المؤلفون: Bittman, Daniel, Gray, Matthew, Raizes, Justin, Mukhopadhyay, Sinjoni, Bryson, Matt, Alvaro, Peter, Long, Darrell DE, Miller, Ethan L

مصطلحات موضوعية: power consumption, non-volatile memory, data structure design, bit flips

URL الوصول: https://escholarship.org/uc/item/53f6r130

المؤلفون: Palani, Purushothaman

Thesis Advisors: Electrical and Computer Engineering, Xiong, Wenjie, Nazhandali, Leyla, Shao, Linbo

مصطلحات موضوعية: DDR4, DRAM, PUF, FPGA, Xilinx, Magnetic Field, decay, retention analysis, bit flips

وصف الملف: ETD; application/pdf

الاتاحة: https://hdl.handle.net/10919/119322

المؤلفون: Olgun, Ataberk, Patel, M., Hassan, H., Park, J., Luo, H., Orosa, L., Yağlıkçı, A. Giray

مصطلحات موضوعية: DRAM, DRAM chips, Experimental analysis, Fundamental properties, Rowhammer, Security, Dynamic random access storage, Characterization, Memory, Reliability, Safety, Temperature, Testing, Network security, Reliability analysis, Safety testing, Bit-flips, Cell-size, Circuit levels, DRAM cells

Relation: Proceedings of the Annual International Symposium on Microarchitecture, MICRO; Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı; https://hdl.handle.net/20.500.11851/8309; https://doi.org/10.1145/3466752.3480069; 1182; 1197

الاتاحة: https://hdl.handle.net/20.500.11851/8309
https://doi.org/10.1145/3466752.3480069

المؤلفون: Shreya Nasa

مصطلحات موضوعية: Coding, information theory and compression, Coding Theory, Bit-flips, Erasures, Code rate, Error resilience

Relation: https://figshare.com/articles/thesis/On_communication_with_Perfect_Feedback_against_Bit-flips_and_Erasures/25678176

الاتاحة: https://doi.org/10.25394/pgs.25678176.v1

المؤلفون: Anzt, Hartwig, Dongarra, Jack, Quintana Ortí, Enrique Salvador

المساهمون: Universitat Politècnica de València. Departamento de Informática de Sistemas y Computadores - Departament d'Informàtica de Sistemes i Computadors, U.S. Department of Energy, European Regional Development Fund, Ministerio de Economía y Competitividad

مصطلحات موضوعية: Sparse linear systems, Iterative solvers, Jacobi method, Fault tolerance, Bit flips, High performance computing, ARQUITECTURA Y TECNOLOGIA DE COMPUTADORES

Relation: Journal of Computational Science; info:eu-repo/grantAgreement/MINECO//TIN2014-53495-R/ES/COMPUTACION HETEROGENEA DE BAJO CONSUMO/; info:eu-repo/grantAgreement/DOE//DE-SC-0010042/; https://doi.org/10.1016/j.jocs.2016.11.013; urn:issn:1877-7503; http://hdl.handle.net/10251/160574

الاتاحة: http://hdl.handle.net/10251/160574
https://doi.org/10.1016/j.jocs.2016.11.013

المؤلفون: Higham, Nicholas, Pranesh, Srikara

المصدر: Higham , N & Pranesh , S 2019 , ' Simulating low precision floating-point arithmetic ' , S I A M Journal on Scientific Computing , vol. 41 , no. 5 . https://doi.org/10.1137/19M1251308

مصطلحات موضوعية: floating-point arithmetic, half precision, low precision, IEEE arithmetic, fp16, bfloat16, subnormal numbers, mixed precision, simulation, Rounding error analysis, round to nearest, directed rounding, stochastic rounding, bit flips, MATLAB

الاتاحة: https://research.manchester.ac.uk/en/publications/3ff497c2-9ee7-495c-bbe0-6f79b0929ff4
https://doi.org/10.1137/19M1251308

المؤلفون: McIntosh–Smith, Simon, Hunt, Rob, Price, James, Vesztrocy, Alex Warwick

المصدر: McIntosh–Smith , S , Hunt , R , Price , J & Vesztrocy , A W 2018 , ' Application-based fault tolerance techniques for sparse matrix solvers ' , International Journal of High Performance Computing Applications , vol. 32 , no. 5 , pp. 627-640 . https://doi.org/10.1177/1094342017694946

مصطلحات موضوعية: bit-flips, error-correcting, exascale, Fault tolerance, single event upsets, sparse matrix algorithms

وصف الملف: application/pdf

الاتاحة: https://hdl.handle.net/1983/2c2896b8-0cfa-438d-8d85-8f947bbdfbf9
https://research-information.bris.ac.uk/en/publications/2c2896b8-0cfa-438d-8d85-8f947bbdfbf9
https://doi.org/10.1177/1094342017694946
https://research-information.bris.ac.uk/ws/files/187991940/IJHPCA_FTS_2016.pdf
http://www.scopus.com/inward/record.url?scp=85053861590&partnerID=8YFLogxK

