المؤلفون: Han Zhou, Yuan Liu, Huijun Yang, Heng Zhang, Keke Chang, Yong Shang, Yanling Pei, Shusuo Li, Shengkai Gong

المصدر: Journal of Materials Research and Technology, Vol 33, Iss , Pp 3696-3702 (2024)

مصطلحات موضوعية: Thermal barrier coatings, Terahertz time-domain spectroscopy, Characteristic frequency, Thermal cycling test, Mining engineering. Metallurgy, TN1-997

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2238785424022841; https://doaj.org/toc/2238-7854

URL الوصول: https://doaj.org/article/b78776a09f68416a9c4eb29b9295143c

المؤلفون: Xu Gao, Qiang Jia, Yishu Wang, Hongqiang Zhang, Limin Ma, Guisheng Zou, Fu Guo

المصدر: Electronic Materials, Vol 5, Iss 2, Pp 80-100 (2024)

مصطلحات موضوعية: silicon carbide, power device, packaging, reliability, power cycling test, Instruments and machines, QA71-90

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2673-3978/5/2/7; https://doaj.org/toc/2673-3978

URL الوصول: https://doaj.org/article/45474cb02c29485a9927a956abf7527e

المؤلفون: Apalowo, Rilwan Kayode, Abas, Mohamad Aizat, Che Ani, Fakhrozi, Mukhtar, Muhamed Abdul Fatah Muhamed, Ramli, Mohamad Riduwan

المصدر: Soldering & Surface Mount Technology, 2024, Vol. 36, Issue 3, pp. 154-164.

URL الوصول: http://www.emeraldinsight.com/doi/10.1108/SSMT-12-2023-0075

المؤلفون: Huang, Tianqi, Singh, Bhanu Pratap, Liu, Yongqian, Norrga, Staffan, 1968

المصدر: Energies. 17(11)

مصطلحات موضوعية: forward power cycling test, on-state resistance, discrete SiC MOSFET, threshold voltage, thermal impedance measurement

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-348603
https://doi.org/10.3390/en17112557

المؤلفون: Apalowo, Rilwan Kayode, Abas, Mohamad Aizat, Muhamed Mukhtar, Muhamed Abdul Fatah, Che Ani, Fakhrozi, Ramli, Mohamad Riduwan

المصدر: Soldering & Surface Mount Technology, 2024, Vol. 36, Issue 2, pp. 101-110.

URL الوصول: http://www.emeraldinsight.com/doi/10.1108/SSMT-08-2023-0049

المؤلفون: Sihoon Choi, Jiyoon Choi, Thiyu Warnakulasooriya, Jong-Won Shin, Jun Imaoka, Masayoshi Yamamoto

المصدر: IEEE Access, Vol 12, Pp 90929-90939 (2024)

مصطلحات موضوعية: Power module design, common-mode noise, parasitic capacitance, thermal resistance, thermal cycling test, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10577232/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/b9772a6ac75f4d3ba80aec1e63b79541

المؤلفون: Rahmayanti, Mayu¹, Maulidina, Annisa Tri, Putra, M. Bayu Firdaus Buana

المصدر: Research Journal of Pharmacy and Technology 16(11):5245-5249. 2023

المؤلفون: Gabriel Martínez-Fortún, Alejandro Yánez, Alberto Cuadrado

المصدر: Bioengineering, Vol 11, Iss 10, p 1024 (2024)

مصطلحات موضوعية: veterinary medicine, polyaxial screws, angulation, locking plates, cycling test, Technology, Biology (General), QH301-705.5

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2306-5354/11/10/1024; https://doaj.org/toc/2306-5354

URL الوصول: https://doaj.org/article/7c6e023b75b945948a8137c8d456ab46

المؤلفون: Chien-Yie Tsay, Ching-Yu Chung, Chi-Jung Chang, Yu-Cheng Chang, Chin-Yi Chen, Shu-Yii Wu

المصدر: Molecules, Vol 29, Iss 11, p 2631 (2024)

مصطلحات موضوعية: Fe-doped g-C3N4, Bi2MoO6, heterostructured composite, visible light photocatalyst, organic pollutant, cycling test, Organic chemistry, QD241-441

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1420-3049/29/11/2631; https://doaj.org/toc/1420-3049

URL الوصول: https://doaj.org/article/0a00527428ba4af0a891ea2b43c6ad7b

المؤلفون: Yu-Wen Hung, Mai-Phuong La, Yi-Quan Lin, Chih Chen

المصدر: Materials ; Volume 17 ; Issue 22 ; Pages: 5458

مصطلحات موضوعية: nanotwinned copper, redistribution lines, passivation layer, reliability, temperature cycling test

