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1Academic Journal
المؤلفون: Busch, M., Kityk, A.V., Piecek, W., Hofmann, T., Wallacher, D., Calus, S., Kula, P., Steinhart, M., Eich, M., Huber, P.
مصطلحات موضوعية: x ray diffraction, c asterisk phase, polarization sign reversal, collective dynamic modes, tilt angle, dielectric spectroscopy, temperature dependence, chiral structures, aluminum oxide, soft mode
وصف الملف: application/pdf
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2
المؤلفون: Andriy V. Kityk, Tommy Hofmann, Dirk Wallacher, Wiktor Piecek, Przemysław Kula, Martin Steinhart, Patrick Huber, Manfred Eich, Mark Busch, Sylwia Całus
المصدر: Nanoscale 9, (2017) 48 : pp. 19086-19099
مصطلحات موضوعية: Materials science, Physics - Mesoscopic Systems and Quantum Hall Effect, Neutron diffraction, FOS: Physical sciences, 02 engineering and technology, Condensed Matter - Soft Condensed Matter, 01 natural sciences, Thermotropic crystal, Physics - Materials Science, Liquid crystal, Physics - Chemical Physics, 0103 physical sciences, Mesoscale and Nanoscale Physics (cond-mat.mes-hall), ddc:530, General Materials Science, Texture (crystalline), Phason, Physik [530], 010306 general physics, Chemical Physics (physics.chem-ph), Condensed Matter - Materials Science, Birefringence, Condensed Matter - Mesoscale and Nanoscale Physics, Condensed matter physics, Materials Science (cond-mat.mtrl-sci), 021001 nanoscience & nanotechnology, x ray diffraction, c asterisk phase, polarization sign reversal, collective dynamic modes, tilt angle, dielectric spectroscopy, temperature dependence, chiral structures, aluminum oxide, soft mode, Ferroelectricity, Condensed Matter::Soft Condensed Matter, Physics - Soft Condensed Matter, Soft Condensed Matter (cond-mat.soft), 0210 nano-technology, Order of magnitude, Physics - Optics, Optics (physics.optics)
وصف الملف: application/pdf
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3Academic Journal
المؤلفون: Rozanski, Stanislaw A, Thoen, Jan
مصطلحات موضوعية: antiferroelectric liquid crystal, dielectric relaxation, cylindrical confinement, collective dynamic-modes, polarization sign reversal, temperature-dependence, phase-transition, spectroscopy, frequency, membranes, geometry, behavior, anopore, antferroelectric liquid crystal
Relation: Liquid crystals vol:35 issue:2 pages:195-204; https://lirias.kuleuven.be/handle/123456789/211322
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4Academic Journal
المؤلفون: Rozanski, Stanislaw A, Thoen, Jan
مصطلحات موضوعية: ferroelectric liquid-crystal, polarization sign reversal, collective dynamic-modes, cylindrical cavities, angle
Relation: Liquid crystals vol:33 issue:9 pages:1043-1049; https://lirias.kuleuven.be/handle/123456789/51542; http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=CCC&SrcApp=PRODUCT_NAME&SrcURL=WOS_RETURN_URL&CKEY=ROZA1043060033LS&DestLinkType=FullRecord&DestApp=CCC&SrcDesc=RETURN_ALT_TEXT&SrcAppSID=APP_SID
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5Academic Journal
المؤلفون: Rozanski, Stanislaw A, Thoen, Jan
مصطلحات موضوعية: ferroelectric liquid crystal, aerosil, dielectric spectroscopy, random disorder, collective dynamic-modes, polarization sign reversal, a phase-transition, dielectric-spectroscopy
Relation: Ferroelectrics vol:344 pages:307-313; https://lirias.kuleuven.be/handle/123456789/50490; http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=CCC&SrcApp=PRODUCT_NAME&SrcURL=WOS_RETURN_URL&CKEY=ROZA0307060344FS&DestLinkType=FullRecord&DestApp=CCC&SrcDesc=RETURN_ALT_TEXT&SrcAppSID=APP_SID
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6
المؤلفون: Busch, Mark, Kityk, Andriy V., Piecek, Wiktor, Hofmann, Tommy, Wallacher, Dirk, Calus, Sylwia, Kula, Przemyslaw, Steinhart, Martin, Eich, Manfred, Huber, Patrick
المساهمون: orcid:0000-0002-7683-535X, orcid:0000-0002-5241-8498, orcid:0000-0002-4823-3220, orcid:0000-0002-2126-9100, orcid:0000-0002-7862-7968, orcid:0000-0002-3391-7048, orcid:0000-0002-3378-6674, ABD-5486-2021, B-7811-2011, B-8351-2008, AAW-6434-2021, B-7690-2008
مصطلحات موضوعية: ALUMINUM-OXIDE, C-ASTERISK PHASE, Chemistry, Multidisciplinary, CHIRAL STRUCTURES, COLLECTIVE DYNAMIC-MODES, DIELECTRIC-SPECTROSCOPY, Materials Science, Nanoscience & Nanotechnology, Physics, Applied, POLARIZATION SIGN REVERSAL, Science & Technology - Other Topics, SOFT MODE, TEMPERATURE-DEPENDENCE, TILT ANGLE, X-RAY-DIFFRACTION
Relation: NANOSCALE; https://osnascholar.ub.uni-osnabrueck.de/handle/unios/14320; ISI:000418098000011