المؤلفون: Moreira, Francis Birck, Navaux, Philippe Olivier Alexandre, Diener, Matthias, Koren, Israel

مصطلحات موضوعية: Memory access patterns, Tolerancia : Falhas, Memoria : Computadores, Machine learning, Engenharia : Software, Single bit flips

وصف الملف: application/pdf

Relation: ACM International Conference on Computing Frontier ( 2017 May 15-17 : Siena, Italy). Proceedings. New York : ACM, c2017; http://hdl.handle.net/10183/159015; 001023031

الاتاحة: http://hdl.handle.net/10183/159015

المؤلفون: Sangchoolie, Behrooz, Pattabiraman, K., Karlsson, J.

المصدر: Proceedings - 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2017. :97-108

مصطلحات موضوعية: error space pruning, fault injection, single/multiple bit-flip errors, transient hardware faults, Bit error rate, Radiation hardening, Software testing, Voltage scaling, Benchmark programs, Bit-flips, Empirical studies, Hardware faults, Particle-induced soft errors, Silent data corruptions, Single bit flips, Errors

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-56955

المؤلفون: Srikara Pranesh, Nicholas J. Higham

المصدر: Higham, N & Pranesh, S 2019, ' Simulating low precision floating-point arithmetic ', S I A M Journal on Scientific Computing, vol. 41, no. 5 . https://doi.org/10.1137/19M1251308

مصطلحات موضوعية: MATLAB, Floating point, floating-point arithmetic, Mixed precision, low precision, IEEE arithmetic, half precision, bit flips, stochastic rounding, Hardware_ARITHMETICANDLOGICSTRUCTURES, Arithmetic, bfloat16, Mathematics, computer.programming_language, mixed precision, Applied Mathematics, round to nearest, simulation, Rounding error analysis, Computational Mathematics, subnormal numbers, Denormal number, directed rounding, fp16, computer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dd2c4a433c1f658697ac2c5060df126d
https://doi.org/10.1137/19m1251308

المؤلفون: Voros, N.S., Tsasakou, S., Valderrama, C., Arab, M.- S., Birbas, A.N, Birbas, M., Mariatos, V., Andritsou, A.

المساهمون: INTRACOM S.A., Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS), Department of Computer Engineering and Informatics Patras, University of Patras

المصدر: IFIP International Conference FORTE/PSTV'98, Formal description Techniques & Protocol Specification, Testing and Verification ; https://hal.science/hal-01396490 ; IFIP International Conference FORTE/PSTV'98, Formal description Techniques & Protocol Specification, Testing and Verification, Nov 1998, Paris, France

مصطلحات موضوعية: memory-bit-flips, PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Paris, France

الاتاحة: https://hal.science/hal-01396490

المؤلفون: Krutartha Patel, Sri Parameswaran

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.inf.pucrs.br/~hessel/swe/pos/sw_hw_metodology_security.pdf.

مصطلحات موضوعية: Categories and Subject Descriptors B.8.1 [Performance and Reliability, Reliability, Testing and Fault- Tolerance General Terms Security, Design, Measurement Keywords Multiprocessors, Tensilica, Architecture, Bit Flips, Code Injection

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.471.2924; http://www.inf.pucrs.br/~hessel/swe/pos/sw_hw_metodology_security.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.471.2924
http://www.inf.pucrs.br/~hessel/swe/pos/sw_hw_metodology_security.pdf

المؤلفون: Roshan G. Ragel, Sri Parameswaran

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.cse.unsw.edu.au/~sridevan/index_files/31.4s-ragel.pdf.

مصطلحات موضوعية: Categories and Subject Descriptors, B.8.1 [Performance and Reliability, Reliability, Testing, and Fault-Tolerance General Terms, Design, Performance, Security Keywords, Detecting Code Injection Attacks, Basic Block Checksumming, Checksum Encryption, Bit Flips Detection

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.133.339; http://www.cse.unsw.edu.au/~sridevan/index_files/31.4s-ragel.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.133.339
http://www.cse.unsw.edu.au/~sridevan/index_files/31.4s-ragel.pdf

المؤلفون: Sangchoolie, Behrooz, Ayatolahi, F., Johansson, R., Karlsson, J.

