المؤلفون: Kai Goebel, Gautam Biswas, Jose R. Celaya, Chetan S. Kulkarni

المصدر: International Journal of Prognostics and Health Management, Vol 4, Iss 1, Pp 21-38 (2013)

مصطلحات موضوعية: electronics PHM, Capacitors, Physics-based degradation models, Capacitance, Accelerated aging, Thermal Overstress, Engineering machinery, tools, and implements, TA213-215, Systems engineering, TA168

وصف الملف: electronic resource

Relation: http://www.phmsociety.org/sites/phmsociety.org/files/phm_submission/2012/ijphm_13_005.pdf; https://doaj.org/toc/2153-2648

URL الوصول: https://doaj.org/article/ae35713ed1ed4c04b2b86c4f86742e26