وصف الملف: application/pdf

Relation: https://dx.doi.org/10.3390/ma17225458

الاتاحة: https://doi.org/10.3390/ma17225458

المؤلفون: Zhou, Mengfan, Li, Na, Wang, Deyong, Araya, Samuel Simon, Liso, Vincenzo

المصدر: Zhou , M , Li , N , Wang , D , Araya , S S & Liso , V 2024 , ' Comparative analysis of degradation mechanisms in HT-PEM fuel cells under start–stop and load cycling with hydrogen and nitrogen-diluted feeds ' , International Journal of Hydrogen Energy , vol. 65 , pp. 639-647 . https://doi.org/10.1016/j.ijhydene.2024.04.028

مصطلحات موضوعية: Degradation, HT-PEM fuel cell, Load cycling test, Nitrogen dilution, Start–stop test

الاتاحة: https://vbn.aau.dk/da/publications/ce64ee49-aa53-4932-b081-535d7899795d
https://doi.org/10.1016/j.ijhydene.2024.04.028
http://www.scopus.com/inward/record.url?scp=85189744810&partnerID=8YFLogxK

المؤلفون: Liu, Shenyi, Vuorinen, Vesa, Liu, Xing, Fredrikson, Olli, Brand, Sebastian, Tiwary, Nikhilendu, Lutz, Josef, Paulasto-Krockel, Mervi

المساهمون: Department of Electrical Engineering and Automation, Electronics Integration and Reliability, Chemnitz University of Technology, ABB Group, Fraunhofer Institute for Microstructure of Materials and Systems, Aalto-yliopisto, Aalto University

مصطلحات موضوعية: Heating systems, Inspection, Insulated gate bipolar transistors, Insulated-gate bipolar transistor (IGBT), Silicon, Sn-Ag-Cu (SAC) solder, Stress, Temperature measurement, X-ray imaging, die-attach, fast power cycling test (PCT), fatigue crack network (FCN)

وصف الملف: application/pdf

Relation: IEEE Transactions on Power Electronics; Volume 39, issue 12, pp. 16695-16707; PURE LINK: http://www.scopus.com/inward/record.url?scp=85201788523&partnerID=8YFLogxK; https://aaltodoc.aalto.fi/handle/123456789/131475

الاتاحة: https://aaltodoc.aalto.fi/handle/123456789/131475
https://doi.org/10.1109/TPEL.2024.3447909

المؤلفون: Primi Annissya, Widia, Nurdianti, Lusi, Aziz, Abdul, Rian Julianti, Ai

المصدر: Pharmacoscript; Vol. 7 No. 2 (2024): Pharmacoscript; 219-231 ; 2685-1121 ; 2622-4941 ; 10.36423/pharmacoscript.v7i2

مصطلحات موضوعية: Fluconazole, Anti Jamur, Cycling Test

وصف الملف: application/pdf

Relation: https://www.e-journal.unper.ac.id/index.php/PHARMACOSCRIPT/article/view/1751/1057; https://www.e-journal.unper.ac.id/index.php/PHARMACOSCRIPT/article/view/1751

الاتاحة: https://www.e-journal.unper.ac.id/index.php/PHARMACOSCRIPT/article/view/1751
https://doi.org/10.36423/pharmacoscript.v7i2.1751

المؤلفون: Agyakwa, Pearl A., Robertson, Stuart, Dai, Jingru, Mouawad, Bassem, Zhou, Zhaoxia, Liu, Changqing, Johnson, C. Mark

مصطلحات موضوعية: Sintered nano-silver · SiC die-attach · 3D x-ray tomography · 3D FIB/EBSD · correlative microscopy · die attachment · thermomechanical fatigue · reliability · power electronics · power cycling test

Relation: https://nottingham-repository.worktribe.com/output/29273119; Journal of Electronic Materials; Volume 53; Pagination 1374–1398; https://nottingham-repository.worktribe.com/file/29273119/1/S11664-023-10870-4

الاتاحة: https://doi.org/10.1007/s11664-023-10870-4
https://nottingham-repository.worktribe.com/file/29273119/1/S11664-023-10870-4
https://nottingham-repository.worktribe.com/output/29273119

المؤلفون: Prihantini, Malinda

المصدر: Jurnal Mandala Pharmacon Indonesia; Vol. 10 No. 1 (2024): Jurnal Mandala Pharmacon Indonesia; 158-168 ; 2598-9979 ; 2442-6032 ; 10.35311/jmpi.v10i1

مصطلحات موضوعية: Antihyperpigmentation, Berenuk Leaves, Cremophor RH40, Cycling test

