المؤلفون: Shaghayegh Mirhosseini, Payman Kazemikhah, Hossein Aghababa, Mohammadreza Kolahdouz

المصدر: SN Applied Sciences, Vol 5, Iss 1, Pp 1-10 (2022)

مصطلحات موضوعية: Erbium-doping, On-chip signal amplification, Integrated optics, Micro-ring resonator waveguide amplifiers, Science, Technology

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2523-3963; https://doaj.org/toc/2523-3971

URL الوصول: https://doaj.org/article/af91518467e243509bb7285e5eb3870e

المؤلفون: Tavani, Giulio, Barri, Chiara, Mafakheri, Erfan, Franzò, Giorgia, Celebrano, Michele, Castriotta, Michele, Di Giancamillo, Matteo, Ferrari, Giorgio, Picciariello, Francesco, Foletto, Giulio, Agnesi, Costantino, Vallone, Giuseppe, Villoresi, Paolo, Sorianello, Vito, Rotta, Davide, Finazzi, Marco, Bollani, Monica, Prati, Enrico

المساهمون: Tavani, Giulio, Barri, Chiara, Mafakheri, Erfan, Franzò, Giorgia, Celebrano, Michele, Castriotta, Michele, Di Giancamillo, Matteo, Ferrari, Giorgio, Picciariello, Francesco, Foletto, Giulio, Agnesi, Costantino, Vallone, Giuseppe, Villoresi, Paolo, Sorianello, Vito, Rotta, Davide, Finazzi, Marco, Bollani, Monica, Prati, Enrico

مصطلحات موضوعية: SOI diode, erbium doping, quantum key distribution, silicon photonics

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/pmid/36984223; info:eu-repo/semantics/altIdentifier/wos/WOS:000960558800001; volume:16; issue:6; firstpage:2344; journal:MATERIALS; https://hdl.handle.net/11577/3481428; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85151989079

الاتاحة: https://hdl.handle.net/11577/3481428
https://doi.org/10.3390/ma16062344

المؤلفون: Maksym Buryi, Amayès Médhi Gaston-Bellegarde, Jan Pejchal, Fedor Levchenko, Zdeněk Remeš, Katarína Ridzoňová, Vladimir Babin, Sergii Chertopalov

المصدر: Crystals, Vol 13, Iss 4, p 562 (2023)

مصطلحات موضوعية: yttrium aluminum garnet, erbium doping, EPR, luminescence, kinetics, Crystallography, QD901-999

Relation: https://www.mdpi.com/2073-4352/13/4/562; https://doaj.org/toc/2073-4352; https://doaj.org/article/cef214cbf623457fb1ad3d5bc41fa089

الاتاحة: https://doi.org/10.3390/cryst13040562
https://doaj.org/article/cef214cbf623457fb1ad3d5bc41fa089

المؤلفون: Giulio Tavani, Chiara Barri, Erfan Mafakheri, Giorgia Franzò, Michele Celebrano, Michele Castriotta, Matteo Di Giancamillo, Giorgio Ferrari, Francesco Picciariello, Giulio Foletto, Costantino Agnesi, Giuseppe Vallone, Paolo Villoresi, Vito Sorianello, Davide Rotta, Marco Finazzi, Monica Bollani, Enrico Prati

المصدر: Materials; Volume 16; Issue 6; Pages: 2344

مصطلحات موضوعية: silicon photonics, quantum key distribution, SOI diode, erbium doping, General Materials Science, Settore FIS/03 - Fisica della Materia, Settore FIS/02 - Fisica Teorica, Modelli e Metodi Matematici

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e3afda7f4c41a5049d8c07ce9baaa4c6
https://hdl.handle.net/2434/958716

المؤلفون: Liping Fang, Yidong Jiang, Shengfa Zhu, Jingjing Ding, Dongxu Zhang, Anyi Yin, Piheng Chen

