المؤلفون: Panarella, L., Smets, Q., Verreck, D., Kaczer, B., Tyaginov, S., de la Rosa, C. Lockhart, Kar, G. S., Afanas’ev, V.

المصدر: Journal of Computational Electronics; Feb2025, Vol. 24 Issue 1, p1-6, 6p

المؤلفون: Panarella, L., Kaczer, B., Smets, Q., Verreck, D., Schram, T., Cott, D., Lin, D., Tyaginov, S., Asselberghs, I., de la Rosa, C. Lockhart, Kar, G. S., Afanas'ev, V.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps48203.2023.10117803
http://xplorestaging.ieee.org/ielx7/10117589/10117581/10117803.pdf?arnumber=10117803