المؤلفون: A. Llamazares, M. Garcia-Gracia, S. Martin-Arroyo

المصدر: IEEE Access, Vol 9, Pp 40695-40705 (2021)

مصطلحات موضوعية: Curve-fitting procedure, flexible test probe, impedance measurement, parasitic impedance, printed circuit board (PCB), propagation time, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9371700/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/9f428d851cb24474bccbd01359ecae6a