المصدر: Materials; Volume 11; Issue 11; Pages: 2196

مصطلحات موضوعية: luminescence sensing, aluminum nitride, erbium doping, magnetron sputtering

وصف الملف: application/pdf

Relation: Thin Films and Interfaces; https://dx.doi.org/10.3390/ma11112196

الاتاحة: https://doi.org/10.3390/ma11112196

المؤلفون: Yu, Zhenzhen, Yang, Kai, Yu, Changlin, Lu, Kangqiang, Huang, Weiya, Xu, Liang, Zou, Laixi, Wang, Sibo, Chen, Zhong, Hu, Jun, Hou, Yang, Zhu, Yongfa

المساهمون: School of Materials Science and Engineering

مصطلحات موضوعية: Science::Chemistry, Erbium Doping, Internal Electric Field

Relation: Advanced Functional Materials; Yu, Z., Yang, K., Yu, C., Lu, K., Huang, W., Xu, L., Zou, L., Wang, S., Chen, Z., Hu, J., Hou, Y. & Zhu, Y. (2022). Steering unit cell dipole and internal electric field by highly dispersed Er atoms embedded into NiO for efficient CO₂ photoreduction. Advanced Functional Materials, 32(28), 2111999-. https://dx.doi.org/10.1002/adfm.202111999; https://hdl.handle.net/10356/163270; 2-s2.0-85127246515; 28; 32; 2111999

الاتاحة: https://hdl.handle.net/10356/163270
https://doi.org/10.1002/adfm.202111999

المساهمون: Van Buren, T

المصدر: Applied Physics Letters, 98(20):Article No. 203107; 98; 20

وصف الملف: Medium: X

URL الوصول: http://www.osti.gov/scitech/biblio/1016443

المؤلفون: Brien, Valerie, Boulet, Pascal

المساهمون: Institut Jean Lamour (IJL), Institut de Chimie - CNRS Chimie (INC-CNRS)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 1359-6454 ; Acta Materialia ; https://hal.science/hal-02087664 ; Acta Materialia, 2015, 90, pp.37-45. ⟨10.1016/j.actamat.2015.02.022⟩.

مصطلحات موضوعية: TEM, XRD, Aluminium nitride, Erbium doping, R.F. sputtering, Photoluminescence, AlN, insertion site, substitution, RF sputtering, [CHIM.MATE]Chemical Sciences/Material chemistry, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], [CHIM.INOR]Chemical Sciences/Inorganic chemistry, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]

Relation: info:eu-repo/semantics/altIdentifier/arxiv/1911.06694; hal-02087664; https://hal.science/hal-02087664; https://hal.science/hal-02087664/document; https://hal.science/hal-02087664/file/Brien_Boulet_Actamat_HAL.pdf; ARXIV: 1911.06694

الاتاحة: https://hal.science/hal-02087664
https://hal.science/hal-02087664/document
https://hal.science/hal-02087664/file/Brien_Boulet_Actamat_HAL.pdf
https://doi.org/10.1016/j.actamat.2015.02.022

المؤلفون: Xiaoma Tao, Xiaoming Mo, Chaofan Liu, Haoning Wang, Hao Long, Yulu Zhou, Yifang Ouyang, Zhuxin Li

المصدر: Journal of Luminescence. 213:127-132

مصطلحات موضوعية: Materials science, business.industry, Doping, Biophysics, chemistry.chemical_element, 02 engineering and technology, General Chemistry, Erbium doping, Green-light, Electroluminescence, 010402 general chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Biochemistry, Atomic and Molecular Physics, and Optics, 0104 chemical sciences, Ion, Erbium, Zno nanocrystals, chemistry, Optoelectronics, 0210 nano-technology, business, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d23b462e6e0bc447ed9b5ee400b23ef3
https://doi.org/10.1016/j.jlumin.2019.05.021

