni, Qian Zhou
المصدر: Advanced Photonics Research, Vol 4, Iss 2, Pp n/a-n/a (2023)
مصطلحات موضوعية: high aspect ratio structures, infrared wire grid polarizer, large-area nanofabrication, polarization imaging systems, structural optimization, Applied optics. Photonics, TA1501-1820, Optics. Light, QC350-467
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2699-9293
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2Academic Journal
المؤلفون: Josip Bobinac, Tobias Reiter, Julius Piso, Xaver Klemenschits, Oskar Baumgartner, Zlatan Stanojevic, Georg Strof, Markus Karner, Lado Filipovic
المصدر: Micromachines; Volume 14; Issue 3; Pages: 665
مصطلحات موضوعية: SF 6 /O 2, plasma etching, high-aspect-ratio structures, 3D integration, mask tapering, mask faceting, mask geometry, modeling and simulation, process TCAD
وصف الملف: application/pdf
Relation: A:Physics; https://dx.doi.org/10.3390/mi14030665
الاتاحة: https://doi.org/10.3390/mi14030665
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3Academic Journal
مصطلحات موضوعية: carbon nanotubes, colloidal lithography, chemical vapor deposition, high-aspect ratio structures, submicron pores
وصف الملف: Print-Electronic; application/pdf; application/vnd.openxmlformats-officedocument.wordprocessingml.document
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4Academic Journal
المؤلفون: Neha Karekar, Anik Karan, Elnaz Khezerlou, Neela Prajapati, Chelsea D. Pernici, Teresa A. Murray, Mark A. DeCoster
المصدر: Nanomaterials; Volume 9; Issue 9; Pages: 1282
مصطلحات موضوعية: self-assembly, amino acid, copper-containing high-aspect ratio structures (CuHARS), silver nanoparticles, anti-cancer, cystine-capped nanoparticles, functionalization
وصف الملف: application/pdf
Relation: https://dx.doi.org/10.3390/nano9091282
الاتاحة: https://doi.org/10.3390/nano9091282
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5
المؤلفون: Sarah Jessl, Michael De Volder, Simon Engelke, Jeremy J. Baumberg, Davor Copic
المساهمون: Jessl, Sarah [0000-0003-4659-6412], Baumberg, Jeremy J [0000-0002-9606-9488], De Volder, Michael [0000-0003-1955-2270], Apollo - University of Cambridge Repository
المصدر: ACS Applied Nano Materials
مصطلحات موضوعية: Battery (electricity), Fabrication, Materials science, submicron pores, Nanotechnology, 02 engineering and technology, Chemical vapor deposition, Carbon nanotube, engineering.material, 010402 general chemistry, 01 natural sciences, 7. Clean energy, Article, law.invention, chemical vapor deposition, Coating, law, General Materials Science, Porosity, carbon nanotubes, 021001 nanoscience & nanotechnology, 0104 chemical sciences, Anode, Nanopore, colloidal lithography, engineering, 0210 nano-technology, high-aspect ratio structures
وصف الملف: application/pdf; application/vnd.openxmlformats-officedocument.wordprocessingml.document
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6Dissertation/ Thesis
المؤلفون: Yim, Jihong
المساهمون: Puurunen, Riikka L., Assoc. Prof., Aalto University, Department of Chemical and Metallurgical Engineering, Finland, Karinen, Reetta, D.Sc. (Tech.), Aalto University, Department of Chemical and Metallurgical Engineering, Finland, Kemian tekniikan korkeakoulu, School of Chemical Technology, Kemian tekniikan ja metallurgian laitos, Department of Chemical and Metallurgical Engineering, Catalysis Research, Aalto-yliopisto, Aalto University
مصطلحات موضوعية: Chemistry, atomic layer deposition, conformality, catalyst, high-aspect-ratio structures
وصف الملف: 73 + app. 127; application/pdf
