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1Academic Journal
المؤلفون: Osung Kwon, Jihoon Lee, Hyungju Son, Jaehyoung Park
المصدر: Polymers, Vol 16, Iss 5, p 604 (2024)
مصطلحات موضوعية: ionic channel network, proton conductivity, proton exchange membrane, proton exchange membrane fuel cell, current sensing atomic force microscopy, atomic force microscopy, Organic chemistry, QD241-441
Relation: https://www.mdpi.com/2073-4360/16/5/604; https://doaj.org/toc/2073-4360; https://doaj.org/article/0272c3002908423690b955d08b918f4c
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2Academic Journal
المؤلفون: Jungeun Song, Malkeshkumar Patel, Sara Evelyn Johannesson, Kayoung Cho, JaeHong Park, Joondong Kim, Dong‐Wook Kim
المصدر: Advanced Electronic Materials, Vol 9, Iss 10, Pp n/a-n/a (2023)
مصطلحات موضوعية: current‐sensing atomic force microscopy, kelvin probe force microscopy, NiO/ZnO heterojunctions, plasmonic Ag nanowires, transparent photovoltaics, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2199-160X
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3Academic Journal
المؤلفون: Moral, Alberto del, Gonzalez Rosillo, Juan Carlos, Gómez Rodríguez, Andrés, Puig Molina, Teresa, Obradors, Xavier
المساهمون: Ministerio de Economía y Competitividad (España)
مصطلحات موضوعية: Cooling, Atomic force, Microscopy, Peltier, Sample cooling, Scanning probe microscopy, Current sensing atomic force microscopy, Instrumentation
Relation: #PLACEHOLDER_PARENT_METADATA_VALUE#; info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/SEV-2015-0496; Preprint; http://dx.doi.org/10.1016/j.ultramic.2018.10.014; Sí; Ultramicroscopy 196: 186-191 (2019); http://hdl.handle.net/10261/205730; http://dx.doi.org/10.13039/501100003329
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4Report
المؤلفون: Ма, Бин -
المساهمون: Шеремет, Евгения Сергеевна
مصطلحات موضوعية: двумерные материалы, спектроскопия комбинационного рассеяния, восстановленный оксид графен, гибкие схемы, атомно-силовая микроскопия тока растекания, лазерная обработка, степень восстановления восстановленного оксида графена, two-dimensional materials, Raman spectroscopy, reduced graphene oxide, flexible circuits, current sensing atomic force microscopy, laser processing, degree of reduction o graphene oxide, 12.04.02, 535.3:620.22-419.7
وصف الملف: application/pdf
Relation: Ма Б. Взаимодействие между светом и веществом в двумерных материалах : магистерская диссертация / Б. Ма; Национальный исследовательский Томский политехнический университет (ТПУ), Инженерная школа новых производственных технологий (ИШНПТ), Отделение материаловедения (ОМ); науч. рук. Е. С. Шеремет. — Томск, 2019.; http://earchive.tpu.ru/handle/11683/54164
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5Academic Journal
المؤلفون: Javier Barón-Miranda, Octavio Calzadilla, Liliana Arvizu-Rodríguez, Jose Fernández-Muñoz, Cesia Guarneros-Aguilar, Fabio Chale-Lara, Ulises Páramo-García, Felipe Caballero-Briones
المصدر: Coatings; Volume 6; Issue 4; Pages: 71
مصطلحات موضوعية: CuInSe 2 electrodeposition, alkaline doping, current sensing atomic force microscopy
وصف الملف: application/pdf
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6Academic Journal
المؤلفون: Jiwei MA, Junji INUKAI, Kenji MIYATAKE, Masahiro WATANABE, Masanori HARA, Masaya HARA, Nicolas ALONSO-VANTE, Takahiro MIYAHARA, Takayuki HOSHI
المصدر: Electrochemistry. 2014, 82(5):369
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7
المؤلفون: Teresa Puig, Alfredo Palop Gómez, Xavier Obradors, Juan Carlos Gonzalez-Rosillo, A. del Moral
المساهمون: Ministerio de Economía y Competitividad (España)
المصدر: Digital.CSIC. Repositorio Institucional del CSIC
