المؤلفون: Seunglok Lee, Jeewon Park, Hayoung Ma, Wonjun Kim, Young Kyu Song, Dong Woog Lee, Seung Man Noh, Seong-Jun Yoon, Changduk Yang

مصطلحات موضوعية: Biophysics, Biotechnology, Space Science, Environmental Sciences not elsewhere classified, Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, varying pendant length, various research fields, various contact surfaces, shear bonding strength, multifunctional methacrylic polymers, multifunctional acrylic polymers, fast cure speed, ambient air conditions, c6 ), isobutyl, c5 ), hexyl, c4 ), pentyl, c3 ), butyl, c2 ), propyl, c1 ), ethyl, superior adhesion performance, strong adhesion strength, interfacial adhesion promotors, excellent edge encapsulant

Relation: https://figshare.com/articles/journal_contribution/Multifunctional_Acrylic_Polymers_with_Enhanced_Adhesive_Property_Serving_as_Excellent_Edge_Encapsulant_for_Stable_Optoelectronic_Devices/25046139

الاتاحة: https://doi.org/10.1021/acsami.3c16598.s001
https://figshare.com/articles/journal_contribution/Multifunctional_Acrylic_Polymers_with_Enhanced_Adhesive_Property_Serving_as_Excellent_Edge_Encapsulant_for_Stable_Optoelectronic_Devices/25046139

المؤلفون: Tez, Anıl

المساهمون: Coşkun, Necdet, Bursa Uludağ Üniversitesi/Fen Bilimleri Enstitüsü/Kimya Anabilim Dalı.

مصطلحات موضوعية: Yüzey tutunma promotorı, Surface modification, Malononitril, Aromatik aminler, SMC, Fulven, Fiberglass, Yüzey modifikasyonu, Aromatic amines, Fulvene, Cam elyaf, Surface adhesion promotors, Malononitrile

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______9458::8478b916045f0bd738660232ca833662
http://hdl.handle.net/11452/11126

المؤلفون: Fecko, Peter

Thesis Advisors: Boušek, Jaroslav, Pekárek, Jan

مصطلحات موضوعية: reactive ion etching, van der Waals force, biomimetika, Parylen C, adhezní struktury, atomic force microscopy (AFM), Parylene C, biomimetics, scanning electron microscopy (SEM), adhesion promotors, atomic layer deposition (ALD), contact angle measurement, měření kontaktního uhlu, leptání v XeF2, mikroskopie atomárních sil (AFM), leptání reaktivní plasmou, XeF2 etching, rastrovací elektronová mikroskopie (SEM), adheze gekona, van der Waalsovy síly, adhesive setae, depozice atomárních vrstev (ALD), gecko adhesion, adhezní promotéry

الاتاحة: http://www.nusl.cz/ntk/nusl-400722

المؤلفون: Tez, Anıl

المساهمون: Coşkun, Necdet, Bursa Uludağ Üniversitesi/Fen Bilimleri Enstitüsü/Kimya Anabilim Dalı., orcid:0000-0001-9702-8349

مصطلحات موضوعية: Malononitril, Cam elyaf, Yüzey modifikasyonu, Yüzey tutunma promotorı, Aromatik aminler, SMC, Fiberglass, Fulven, Aromatic amines, Surface modification, Surface adhesion promotors, Malononitrile, Fulvene

وصف الملف: VIII, 120 sayfa; application/pdf

Relation: Tez; Tez, A. (2019). Bazı knoevenagel reaksiyon ürünlerinin eldesi ve hazır kalıplama bileşenlerinin (smc) yüzey gerilimleri üzerindeki etkilerinin incelenmesi. Yayınlanmamış yüksek lisans tezi. Bursa Uludağ Üniversitesi Fen Bilimleri Enstitüsü.; http://hdl.handle.net/11452/11126

الاتاحة: http://hdl.handle.net/11452/11126

المؤلفون: Fecko, Peter

المساهمون: Pekárek, Jan, Boušek, Jaroslav

المصدر: FECKO, P. Mikrostruktury mimikující povrch tlapky gekona [online]. Brno: Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. 2019.

