المؤلفون: Yongji Wang, Lili Jiang, Qingwen Qi, Ying Liu, Jun Wang

المصدر: Remote Sensing; Volume 11; Issue 16; Pages: 1946

مصطلحات موضوعية: soil sampling, spatial coverage, feature coverage, farm field-level soil mapping, super-grid, limited sample size

جغرافية الموضوع: agris

وصف الملف: application/pdf

Relation: Remote Sensing in Agriculture and Vegetation; https://dx.doi.org/10.3390/rs11161946

الاتاحة: https://doi.org/10.3390/rs11161946

المؤلفون: Carlsson, Mats, Gotlieb, Arnaud, Marijan, Dusica

مصطلحات موضوعية: Feature coverage, Software product line testing, Test suite optimization, Test suite reduction, Computer software, Constrained optimization, Costs, Feature extraction, Heuristic algorithms, Optimization, Testing, Constraint optimizations, Feature interactions, Objective functions, Software Product Line, Test-execution cost, Software testing

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-31109

المؤلفون: Cmyrev, Anastasia

المساهمون: Technische Universität Berlin, Fakultät IV - Elektrotechnik und Informatik, Jähnichen, Stefan, Reißing, Ralf, Helke, Steffen

مصطلحات موضوعية: 600 Technik, Technologie, Produktlinientest, Anforderungsabdeckung, Eingebettete Systeme, Merkmalabdeckung, Variantenmanagement, Software-Produktlinientest, product line testing, Embedded systems, Feature coverage, Requirements coverage, Variability management, software product line testing

وصف الملف: application/pdf

Relation: urn:nbn:de:kobv:83-opus4-56468; https://depositonce.tu-berlin.de/handle/11303/4475; http://dx.doi.org/10.14279/depositonce-4178

الاتاحة: https://depositonce.tu-berlin.de/handle/11303/4475
https://nbn-resolving.org/urn:nbn:de:kobv:83-opus4-56468
https://doi.org/10.14279/depositonce-4178

المؤلفون: Cmyrev, Anastasia

المساهمون: Technische Universität Berlin, Fakultät IV - Elektrotechnik und Informatik, Jähnichen, Stefan, Reißing, Ralf, Helke, Steffen

مصطلحات موضوعية: 600 Technik, Technologie, Produktlinientest, Anforderungsabdeckung, Eingebettete Systeme, Merkmalabdeckung, Variantenmanagement, Software-Produktlinientest, product line testing, Embedded systems, Feature coverage, Requirements coverage, Variability management, software product line testing, stat, manag

Relation: http://depositonce.tu-berlin.de/handle/11303/4475

الاتاحة: http://depositonce.tu-berlin.de/handle/11303/4475

المؤلفون: Cmyrev, Anastasia

المساهمون: Reißing, Ralf, Jähnichen, Stefan, Helke, Steffen

الاتاحة: http://data.europeana.eu/aggregation/europeana/2048441/item_FVJAYDRREABSW2AZW3KAR4ZGF6Q2KR7X