instnameمصطلحات موضوعية: Microscopy, Materials science, Thermoelectric cooling, Cantilever, Physics - Instrumentation and Detectors, Computer cooling, business.industry, Atomic force, FOS: Physical sciences, Instrumentation and Detectors (physics.ins-det), Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Scanning probe microscopy, Deflection (engineering), Thermoelectric effect, Peltier, Current sensing atomic force microscopy, Optoelectronics, Curie temperature, Sample cooling, Thin film, business, Cooling, Instrumentation
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8
المؤلفون: Ulises Páramo-García, F. Chale-Lara, Felipe Caballero-Briones, O. Calzadilla, Liliana E. Arvizu-Rodríguez, Javier A. Barón-Miranda, Cesia Guarneros-Aguilar, J. L. Fernández-Muñoz
المصدر: Coatings, Vol 6, Iss 4, p 71 (2016)
مصطلحات موضوعية: 010302 applied physics, Photocurrent, CuInSe2 electrodeposition, Materials science, Dopant, Scanning electron microscope, Doping, Analytical chemistry, 02 engineering and technology, Surfaces and Interfaces, Conductivity, 021001 nanoscience & nanotechnology, 01 natural sciences, Surfaces, Coatings and Films, Ion, Crystallinity, surfaces,_coatings_films, alkaline doping, current sensing atomic force microscopy, lcsh:TA1-2040, 0103 physical sciences, Materials Chemistry, 0210 nano-technology, Spectroscopy, lcsh:Engineering (General). Civil engineering (General)
وصف الملف: application/pdf
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9
المؤلفون: Masaya Hara, Masahiro Watanabe, Masanori Hara, Takayuki Hoshi, Takahiro Miyahara, Nicolas Alonso-Vante, Jiwei Ma, Kenji Miyatake, Junji Inukai
المساهمون: Yamanashi University, Kaneka Corp, Institut de Chimie des Milieux et Matériaux de Poitiers (IC2MP), Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)-Université de Poitiers-Institut de Chimie du CNRS (INC)
المصدر: Bioelectrochemistry
Bioelectrochemistry, Elsevier, 2014, 82 (5), pp.369-375. ⟨10.5796/electrochemistry.82.369⟩مصطلحات موضوعية: Materials science, Proton, Arylene, Analytical chemistry, Proton exchange membrane fuel cell, Current-sensing Atomic Force Microscopy, Biasing, Electrolyte, [CHIM.CATA]Chemical Sciences/Catalysis, Sulfonated Poly(Arylene Ketone), Proton Conductive Path, Membrane, Proton Exchange Membrane, Electrochemistry, Ionic conductivity, Relative humidity
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10Conference
المؤلفون: Gosvami, N., Lau, K.H.A., Sinha, S.K., O'Shea, S.J.
المساهمون: MECHANICAL ENGINEERING
المصدر: Scopus
مصطلحات موضوعية: Current sensing atomic force microscopy, Metal-molecule-metal junctions, Self-assembled monolayer
Relation: Gosvami, N., Lau, K.H.A., Sinha, S.K., O'Shea, S.J. (2006-03-31). Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM. Applied Surface Science 252 (11) : 3956-3960. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2005.09.050; http://scholarbank.nus.edu.sg/handle/10635/85937; 000236835200009
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11Academic Journal
المؤلفون: Mohos, M., Pobelov, I. V., Kolivoška, V. (Viliam), Mészáros, G., Broekmann, P., Wandlowski, T.
مصطلحات موضوعية: current sensing atomic force microscopy, adhesion, metal nanocontacts
Relation: urn:pissn: 1948-7185; http://hdl.handle.net/11104/0237399
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12Academic Journal
المؤلفون: Berny, Stéphane, Tortech, Ludovic, Véber, Michelle, Fichou, Denis
المساهمون: Laboratoire de Physique des Solides (LPS), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)
المصدر: ISSN: 1944-8252 ; ACS Applied Materials and Interfaces ; https://hal.science/hal-04883367 ; ACS Applied Materials and Interfaces, 2010, 2 (11), pp.3059-3068. ⟨10.1021/am1005546⟩.