مصطلحات موضوعية: adheze gekona, adhezní struktury, biomimetika, van der Waalsovy síly, leptání reaktivní plasmou, leptání v XeF2, Parylen C, depozice atomárních vrstev (ALD), adhezní promotéry, rastrovací elektronová mikroskopie (SEM), měření kontaktního uhlu, mikroskopie atomárních sil (AFM), gecko adhesion, adhesive setae, biomimetics, van der Waals force, reactive ion etching, XeF2 etching, Parylene C, atomic layer deposition (ALD), adhesion promotors, scanning electron microscopy (SEM), contact angle measurement, atomic force microscopy (AFM)

وصف الملف: text/html

Relation: http://hdl.handle.net/11012/177763

الاتاحة: http://hdl.handle.net/11012/177763

المؤلفون: Dasiewicz, J., Janecki, J., Pawelec, Z.

مصطلحات موضوعية: kompozyty metalożywiczne, połączenia adhezyjne, warstwa graniczna, zwilżalność, silany, promotory adhezji, metal-resinous composite, adhesive bonds, boundary layer, wettability, silanes, adhesion promotors

URL الوصول: http://yadda.icm.edu.pl/baztech/element/bwmeta1.element.baztech-article-BPS1-0010-0022

المؤلفون: GEORGIA TECH RESEARCH INST ATLANTA, Livesay, B. R., Bohlander, R. A., Turbini, L. J., Schodorf, J. B.

المصدر: DTIC AND NTIS

مصطلحات الفهرس: Electrical and Electronic Equipment, Ceramics, Refractories and Glass, Mfg & Industrial Eng & Control of Product Sys, MANUFACTURING, FABRICATION, MICROELECTRONICS, GUIDED MISSILE DETECTION, GUIDED MISSILE COMPONENTS, STRESSES, MILITARY REQUIREMENTS, POLYMERS, INTEGRATED CIRCUITS, CERAMIC MATERIALS, SILICON, THICK FILMS, MICROCIRCUITS, HYBRID SYSTEMS, MODULES(ELECTRONICS), POLYMERIC FILMS, RELIABILITY, METAL OXIDE SEMICONDUCTORS, CHIPS(ELECTRONICS), THIN FILMS, ELECTROOPTICS, INTEGRATED SYSTEMS, MCM(MULTI CHIP MODULES), MCM-C(MULTI CHIP MODULES-CERAMIC), MCM-D(MULTI CHIP MODULES-DIELECTRIC), POLYMER DIELECTRICS, POLYIMIDES, LITERATURE REVIEW, LASER ABLATION, PHOTO-DEFINABLE POLYMERS, LOW TEMPERATURE COFIRED CERAMICS, VIAS, CONTROLLED EXTRUSION, POLYMER PRECURSORS, ADHESION PROMOTORS, THIN FILM METALLIZATION, MISSILE SEEKERS, Text

URL: https://apps.dtic.mil/docs/citations/ADA262809

المؤلفون: Pekárek, Jan, Boušek, Jaroslav, Fecko, Peter

مصطلحات الفهرس: adheze gekona, adhezní struktury, biomimetika, van der Waalsovy síly, leptání reaktivní plasmou, leptání v XeF2, Parylen C, depozice atomárních vrstev (ALD), adhezní promotéry, rastrovací elektronová mikroskopie (SEM), měření kontaktního uhlu, mikroskopie atomárních sil (AFM), gecko adhesion, adhesive setae, biomimetics, van der Waals force, reactive ion etching, XeF2 etching, Parylene C, atomic layer deposition (ALD), adhesion promotors, scanning electron microscopy (SEM), contact angle measurement, atomic force microscopy (AFM), Text