Relation: Aalto University publication series DOCTORAL THESES; 116/2024; [Publication 1]: Yim, J., Haimi, E., Mäntymäki, M., Kärkäs, V., Bes, R., Arandia, A., Meinander, K., Brüner, P., Grehl, T., Gell, L., Viinikainen, T., Honkala, K., Huotari, S., Karinen, R., Putkonen, M, and Puurunen, R. L., Atomic layer deposition of zinc oxide on mesoporous zirconia using zinc(II) acetylacetonate and air, Chemistry of Materials, 35 (2023) 7915–7930. Full text in Acris/Aaltodoc: https://urn.fi/URN:NBN:fi:aalto-202312117215. DOI:10.1021/acs.chemmater.3c00668; [Publication 2]: Arandia, A., Yim, J., Warraich, H., Leppäkangas, E., Bes, R., Lempelto, A., Gell, L., Jiang, H., Meinander, K., Viinikainen, T., Huotari, S., Honkala, K., and Puurunen, R. L., Effect of atomic layer deposited zinc promoter on the activity of copper-on-zirconia catalysts in the hydrogenation of carbon dioxide to methanol, Applied Catalysis B: Environmental, 321 (2023) 122046. Full text in Acris/Aaltodoc: https://urn.fi/URN:NBN:fi:aalto-202211096455. DOI:10.1016/j.apcatb.2022.122046; [Publication 3]: Yim, J., Ylivaara, O. M. E., Ylilammi, M., Korpelainen, V., Haimi, E., Verkama, E., Utriainen, M., and Puurunen, R. L., Saturation profile based conformality analysis for atomic layer deposition: aluminum oxide in lateral high-aspect-ratio channels, Physical Chemistry Chemical Physics, 22 (2020) 23107-23120. DOI:10.1039/D0CP03358H; [Publication 4]: Yim, J., Verkama, E., Velasco, J.A., Arts, K., and Puurunen, R. L., Conformality of atomic layer deposition in microchannels: impact of process parameters on the simulated thickness profile, Physical Chemistry Chemical Physics, 24 (2022) 8645-8660. Full text in Acris/Aaltodoc: https://urn.fi/URN:NBN:fi:aalto-202205042992. DOI:10.1039/D1CP04758B; 1799-4942 (electronic); 1799-4934 (printed); 1799-4934 (ISSN-L); https://aaltodoc.aalto.fi/handle/123456789/127771; URN:ISBN:978-952-64-1853-7
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7Conference
المؤلفون: Kia, Alireza, M., Mart, Clemens, Haufe, Nora, Utriainen, Mikko, Puurunen, Riikka L., Weinreich, Wenke
المصدر: Kia , A M , Mart , C , Haufe , N , Utriainen , M , Puurunen , R L & Weinreich , W 2019 , ' Depth spectroscopy analysis of La-doped HfO2 ALD thin films in 3D structures by HAXPES and ToF-SIMS ' , 18th European Conference on Applications of Surface and Interface Analysis (ECASIA) , Dresden , Germany , 15/09/19 - 20/09/19 .
مصطلحات موضوعية: La-doped HfO2, ALD, ToF-SIMS, high aspect ratio structures, hard-XPS, OtaNano
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8
المؤلفون: Alireza, M. Kia, Clemens Mart, Nora Haufe, Mikko Utriainen, Puurunen, Riikka L., Wenke Weinreich
المصدر: Kia, A M, Mart, C, Haufe, N, Utriainen, M, Puurunen, R L & Weinreich, W 2019, ' Depth spectroscopy analysis of La-doped HfO2 ALD thin films in 3D structures by HAXPES and ToF-SIMS ', 18th European Conference on Applications of Surface and Interface Analysis (ECASIA), Dresden, Germany, 15/09/19-20/09/19 .
VTT Technical Research Centre of Finland-PUREمصطلحات موضوعية: ALD, hard-XPS, La-doped HfO2, high aspect ratio structures, OtaNano, ToF-SIMS
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9
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10Conference
المؤلفون: Puurunen, Riikka, Ylivaara, Oili, Ylilammi, Markku
المصدر: Puurunen , R , Ylivaara , O & Ylilammi , M 2017 , ' Thin film conformality analysis with microscopic all-silicon lateral high aspect ratio structures ' , Joint EuroCVD 21 - Baltic ALD 15 Conference , Linköping , Sweden , 11/06/17 - 14/06/17 .
