المؤلفون: SAN-PABLO-JUÁREZ Miguel-Ángel, QUIROGA-GONZÁLEZ Enrique

المصدر: Journal of Electrical and Electronics Engineering, Vol 17, Iss 1, Pp 23-28 (2024)

مصطلحات موضوعية: fft impedance spectroscopy, off-the-shelf devices, impedance spectroscope, dynamical systems, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://electroinf.uoradea.ro/images/articles/CERCETARE/Reviste/JEEE/JEEE_V17_N1_MAY_2024/05%20paper%202312061%20SAN-PABLO-JUAREZ.pdf; https://doaj.org/toc/1844-6035; https://doaj.org/toc/2067-2128

URL الوصول: https://doaj.org/article/364ef657486144fa805ff5fdb71d68db

المؤلفون: Enrique Quiroga-González, Jürgen Carstensen, Helmut Föll, Colm Glynn, Colm O'Dwyer

المصدر: Phys. Chem. Chem. Phys.. 16:255-263

مصطلحات موضوعية: Raman scattering, Silicon, Materials science, Macropore formation, Kinetics, Analytical chemistry, Pore modulation, p-type Si, FFT impedance spectroscopy, General Physics and Astronomy, chemistry.chemical_element, Dielectric spectroscopy, law.invention, symbols.namesake, chemistry, law, Etching (microfabrication), Electron microscopy, symbols, Physical and Theoretical Chemistry, Electron microscope, Current density, Dissolution

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5cd4f2721f7a2e9beeba8a42feccab97
https://doi.org/10.1039/c3cp53600a

المؤلفون: Quiroga-Gonzalez, Enrique, Carstensen, Jurgen, Glynn, Colm, O'Dwyer, Colm, Foll, Helmut

مصطلحات موضوعية: Macropore formation, Raman scattering, Electron microscopy, Pore modulation, Silicon, p-type Si, FFT impedance spectroscopy

وصف الملف: application/pdf

Relation: http://pubs.rsc.org/en/content/articlelanding/2014/cp/c3cp53600a#!divAbstract; Quiroga-Gonzalez, E., Carstensen, J., Glynn, C., O'Dwyer, C. and Foll, H. (2014) 'Pore size modulation in electrochemically etched macroporous p-type silicon monitored by FFT impedance spectroscopy and Raman scattering', Physical Chemistry Chemical Physics, 16(1), pp. 255-263. doi:10.1039/C3CP53600A; 263; Physical Chemistry Chemical Physics; 255; http://hdl.handle.net/10468/6083; 16

الاتاحة: http://hdl.handle.net/10468/6083
https://doi.org/10.1039/C3CP53600A

المؤلفون: Mark-Daniel Gerngross, Jürgen Carstensen, Helmut Föll

المصدر: Nanoscale Research Letters

مصطلحات موضوعية: Materials science, Nano Express, Equivalent series resistance, business.industry, RC element, Nanowire, Nanotechnology, Condensed Matter Physics, single-crystalline InP membranes, Dielectric spectroscopy, FFT-impedance spectroscopy, Maxwell element, Magnetization, Membrane, Materials Science(all), Co nanowires, Optoelectronics, General Materials Science, Crystallite, business, Anisotropy, Electrical impedance

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1d74091ded70e7124f37d446bf4efa55