المؤلفون: Zhao, Xingyan, Lin, Kaiman, Gao, Sai, Liu, Huayou, He, Jiajing, Wang, Xiaoming, Wen, Huimin, Dan, Yaping

مصطلحات موضوعية: erbium doping, defect, deep cooling, communication wavelength, silicon waveguide photodetectors, Materials Science and Engineering, Engineering

وصف الملف: application/pdf

Relation: Zhao, Xingyan; Lin, Kaiman; Gao, Sai; Liu, Huayou; He, Jiajing; Wang, Xiaoming; Wen, Huimin; Dan, Yaping (2021). "Efficient Er/O Doped Silicon Photodiodes at Communication Wavelengths by Deep Cooling." Advanced Materials Technologies 6(7): n/a-n/a.; https://hdl.handle.net/2027.42/168483; Advanced Materials Technologies; S. Scalese, G. Franzò, S. Mirabella, M. Re, A. Terrasi, F. Priolo, E. Rimini, C. Spinella, A. Carnera, J. Appl. Phys. 2000, 88, 4091.; S. Mauthe, Y. Baumgartner, M. Sousa, Q. Ding, M. D. Rossell, A. Schenk, L. Czornomaz, K. E. Moselund, Nat. Commun. 2020, 11, 4565.; T. Yin, R. Cohen, M. M. Morse, G. Sarid, Y. Chetrit, D. Rubin, M. J. Paniccia, Opt. Express 2007, 15, 13965.; L. Vivien, J. Osmond, J. M. Fedeli, D. Marris‐Morini, P. Crozat, J. F. Damlencourt, E. Cassan, Y. Lecunff, S. Laval, Opt. Express 2009, 17, 6252.; M. Casalino, G. Coppola, M. Iodice, I. Rendina, L. Sirleto, Sensors 2010, 10, 10571.; A. Rickman, Nat. Photonics 2014, 8, 579.; G. Masini, L. Colace, G. Assanto, Mater. Sci. Eng., B 2002, 89, 2.; L. Pavesi, J. Phys.: Condens. Matter 2003, 15, R1169.; R. R. Grote, B. Souhan, N. Ophir, J. B. Driscoll, K. Bergman, H. Bahkru, W. M. J. Green, R. M. Osgood, Optica 2014, 1, 264.; Y. Li, W. Zheng, F. Huang, PhotoniX 2020, 1, 15.; S. Hu, P. Han, S. Wang, X. Mao, X. Li, L. Gao, Semicond. Sci. Technol. 2012, 27, 102002.; J. E. Carey, C. H. Crouch, M. Shen, E. Mazur, Opt. Lett. 2005, 30, 1773.; T. G. Kim, J. M. Warrender, M. J. Aziz, Appl. Phys. Lett. 2006, 88, 241902.; B. P. Bob, A. Kohno, S. Charnvanichborikarn, J. M. Warrender, I. Umezu, M. Tabbal, J. S. Williams, M. J. Aziz, J. Appl. Phys. 2010, 107, 123506.; M. J. Smith, M.‐J. Sher, B. Franta, Y.‐T. Lin, E. Mazur, S. Gradečak, J. Appl. Phys. 2012, 112, 083518.; J. P. Mailoa, A. J. Akey, C. B. Simmons, D. Hutchinson, J. Mathews, J. T. Sullivan, D. Recht, M. T. Winkler, J. S. Williams, J. M. Warrender, P. D. Persans, M. J. Aziz, T. Buonassisi, Nat. Commun. 2014, 5,.; K. Mallik, R. J. Falster, P. R. Wilshaw, Semicond. Sci. Technol. 2003, 18, 517.; K. Graff, Metal Impurities in Silicon‐Device Fabrication, Vol. 24, Springer Science & Business Media, Berlin 2013.; X. Qiu, Z. Wang, X. Hou, X. Yu, D. Yang, Photonics Research 2019, 351, 7.; P. G. Kik, A. Polman, S. Libertino, S. Coffa, J. Lightwave Technol. 