يعرض 1 - 20 نتائج من 2,193 نتيجة بحث عن '"aluminium arsenides"', وقت الاستعلام: 0.45s تنقيح النتائج
  1. 1
    Conference

    المساهمون: Coldren, L [Univ. of California, Santa Barbara (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 10:6; Conference: Symposium on electron, ion and photon beams, Orlando, FL (United States), 26-29 May 1992

    وصف الملف: Medium: X; Size: Pages: 2720-2724

  2. 2
    Conference

    المساهمون: Wolf, E [Cornell Univ. Ithaca, NY (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 10:6; Conference: Symposium on electron, ion and photon beams, Orlando, FL (United States), 26-29 May 1992

    وصف الملف: Medium: X; Size: Pages: 2681-2684

  3. 3
    Conference

    المساهمون: Poetz, W [Univ. of Illinois, Chicago (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2251-2255

  4. 4
    Conference

    المساهمون: Harbison, J [Bellcore, Red Bank, NJ (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2263-2267

  5. 5
    Conference

    المساهمون: Warren, A [Thomas J. Watson Research Center, Yorktown Heights, NY (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2328-2332

  6. 6
    Conference

    المساهمون: Franciosi, A [Lab. TASC-INFM, Trieste (Italy) Univ. of Minnesota, Minneapolis (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2225-2232

  7. 7
    Conference

    المساهمون: Wicks, G [Univ. of Rochester, NY (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2244-2250

  8. 8
    Conference

    المساهمون: Vechten, J.A. [Oregon State Univ., Corvallis (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2212-2218

  9. 9
    Conference

    المساهمون: Melloch, M [Purdue Univ., West Lafayette, IN (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2355-2357

  10. 10
    Conference

    المساهمون: Hjalmarson, H [Sandia National Labs., Albuquerque, NM (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2369-2376

  11. 11
    Conference

    المساهمون: Wieder, H [Univ., of California, San Diego, La Jolla (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2411-2414

  12. 12
    Conference

    المساهمون: Ehret, J [Wright Lab., Wright-Patterson AFB, OH (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

    وصف الملف: Medium: X; Size: Pages: 2427-2432

  13. 13
    Conference

    المصدر: Conference: Contributed to 17th International Spin Physics Symposium (SPIN06), Kyoto, Japan, 2-7 Oct 2006

    وصف الملف: Medium: ED; Size: 5 pages

  14. 14
    Conference

    المصدر: Conference: Contributed to 17th International Spin Physics Symposium (SPIN06), Kyoto, Japan, 2-7 Oct 2006

    وصف الملف: Medium: ED; Size: 7 pages

  15. 15
    Conference

    المصدر: Conference: Presented at 11th International Workshop on Polarized Sources and Targets (PST05), Tokyo, Japan, 14-17 Nov 2005

    وصف الملف: Medium: ED; Size: 5 pages

  16. 16
    Conference

    المصدر: Conference: Contributed to 14th International Symposium on Nanostructures: Physics and Technology, St. Petersburg, Russia, 20-25 Jun 2006

    وصف الملف: Medium: ED; Size: 3 pages

  17. 17
    Academic Journal

    المساهمون: Woodward, M [Univ. of Sheffield (United Kingdom)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 10:6

    وصف الملف: Medium: X; Size: Pages: 2488-2490

  18. 18
    Academic Journal

    المساهمون: Esaki, L [IBM Thomas J Watson Research Center, Yorktown Heights, NY (USA)]

    المصدر: Applied Physics Communications; (USA); 10:1-2

    وصف الملف: Medium: X; Size: Pages: 186

  19. 19
    Academic Journal

    المساهمون: Chandra, A [AT and T Bell Labs., Murray Hill, NJ (United States)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4

    وصف الملف: Medium: X; Size: Pages: 1930-1933

  20. 20
    Academic Journal

    المساهمون: Rossum, M [Interuniversity Microelectronics Center, Leuven (Belgium)]

    المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4

    وصف الملف: Medium: X; Size: Pages: 1978-1980