المؤلفون: Jun Okuno, Takafumi Kunihiro, Kenta Konishi, Monica Materano, Tarek Ali, Kati Kuehnel, Konrad Seidel, Thomas Mikolajick, Uwe Schroeder, Masanori Tsukamoto, Taku Umebayashi

المصدر: IEEE Journal of the Electron Devices Society, Vol 10, Pp 29-34 (2022)

مصطلحات موضوعية: Ferroelectric random-access memory, FeRAM, capacitor under bitline, CUB, hafnium oxide, zirconium oxide, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9621226/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/4381b49e3fa94cfc82b7bdd0a97bd89b

المؤلفون: Masanori Tsukamoto, Thomas Mikolajick, Konrad Seidel, Taku Umebayashi, Kenta Konishi, Tarek Ali, Uwe Schroeder, Takafumi Kunihiro, Monica Materano, Jun Okuno, Kati Kuehnel

المساهمون: Publica

المصدر: IEEE Journal of the Electron Devices Society, Vol 10, Pp 29-34 (2022)

مصطلحات موضوعية: Materials science, CUB, Ferroelectric random-access memory, Hardware_PERFORMANCEANDRELIABILITY, law.invention, hafnium oxide, zirconium oxide, Hardware_GENERAL, law, capacitor under bitline, Hardware_INTEGRATEDCIRCUITS, Electrical and Electronic Engineering, Polarization (electrochemistry), FeRAM, business.industry, Sense amplifier, Transistor, Ferroelectricity, TK1-9971, Electronic, Optical and Magnetic Materials, Capacitor, CMOS, Ferroelectric RAM, Optoelectronics, Electrical engineering. Electronics. Nuclear engineering, business, Biotechnology, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fd097e5d445263c5ef361e3922d17855
https://doi.org/10.1109/jeds.2021.3129279