مصطلحات موضوعية: ALD, atomic layer deposition, conformality analysis, LHAR, lateral high aspect ratio structures
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11Conference
المؤلفون: Ylilammi, Markku
المصدر: Ylilammi , M 2017 , ' Modelling of conformality of Atomic Layer Deposition in lateral high aspect ratio structures ' , Paper presented at 5th Annual seminar of ALD Centre of Excellence, ALDCoE Seminar 2017 , Helsinki , Finland , 30/03/17 .
مصطلحات موضوعية: thin films, conformality, ALD, atomic layer deposition, high aspect ratio structures, mass transfer, diffusion, surface reactions, OtaNano
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12
مصطلحات موضوعية: Condensed Matter::Materials Science, conformality, thin films, surface reactions, ALD, atomic layer deposition, mass transfer, diffusion, high aspect ratio structures, OtaNano
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13
مصطلحات موضوعية: lateral high aspect ratio structures, LHAR, ALD, atomic layer deposition, conformality analysis
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14
مصطلحات موضوعية: lateral high aspect ratio structures, LHAR, ALD, atomic layer deposition, conformality analysis
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15
مصطلحات موضوعية: conformality, ta213, surface reactions, thin films, ALD, atomic layer deposition, mass transfer, diffusion, high aspect ratio structures
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16Academic Journal
المؤلفون: Grigoras, Kestutis, Ylivaara, Oili, Gao, Feng, Heikkilä, Mikko J., Mizohata, Kenichiro, Prunnila, Mika, Räisänen, Jyrki, Ritala, Mikko, Leskelä, Markku, Ahopelto, Jouni, Puurunen, Riikka
المصدر: Grigoras , K , Ylivaara , O , Gao , F , Heikkilä , M J , Mizohata , K , Prunnila , M , Räisänen , J , Ritala , M , Leskelä , M , Ahopelto , J & Puurunen , R 2016 , Highly conformal TiN by atomic layer deposition : growth and characterization . in Technical Program & Abstracts . American Vacuum Society (AVS) , 16th International Conference on Atomic Layer Deposition, ALD 2016 , Dublin , Ireland , 24/07/16 .
مصطلحات موضوعية: ALD, Atomic Layer Deposition, TiN, Lateral high-aspect ratio structures, LHAR
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17
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18Dissertation/ Thesis
المؤلفون: Chen, Yining
المساهمون: Kardomateas, George A., Leo, Claudio Di, Zhu, Ting, Rimoli, Julian, Hanagud, Sathyanaraya, Aerospace Engineering
مصطلحات موضوعية: Microfabrication, 3D process, High aspect ratio structures
وصف الملف: application/pdf
Relation: http://hdl.handle.net/1853/66097
الاتاحة: http://hdl.handle.net/1853/66097
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19Conference
المؤلفون: Haiducu, Marius, Sameoto, Dan E., Foulds, Ian G., Johnstone, Robert W., Parameswaran, M. Ash
المساهمون: Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division, Electrical Engineering Program, Mechanical Engineering Program, Physical Science and Engineering (PSE) Division
مصطلحات موضوعية: Deep-UV patterning, High-aspect ratio structures, MEMS, Microfluidics, Poly(methyl methacrylate) (PMMA)
Relation: Haiducu, M., Sameoto, D., Foulds, I., Johnstone, R. W., & Parameswaran, A. M. (2012). Bosch-like method for creating high aspect ratio poly(methyl methacrylate) (PMMA) structures. Micromachining and Microfabrication Process Technology XVII. doi:10.1117/12.908690; Micromachining and Microfabrication Process Technology XVII; http://hdl.handle.net/10754/565862
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20Conference
المؤلفون: Rota, A., Duong, T.V., Hartwig, T.
مصطلحات موضوعية: injection molding, high aspect ratio structures
Time: 620, 660, 671
Relation: International Workshop on High-Aspect-Ratio Micro-Structure Technology (HARMST) 2001; HARMST '01. Fourth International Workshop on High-Aspect-Ratio Micro-Structure Technology. Book of Abstracts; https://publica.fraunhofer.de/handle/publica/338667