مصطلحات موضوعية: Atomic force microscopy, Carrier transport, Conversion efficiency, Esters, Fatty acids, Heterojunctions, Photovoltaic cells, Photovoltaic effects, Solar power generation, Switching circuits, Tin, Tin oxides, current-sensing atomic force microscopy, Interfacial layer, Organic solar cell, Photovoltaic devices, Space-charge-limited current, Solar cells, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]
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13Academic Journal
المؤلفون: Min, Geun Gi, Choi, Shin-Jung, Kim, Seung Bin, Park, Su-Moon
مصطلحات موضوعية: AFM, Anodic potentials, Atomic force, Bithiophenes, Comparative studies, Conductive Polymer, Conjugation length, Current sensing, Current sensing atomic force microscopy, Electrical conductivity, Electrochemical polymerization, Electrochemical quartz crystal microbalance, Experimental techniques, Gold electrodes, Ion pairs, Poly-thiophene, Polythiophene films, Polythiophenes, Potentiodynamics, Propylene carbonate, Terthiophenes, UV-vis absorption spectroscopy, UV-vis absorptions
Relation: SYNTHETIC METALS, v.159, no.19-20, pp.2108 - 2116; https://scholarworks.unist.ac.kr/handle/201301/3681; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=70349547099; 1115; 15; 2-s2.0-70349547099; 000271159100033
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14
المؤلفون: Allard J. Katan, Virginia Altoe, Junfeng Ren, Jean M. J. Fréchet, Yabing Qi, Bas Hendriksen, Shaul Aloni, Nenad Vukmirović, O Clayton Mauldin, Herbert Wormeester, Lin-Wang Wang, Miquel Salmeron, Florent Martin
المساهمون: Physics of Interfaces and Nanomaterials, Faculty of Science and Technology
المصدر: Nano Letters, 11, 4107-4112
Nano Letters
Nano Letters, 11, 10, pp. 4107-4112
Nano letters, 11(10), 4107-4112. American Chemical Societyمصطلحات موضوعية: Molecular electronics, Analytical chemistry, lateral transport, Bioengineering, 02 engineering and technology, Conductivity, 010402 general chemistry, 01 natural sciences, Condensed Matter::Materials Science, current sensing atomic force microscopy, Langmuir−Blodgett monolayer, Monolayer, Molecular film, General Materials Science, Molecular orbital, Anisotropy, Spectroscopy, Chemistry, Mechanical Engineering, Scanning Probe Microscopy, General Chemistry, Conductive atomic force microscopy, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Oligothiophene, conduction anisotropy, 0104 chemical sciences, Chemical physics, 0210 nano-technology
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15Academic Journal
المؤلفون: Fumagalli, Laura, Casuso, Ignacio, Ferrari, Giorgio, Gomila, Gabriel
المصدر: Fumagalli , L , Casuso , I , Ferrari , G & Gomila , G 2008 , ' Probing electrical transport properties at the nanoscale by Current-Sensing atomic force microscopy ' , NanoScience and Technology , pp. 421-450 .
مصطلحات موضوعية: Conductance, Conductive-AFM, Current-sensing atomic force microscopy, Current-to-voltage amplifier, Electrical transport, Impedance, Nanoscale capacitance microscopy, Nanoscale impedance microscopy, Noise
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16Electronic Resource
المؤلفون: Ministerio de Economía y Competitividad (España), Moral, Alberto del, Gonzalez Rosillo, Juan Carlos, Gómez Rodríguez, Andrés, Puig Molina, Teresa, Obradors, Xavier
مصطلحات الفهرس: Cooling, Atomic force, Microscopy, Peltier, Sample cooling, Scanning probe microscopy, Current sensing atomic force microscopy, Instrumentation, artículo
URL:
http://hdl.handle.net/10261/205730
Preprinthttp://dx.doi.org/10.1016/j.ultramic.2018.10.014
Sí
info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/SEV-2015-0496