المؤلفون: Shunsuke Araki, Ji-Han Wu, Jun-Juh Yan

المصدر: IEEE Access, Vol 12, Pp 24039-24047 (2024)

مصطلحات موضوعية: Chaos, discretization, extremum coding, random number generator, statistical test, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10433538/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/1e1fe934b4a84d43aa08dd456a905ab7

المؤلفون: Araki, Shunsuke, 荒木, 俊輔, Wu, Ji-Han, Yan, Jun-Juh

مصطلحات موضوعية: Chaos, discretization, extremum coding, random number generator, statistical test

وصف الملف: application/pdf

Relation: https://doi.org/10.1109/ACCESS.2024.3365638; IEEE Access; 12; 24039; 24047; https://kyutech.repo.nii.ac.jp/record/2000463/files/10429114.pdf

الاتاحة: https://kyutech.repo.nii.ac.jp/record/2000463/files/10429114.pdf