المصدر: Proceedings - 2015 11th European Dependable Computing Conference, EDCC 2015. :178-189

مصطلحات موضوعية: brake-by-wire system, inject-on-read, inject-on-write, ISA-level fault injection, single bit-flips, Computer hardware, Radiation hardening, Software testing, Brake-by-wire systems, Fault injection, Single bit flips, Computer architecture

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-56957

المؤلفون: Daniel Bittman, Sinjoni Mukhopadhyay, Justin Raizes, Peter Alvaro, Matthew Gray, Ethan L. Miller, Matt Bryson, Darrell D. E. Long

المصدر: NVMSA

مصطلحات موضوعية: non-volatile memory, Hardware_MEMORYSTRUCTURES, business.industry, Computer science, power consumption, Data structure, Power (physics), Non-volatile memory, Phase-change memory, Consistency (database systems), Bit (horse), Software, data structure design, bit flips, Embedded system, Use case, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2737ec1cfc62d21cb88c99e800b4a08f
https://doi.org/10.1109/nvmsa.2018.00022

المؤلفون: Sangchoolie, Behrooz, Ayatolahi, F., Johansson, R., Karlsson, J.

المصدر: Proceedings - 2014 10th European Dependable Computing Conference, EDCC 2014. :146-157

مصطلحات موضوعية: compiler optimization, error sensitivity, fault injection, single bit-flips, soft error, Computer architecture, Errors, Experiments, Microprocessor chips, Radiation hardening, Bit-flips, Compiler optimizations, Program compilers

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-56959

المؤلفون: Ayatolahi, F., Sangchoolie, Behrooz, Johansson, R., Karlsson, J.

المصدر: Lect. Notes Comput. Sci.. :265-276

مصطلحات موضوعية: double bit-flips, error sensitivity, fault injection, out-of-context dependability benchmarking, single bit-flips, Benchmark programs, Bit-flips, Instruction set architecture, Memory locations, Program execution, Silent data corruptions, Benchmarking, Computer architecture, Error statistics, Errors, Experiments, Security of data

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-56960

المؤلفون: Niels Penneman, Jens Vankeirsbilck, Jeroen Boydens, Hans Hallez

المساهمون: Gallina, B, Skavhaug, A, Bitsch, F

المصدر: Developments in Language Theory ISBN: 9783319986531
SAFECOMP

مصطلحات موضوعية: 021103 operations research, business.industry, Computer science, Fault Tolerance, 0211 other engineering and technologies, erroneous bit-flips, Fault tolerance, 02 engineering and technology, Electromagnetic interference, 020202 computer hardware & architecture, Resilient Software, Microcontroller, Software, Control flow, Feature (computer vision), Control theory, 0202 electrical engineering, electronic engineering, information engineering, Overhead (computing), business, Error detection and correction, Software-implemented control flow error detection

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f400936262507bc278c4332f0e785f86
https://doi.org/10.1007/978-3-319-99130-6_15

المؤلفون: Sangchoolie, Behrooz, Ayatolahi, F., Karlsson, J.

المصدر: Lecture Notes in Informatics (LNI), Proceedings - Series of the Gesellschaft fur Informatik (GI). :468-479

مصطلحات موضوعية: Failure mode distributions, Fault injection, Fault sensitivity, Microprocessor faults, Software-implemented hardware fault tolerance, Fault tolerance, Forward recoveries, Hardware faults, Instruction set architecture, Machine instructions, Single bit flips, Software implemented hardware fault tolerance, Memory architecture

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-56964

المؤلفون: Viyas Gupta, Christopher D. Frost, Ali Zadeh, Luigi Dilillo, Arto Javanainen, Alexandre Louis Bosser, Frédéric Wrobel, Frédéric Saigné, Helmut Puchner, Jukka Jaatinen, Georgios Tsiligiannis, Ari Virtanen

المساهمون: Department of Physics [Jyväskylä Univ] (JYU), University of Jyväskylä (JYU), TEST (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Conception et Test de Systèmes MICroélectroniques (SysMIC), ​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​ISIS Neutron and Muon Source (ISIS), STFC Rutherford Appleton Laboratory (RAL), Science and Technology Facilities Council (STFC)-Science and Technology Facilities Council (STFC), European Space Research and Technology Centre (ESTEC), European Space Agency (ESA), Cypress Semiconductor [San Jose]

المصدر: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩

مصطلحات موضوعية: Nuclear and High Energy Physics, Engineering, Hardware_PERFORMANCEANDRELIABILITY, Radiation, [PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex], 01 natural sciences, statistical analysis, 0103 physical sciences, Static testing, Electronic engineering, memory response, Statistical analysis, Sensitivity (control systems), Static random-access memory, Electrical and Electronic Engineering, static test, Cluster of bit-flips, dynamic test, 010302 applied physics, Single event upset SEU, Random access memory, ta114, ta213, 010308 nuclear & particles physics, business.industry, multiple cell upset (MCU), säteily, SRAM, Reliability engineering, radiation, Nuclear Energy and Engineering, Single event upset, radiation effects, business, [MATH.MATH-NA]Mathematics [math]/Numerical Analysis [math.NA], Dynamic testing

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::887d5ab4a626fb24b82d3ef4e1885fcd
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01382508