يعرض 1 - 20 نتائج من 217 نتيجة بحث عن '"error-tolerant"', وقت الاستعلام: 0.67s تنقيح النتائج
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    Academic Journal
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    Academic Journal
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    Academic Journal

    المصدر: Applied Sciences; Volume 13; Issue 16; Pages: 9094

    جغرافية الموضوع: agris

    وصف الملف: application/pdf

    Relation: Electrical, Electronics and Communications Engineering; https://dx.doi.org/10.3390/app13169094

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    Academic Journal

    المؤلفون: Jinrong Yang, Shuai Chen, Yuan Cao

    المصدر: Sensors; Volume 23; Issue 7; Pages: 3476

    وصف الملف: application/pdf

    Relation: Intelligent Sensors; https://dx.doi.org/10.3390/s23073476

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    Academic Journal
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    Conference

    المساهمون: Edoardo Liberati, Alessandro Visintin, Riccardo Lazzeretti, Mauro Conti, Selcuk Uluagac, Liberati, Edoardo, Visintin, Alessandro, Lazzeretti, Riccardo, Conti, Mauro, Uluagac, Selcuk

    Relation: info:eu-repo/semantics/altIdentifier/isbn/978-3-031-54769-0; info:eu-repo/semantics/altIdentifier/isbn/978-3-031-54770-6; info:eu-repo/semantics/altIdentifier/wos/WOS:001206023300008; ispartofbook:International Conference on Applied Cryptography and Network Security; International Conference on Applied Cryptography and Network Security; volume:14583; firstpage:183; lastpage:210; numberofpages:28; https://hdl.handle.net/11573/1703289

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    Academic Journal

    المساهمون: Jain, A., Veggetti, A. M., Crippa, D., Benfante, A., Gerardin, S., Bagatin, M.

    وصف الملف: STAMPA

    Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000761253900001; firstpage:1; lastpage:13; numberofpages:13; journal:IEEE JOURNAL OF SOLID-STATE CIRCUITS; http://hdl.handle.net/11577/3439226; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85125332288

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    Academic Journal
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    Academic Journal

    المساهمون: Indian Institute of Technology Indore (IITI), Indian Institute of Technology Jammu (IIT Jammu), Vienna University of Technology (TU Wien), Test and dEpendability of microelectronic integrated SysTems (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

    المصدر: ISSN: 2079-9292 ; Electronics ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03376967 ; Electronics, 2021, 10 (14), pp.1718. ⟨10.3390/electronics10141718⟩.

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    Academic Journal
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    Academic Journal
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    Conference

    المؤلفون: Peñaloza, R

    المساهمون: Van Woensel, W, Franconi, E, Costantini, S, Roman, D, Kontchakov, R, Sadri, F, Peñaloza, R

    Relation: info:eu-repo/semantics/altIdentifier/isbn/9783319612515; info:eu-repo/semantics/altIdentifier/wos/WOS:000432826500015; ispartofbook:Rules and Reasoning: International Joint Conference, RuleML+RR 2017; International Joint Conference on Rules and Reasoning, RuleML+RR 2017; volume:10364; firstpage:215; lastpage:229; numberofpages:15; serie:LECTURE NOTES IN COMPUTER SCIENCE; alleditors:Van Woensel, W; Franconi, E; Costantini, S; Roman, D; Kontchakov, R; Sadri, F; http://hdl.handle.net/10281/233839; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85021446162

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    Academic Journal

    المساهمون: Liu, Weiqiang, Xu, Jiahua, Wang, Danye, Wang, Chenghua, Montuschi, Paolo, Lombardi, Fabrizio

    وصف الملف: ELETTRONICO

    Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000440852500019; volume:65; issue:9; firstpage:2856; lastpage:2868; numberofpages:13; journal:IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS; http://hdl.handle.net/11583/2698291; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85041649048; https://ieeexplore-ieee-org.ezproxy.biblio.polito.it/document/8280549

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    Academic Journal

    المؤلفون: Kemal Oflazer

    Relation: https://figshare.com/articles/Error-tolerant_Finite-state_Recognition_with_Applications_to_Morphological_Analysis_and_Spelling_Correction/6287645

    الاتاحة: https://doi.org/10.1184/r1/6287645.v1
    https://figshare.com/articles/Error-tolerant_Finite-state_Recognition_with_Applications_to_Morphological_Analysis_and_Spelling_Correction/6287645