2002, 20, 862.; N. Hamelin, P. G. Kik, J. F. Suyver, K. Kikoin, A. Polman, A. Schönecker, F. W. Saris, J. Appl. Phys. 2000, 88, 5381.; A. J. Kenyon, S. S. Bhamber, C. W. Pitt, Mater. Sci. Eng., B 2003, 105, 230.; H. Wen, J. He, J. Hong, S. Jin, Z. Xu, H. Zhu, J. Liu, G. Sha, F. Yue, Y. Dan, Adv. Opt. Mater. 2020, 8, 2000720.; A. J. Kenyon, Semicond. Sci. Technol. 2005, 20, R65.; Y. Yin, K. Sun, W. J. Xu, G. Z. Ran, G. G. Qin, S. M. Wang, C. Q. Wang, J. Phys.: Condens. Matter. 2008, 21, 012204.; B. Zheng, J. Michel, F. Y. G. Ren, L. C. Kimerling, D. C. Jacobson, J. M. Poate, Appl. Phys. Lett. 1994, 64, 2842.; M. A. Lourenco, M. M. Milosevic, A. Gorin, R. M. Gwilliam, K. P. Homewood, Sci. Rep. 2016, 5, 37501.; F. Priolo, G. Franzò, S. Coffa, A. Carnera, Phys. Rev. B 1998, 57, 4443.; V. P. Kuznetsov, R. A. Rubtsova, V. N. Shabanov, A. P. Kasatkin, S. V. Sedova, G. A. Maksimov, Z. F. Krasil’nik, E. V. Demidov, Phys. Solid State 2005, 47, 102.; L. S. Grattan, B. T. Meggit, Optical Fiber Sensor Technology Chemical and Environmental Sensing Springe, Vol. 4, Springer, Berlin 1998, pp. 113 – 132.; R. E. Kunz, K. Cottier, Anal. Bioanal. Chem. 2006, 384, 180.; B. Wu, Y. Yu, J. Xiong, X. Zhang, Sci. Rep. 2018, 8, 8766.; D. Liu, H. Li, X. Wang, H. Liu, P. Ni, N. Liu, L. Feng, Opt. Express 2020, 28, 15718.; L. Chrostowski, M. Hochberg, Silicon Photonics Design: From Devices to Systems, Cambridge University Press, Cambridge 2015.; R. Soref, B. Bennett, IEEE J. Quantum Electron. 1987, 23, 123.; J. Hong, H. Wen, J. He, J. Liu, Y. Dan, J. W. Tomm, F. Yue, J. Chu, C. Duan, Photonics Research, 2021, unpublished, https://doi.org/10.1364/PRJ.417090.; M. T. Winkler, D. Recht, M.‐J. Sher, A. J. Said, E. Mazur, M. J. Aziz, Phys. Rev. Lett. 2011, 106, 178701.; C. L. Tan, H. Mohseni, Nanophotonics 2018, 7, 169.; A. Rogalski, Opto‐Electronics Review 2012, 20.; A. Rogalski, Infrared Phys. Technol. 2002, 43, 187.; X. Liu, B. Kuyken, G. Roelkens, R. Baets, R. M. Osgood, W. M. J. Green, Nat. Photonics 2012, 6, 667.; W. Zheng, L. Jia, F. Huang, iScience 2020, 23, 101145.; W. Zheng, R. Lin, J. Ran, Z. Zhang, X. Ji, F. Huang, ACS Nano 2018, 12, 425.; W. Zheng, F. Huang, R. Zheng, H. Wu, Adv. Mater. 2015, 27, 3921.; S. Liao, N. N. Feng, D. Feng, P. Dong, R. Shafiiha, C. C. Kung, H. Liang, W. Qian, Y. Liu, J. Fong, J. E. Cunningham, Y. Luo, M. Asghari, Opt. Express 2011, 19, 10967.; J. Wu, Q. Jiang, S. Chen, M. Tang, Y. I. Mazur, Y. Maidaniuk, M. Benamara, M. P. Semtsiv, W. T. Masselink, K. A. Sablon, G. J. Salamo, H. Liu, ACS Photonics 2016, 3, 749.

