المؤلفون: Jonas Weber, Yue Yuan, Sebastian Pazos, Fabian Kühnel, Christoph Metzke, Josef Schätz, Werner Frammelsberger, Günther Benstetter, Mario Lanza

مصطلحات موضوعية: Biophysics, Biotechnology, Chemical Sciences not elsewhere classified, ultrasharp conductive nanoprobe, reference ultrathin dielectric, randomly selected locations, important characterization techniques, high lateral resolution, almost always results, fast nanoprobe degradation, tunneling current across, current limitation system, tip degradation, ∼ 50, work contributes, technique scans, sought solution, significantly enhance, preferred tool, many companies, inexpensive long, data sets, data collected, contact area, also endangers

Relation: https://figshare.com/articles/journal_contribution/Current-Limited_Conductive_Atomic_Force_Microscopy/24600374

الاتاحة: https://doi.org/10.1021/acsami.3c10262.s001
https://figshare.com/articles/journal_contribution/Current-Limited_Conductive_Atomic_Force_Microscopy/24600374