المؤلفون: Kyeongrae Cho, Jeong-Sik Lee, Chanyang Park, Hyeok Yun, Hyundong Jang, Seungjoon Eom, Min Sang Park, Hyun-Chul Choi, Rock-Hyun Baek

المصدر: Advanced Intelligent Systems, Vol 5, Iss 12, Pp n/a-n/a (2023)

مصطلحات موضوعية: cross-temperature, graph neural networks, machine learning, neural networks, 3D NAND flash, Computer engineering. Computer hardware, TK7885-7895, Control engineering systems. Automatic machinery (General), TJ212-225

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2640-4567

URL الوصول: https://doaj.org/article/a94ec992d5914f90a1f025fa622e6dd5

المؤلفون: Ukju An, Gilsang Yoon, Donghyun Go, Jounghun Park, Donghwi Kim, Jongwoo Kim, Jeong-Soo Lee

المصدر: Micromachines, Vol 14, Iss 12, p 2199 (2023)

مصطلحات موضوعية: 3-D NAND flash memory, cross-temperature, threshold voltage variation, decomposition, poly-Si channel, grain boundary, Mechanical engineering and machinery, TJ1-1570

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2072-666X/14/12/2199; https://doaj.org/toc/2072-666X

URL الوصول: https://doaj.org/article/916f84299e074bf8b253c9c6b0aea724

المؤلفون: Zambelli C., Ferro E., Crippa L., Micheloni R., Olivo P.

المساهمون: Zambelli, C., Ferro, E., Crippa, L., Micheloni, R., Olivo, P.

مصطلحات موضوعية: 3D-TLC NAND Flash, Algorithm, Cross-Temperature, Reliability

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781728122038; info:eu-repo/semantics/altIdentifier/wos/WOS:000542664700002; ispartofbook:2019 IEEE International Integrated Reliability Workshop (IIRW); 2019 IEEE International Integrated Reliability Workshop, IIRW 2019; volume:2019; firstpage:8989886-1; lastpage:8989886-4; numberofpages:4; https://hdl.handle.net/11392/2427378; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85080102402; https://ieeexplore.ieee.org/document/8989886

الاتاحة: https://hdl.handle.net/11392/2427378
https://doi.org/10.1109/IIRW47491.2019.8989886
https://ieeexplore.ieee.org/document/8989886

المؤلفون: Cristian Zambelli, Luca Crippa, Rino Micheloni, Enrico Ferro, Piero Olivo

مصطلحات موضوعية: 010302 applied physics, Dependency (UML), Computer science, business.industry, 3D-TLC NAND Flash, 020208 electrical & electronic engineering, Electrical engineering, NAND gate, 02 engineering and technology, Tracking (particle physics), Solid-state drive, Reliability, 01 natural sciences, Threshold voltage, NO, Algorithm, Flash (photography), Reliability (semiconductor), Cross-Temperature, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, PE7_2, PE7_5, business, 3D-TLC NAND Flash, Algorithm, Cross-Temperature, Reliability

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8d1eb5c526526117fc2566ec98fdb90b
https://hdl.handle.net/11392/2427378

المؤلفون: Yoosoon Chang, Chang Sik Kim, J. Isaac Miller, Joon Y. Park, Sungkeun Park

مصطلحات موضوعية: jel:C53, jel:C51, jel:Q41, jel:C33, electricity demand, temperature effect, temperature response function, cross temperature response function, electricity demand in Korea

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od_______645::ca8f10914dd143726e369529e8eedb1a
https://economics.missouri.edu/working-papers/2015/wp1512_miller.pdf