الاتاحة: https://hdl.handle.net/2027.42/168483
https://doi.org/10.1002/admt.202100137

المؤلفون: Cerqueira, M. F., Stepikhova, M., Kozanecki, A., Andrês, G., Alves, E.

مصطلحات موضوعية: Nanocrystalline silicon, Erbium doping, Erbium emission, Science & Technology

وصف الملف: application/pdf

Relation: http://www.ingentaconnect.com/content/asp/jnn/2010/00000010/00000004/art00060; http://hdl.handle.net/1822/13752

الاتاحة: http://hdl.handle.net/1822/13752
https://doi.org/10.1166/jnn.2010.1380

المؤلفون: Ciminelli, C., Frascella, P., Armenise, M. N.

المساهمون: Ciminelli, C., Frascella, P., Armenise, M. N.

مصطلحات موضوعية: Erbium doping, Laser, Silicon nanocrystal

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000264659300019; volume:3; numberofpages:6; journal:JOURNAL OF THE EUROPEAN OPTICAL SOCIETY. RAPID PUBLICATIONS; http://hdl.handle.net/11589/6433; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-68949180379; https://www.jeos.org/index.php/jeos_rp/article/view/08017/282

الاتاحة: http://hdl.handle.net/11589/6433
https://doi.org/10.2971/jeos.2008.08017
https://www.jeos.org/index.php/jeos_rp/article/view/08017/282

المؤلفون: Cerqueira, M. F., Losurdo, M., Monteiro, T., Stepikhova, M., Soares, M. J., Peres, M., Alves, E., Conde, O.

مصطلحات موضوعية: Nanocrystalline silicon, Erbium doping, Thin films, Optical properties, silicon, Raman scattering, sputtering, defects, microcrystallinity, nanocrystals, luminescence, Science & Technology

وصف الملف: application/pdf

Relation: info:eu-repo/grantAgreement/FCT/POCI/39395/PT; http://www.sciencedirect.com/science/article/pii/S0022309306002067; https://hdl.handle.net/1822/13956

الاتاحة: https://hdl.handle.net/1822/13956
https://doi.org/10.1016/j.jnoncrysol.2005.09.045

المؤلفون: Cerqueira, M. F., Stepikhova, M., Losurdo, M., Giangregorio, M. M., Kozanecki, A., Monteiro, T.

مصطلحات موضوعية: Silicon nanocrystals, Erbium doping, Photoluminescence, Ellipsometry, nc-Si, spectroscopic ellipsometry, optical properties, thin films, Science & Technology

وصف الملف: application/pdf

Relation: info:eu-repo/grantAgreement/FCT/POCI/39395/PT; https://hdl.handle.net/1822/13901

الاتاحة: https://hdl.handle.net/1822/13901
https://doi.org/10.1016/j.optmat.2005.09.035

المؤلفون: Karthikeyan Rajan, Navaneethan Mani, Prakash Natarajan, Tadanobu Koyama, Thangaraju Dheivasigamani, Yasuhiro Hayakawa, デイバシガマ二 タンガラジュ, ナタラジャン プラカシュ, マニ ナヴァニーザン, ラジャン カルティケヤン, 小山 忠信, 早川 泰弘

المصدر: JSAP Annual Meetings Extended Abstracts. 2015, :3026

المؤلفون: Losurdo, M., Cerqueira, M. F., Alves, E., Stepikhova, M., Giangregorio, M. M., Bruno, G.