URL: http://hdl.handle.net/11012/177763

المؤلفون: Pekárek, Jan, Boušek, Jaroslav, Fecko, Peter

مصطلحات الفهرس: adheze gekona, adhezní struktury, biomimetika, van der Waalsovy síly, leptání reaktivní plasmou, leptání v XeF2, Parylen C, depozice atomárních vrstev (ALD), adhezní promotéry, rastrovací elektronová mikroskopie (SEM), měření kontaktního uhlu, mikroskopie atomárních sil (AFM), gecko adhesion, adhesive setae, biomimetics, van der Waals force, reactive ion etching, XeF2 etching, Parylene C, atomic layer deposition (ALD), adhesion promotors, scanning electron microscopy (SEM), contact angle measurement, atomic force microscopy (AFM), Text

URL: http://hdl.handle.net/11012/177763

المؤلفون: Pekárek, Jan, Boušek, Jaroslav

مصطلحات الفهرس: adheze gekona, adhezní struktury, biomimetika, van der Waalsovy síly, leptání reaktivní plasmou, leptání v XeF2, Parylen C, depozice atomárních vrstev (ALD), adhezní promotéry, rastrovací elektronová mikroskopie (SEM), měření kontaktního uhlu, mikroskopie atomárních sil (AFM), gecko adhesion, adhesive setae, biomimetics, van der Waals force, reactive ion etching, XeF2 etching, Parylene C, atomic layer deposition (ALD), adhesion promotors, scanning electron microscopy (SEM), contact angle measurement, atomic force microscopy (AFM), Text

URL: http://hdl.handle.net/11012/177763

المؤلفون: Pekárek, Jan, Boušek, Jaroslav

مصطلحات الفهرس: adheze gekona, adhezní struktury, biomimetika, van der Waalsovy síly, leptání reaktivní plasmou, leptání v XeF2, Parylen C, depozice atomárních vrstev (ALD), adhezní promotéry, rastrovací elektronová mikroskopie (SEM), měření kontaktního uhlu, mikroskopie atomárních sil (AFM), gecko adhesion, adhesive setae, biomimetics, van der Waals force, reactive ion etching, XeF2 etching, Parylene C, atomic layer deposition (ALD), adhesion promotors, scanning electron microscopy (SEM), contact angle measurement, atomic force microscopy (AFM), Text

URL: http://hdl.handle.net/11012/177763

المؤلفون: Pekárek, Jan, Boušek, Jaroslav

مصطلحات الفهرس: adheze gekona, adhezní struktury, biomimetika, van der Waalsovy síly, leptání reaktivní plasmou, leptání v XeF2, Parylen C, depozice atomárních vrstev (ALD), adhezní promotéry, rastrovací elektronová mikroskopie (SEM), měření kontaktního uhlu, mikroskopie atomárních sil (AFM), gecko adhesion, adhesive setae, biomimetics, van der Waals force, reactive ion etching, XeF2 etching, Parylene C, atomic layer deposition (ALD), adhesion promotors, scanning electron microscopy (SEM), contact angle measurement, atomic force microscopy (AFM), Text

URL: http://hdl.handle.net/11012/177763

المؤلفون: Pekárek, Jan, Boušek, Jaroslav, Fecko, Peter

مصطلحات الفهرس: adheze gekona, adhezní struktury, biomimetika, van der Waalsovy síly, leptání reaktivní plasmou, leptání v XeF2, Parylen C, depozice atomárních vrstev (ALD), adhezní promotéry, rastrovací elektronová mikroskopie (SEM), měření kontaktního uhlu, mikroskopie atomárních sil (AFM), gecko adhesion, adhesive setae, biomimetics, van der Waals force, reactive ion etching, XeF2 etching, Parylene C, atomic layer deposition (ALD), adhesion promotors, scanning electron microscopy (SEM), contact angle measurement, atomic force microscopy (AFM), Text

URL: http://hdl.handle.net/11012/177763