وصف الملف: application/pdf

Relation: http://jurnal-pharmaconmw.com/jmpi/index.php/jmpi/article/view/492/197; http://jurnal-pharmaconmw.com/jmpi/index.php/jmpi/article/view/492

الاتاحة: http://jurnal-pharmaconmw.com/jmpi/index.php/jmpi/article/view/492

المؤلفون: Dinh-Phuc Tran, Yu-Ting Liu, Chih Chen

المصدر: Materials, Vol 17, Iss 9, p 2004 (2024)

مصطلحات موضوعية: thermal interface materials, intermetallic compounds, thermal cycling test, high-temperature storage, shear strength, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85

Relation: https://www.mdpi.com/1996-1944/17/9/2004; https://doaj.org/toc/1996-1944; https://doaj.org/article/82967420e00949c6b7f4fa915a9205a5

الاتاحة: https://doi.org/10.3390/ma17092004
https://doaj.org/article/82967420e00949c6b7f4fa915a9205a5

المؤلفون: Zhang, Yichi, Zhang, Yi, Wang, Huai

المصدر: Zhang , Y , Zhang , Y & Wang , H 2024 , ' gEOL : A Gradient-based End-of-Life Criterion for Power Semiconductor Modules ' , IEEE Transactions on Power Electronics , vol. 39 , no. 3 , pp. 2927-2931 . https://doi.org/10.1109/TPEL.2023.3339342

مصطلحات موضوعية: Aging, Degradation, Junctions, Standards, Temperature measurement, Voltage measurement, Wires, end-of-life criterion, power cycling test, power semiconductor modules, reliability, /dk/atira/pure/sustainabledevelopmentgoals/affordable_and_clean_energy, name=SDG 7 - Affordable and Clean Energy, /dk/atira/pure/sustainabledevelopmentgoals/industry_innovation_and_infrastructure, name=SDG 9 - Industry, Innovation, and Infrastructure

وصف الملف: application/pdf

الاتاحة: https://vbn.aau.dk/da/publications/6c2e4acc-43e6-4c97-a4ee-98e5e8f282fa
https://doi.org/10.1109/TPEL.2023.3339342
https://vbn.aau.dk/ws/files/734225598/gEOL_A_Gradient-based_End-of-Life_Criterion_for_Power_Semiconductor_Modules.pdf
http://www.scopus.com/inward/record.url?scp=85179780688&partnerID=8YFLogxK

المؤلفون: Zhang, Yichi, Zhang, Yi, Yao, Bo, Wang, Huai

المصدر: Zhang , Y , Zhang , Y , Yao , B & Wang , H 2024 , Impact of Bond Wire Degradation on Thermal Estimation and Temperature Coefficient of IGBT Modules in Power Cycling Test . in 2024 IEEE Applied Power Electronics Conference and Exposition, APEC 2024 . IEEE (Institute of Electrical and Electronics Engineers) , Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC , pp. 2443-2447 , 39th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2024 , Long Beach , United States , 25/02/2024 . https://doi.org/10.1109/APEC48139.2024.10509199

مصطلحات موضوعية: bond wire, degradation characterization, IGBT, on-state voltage, power cycling test, temperature decoupling, /dk/atira/pure/sustainabledevelopmentgoals/affordable_and_clean_energy, name=SDG 7 - Affordable and Clean Energy

وصف الملف: application/pdf

الاتاحة: https://vbn.aau.dk/da/publications/d3e2ae29-9764-4cbb-a55f-7368bda69e13
https://doi.org/10.1109/APEC48139.2024.10509199
https://vbn.aau.dk/ws/files/734225034/Impact_of_Bond_Wire_Degradation_on_Thermal_Estimation_and_Temperature_Coefficient_of_IGBT_Modules_in_Power_Cycling_Tes.pdf
http://www.scopus.com/inward/record.url?scp=85192774763&partnerID=8YFLogxK

المؤلفون: Purwanti, Tutiek¹, Rosita, Noorma, Nurjannah, Febri Fitri

المصدر: Research Journal of Pharmacy and Technology 15(12):5919-5926. 2022

المؤلفون: Yijun Shi, Shan Wu, Zhiyuan He, Zongqi Cai, Liye Cheng, Yunliang Rao, Qingzhong Xiao, Yiqiang Chen, Guoguang Lu

المصدر: IEEE Journal of the Electron Devices Society, Vol 11, Pp 426-431 (2023)

مصطلحات موضوعية: GaN HEMTs, power cycling test, package degradation, chip-level degradation, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10188904/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/62263d63d3614aa89dbce2ee308612e3