مصطلحات موضوعية: nc-Si, Erbium doping, Spectroscopic ellipsometry, Optical properties, Films, Science & Technology

وصف الملف: application/pdf

Relation: http://www.sciencedirect.com/science/article/pii/S1386947702006173; http://hdl.handle.net/1822/13983

الاتاحة: http://hdl.handle.net/1822/13983
https://doi.org/10.1016/S1386-9477(02)00617-3

المؤلفون: J.M. Fernández-Navarro, Rolindes Balda, R. Morea, José Gonzalo, A. Miguel, José A. Fernández

المساهمون: CSIC-JA-USE - Centro Nacional de Aceleradores (CNA), Ministerio de Ciencia e Innovación (España)

المصدر: Digital.CSIC. Repositorio Institucional del CSIC
instname

مصطلحات موضوعية: Photoluminescence, Materials science, Dopant, Nanostructured thin films, Organic Chemistry, Doping, Analytical chemistry, Pulsed laser deposition, Erbium doping, Lead niobium germanate glass, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Ion, Inorganic Chemistry, Concentration quenching, Electrical and Electronic Engineering, Physical and Theoretical Chemistry, Thin film, Erbium-doping, Spectroscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::61b3524c11c10db29813c299c46e908a
https://doi.org/10.1016/j.optmat.2014.10.049

المؤلفون: Department of Materials Science and Engineering, University of Florida, Rhines Hall, Gainesville, FL 32606, USA ( host institution ), Overberg, Mark ( author ), Abernathy, Cammy R. ( author ), MacKenzie, J.Devin ( author ), Pearton, Stephen J. ( author ), Wilson, Robert G. ( author ), Zavada, John M. ( author )

مصطلحات موضوعية: GaN, Erbium doping, Carbon doping, Annealing

وصف الملف: Pages 121-126

Relation: Materials Science & Engineering B; S0921-5107(00)00686-3; MSB; 3931; http://ufdc.ufl.edu/LS00523006/00001

الاتاحة: https://doi.org/10.1016/S0921-5107(00)00686-3
http://ufdc.ufl.edu/LS00523006/00001

المؤلفون: Hampton University, Department of Physics, Research Center for Optical Physics, Hampton, VA 23668, USA ( host institution ), Hömmerich, U ( author ), Seo, J.T ( author ), Thaik, Myo ( author ), Abernathy, C.R ( author ), MacKenzie, J.D ( author ), Zavada, J.M ( author )

مصطلحات موضوعية: Photoluminescence, Erbium doping, Gallium nitride

وصف الملف: Pages 331-335

Relation: Journal of Alloys and Compounds; S0925-8388(00)00602-2; JALCOM; 5631; http://ufdc.ufl.edu/LS00523283/00001

الاتاحة: https://doi.org/10.1016/S0925-8388(00)00602-2
http://ufdc.ufl.edu/LS00523283/00001

المؤلفون: Pascal Boulet, Valerie Brien

المساهمون: Institut Jean Lamour (IJL), Institut de Chimie du CNRS (INC)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS), Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)

المصدر: Acta Materialia
Acta Materialia, Elsevier, 2015, 90, pp.37-45. ⟨10.1016/j.actamat.2015.02.022⟩

مصطلحات موضوعية: Diffraction, Materials science, Polymers and Plastics, XRD, Analytical chemistry, chemistry.chemical_element, FOS: Physical sciences, [CHIM.INOR]Chemical Sciences/Inorganic chemistry, Erbium, chemistry.chemical_compound, insertion site, Scanning transmission electron microscopy, substitution, R.F. sputtering, Thin film, Photoluminescence, AlN, Wurtzite crystal structure, Condensed Matter - Materials Science, RF sputtering, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Aluminium nitride, Metals and Alloys, Materials Science (cond-mat.mtrl-sci), [CHIM.MATE]Chemical Sciences/Material chemistry, Sputter deposition, Electronic, Optical and Magnetic Materials, Erbium doping, chemistry, Transmission electron microscopy, Ceramics and Composites, TEM, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::92912c24bdc488111a57d29dc52fc300