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1Academic Journal
المؤلفون: Yingfan Xiong, Jinming Gou, Zhaohui Tang, Guangxu Xiao, Lihua Lei, Song Song, Xiao Deng, Xinbin Cheng
المصدر: Photonics, Vol 10, Iss 11, p 1272 (2023)
مصطلحات موضوعية: atom force microscope, chromium atom deposition technology, EUV, two-dimensional grating, scanning tip, tip characterizer, Applied optics. Photonics, TA1501-1820
وصف الملف: electronic resource