المؤلفون: Oechsner, Hans

المصدر: Scanning Microscopy

مصطلحات موضوعية: Surface, thin film and bulk analysis, Secondary Neutral Mass Spectrometry, analysis of insulating samples and thin films, charge compensation in surface and thin films analysis, Life Sciences

وصف الملف: application/pdf

Relation: https://digitalcommons.usu.edu/microscopy/vol3/iss2/2; https://digitalcommons.usu.edu/context/microscopy/article/2353/viewcontent/WDCcenterscan1989Oechsner_AnalysisInsulatorSamples.pdf

الاتاحة: https://digitalcommons.usu.edu/microscopy/vol3/iss2/2
https://digitalcommons.usu.edu/context/microscopy/article/2353/viewcontent/WDCcenterscan1989Oechsner_AnalysisInsulatorSamples.pdf