المؤلفون: Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich

المصدر: Journal of Electronic Testing. 39:27-40

مصطلحات موضوعية: Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2dc676418451be131f3ebf565a83edc1
https://doi.org/10.1007/s10836-023-06044-z

المؤلفون: Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich, Bin Yang

المصدر: 2022 IEEE International Test Conference (ITC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dc34dde3ca367a76f8d8b0074aedc024
https://doi.org/10.1109/itc50671.2022.00026

المؤلفون: Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich

المصدر: 2022 IEEE European Test Symposium (ETS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::65eba3f0f7eede35540004bfa8ecc27f
https://doi.org/10.1109/ets54262.2022.9810443

المؤلفون: Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich

المصدر: 2021 IEEE 22nd Latin American Test Symposium (LATS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::334d687c58bcd251772e658d43c02d89
https://doi.org/10.1109/lats53581.2021.9651857

المؤلفون: Hans-Joachim Wunderlich, Marzieh Hashemipour-Nazari, Zahra Paria Najafi-Haghi

المصدر: ETS

مصطلحات موضوعية: System failure, Computer science, Statistical learning, Hardware_PERFORMANCEANDRELIABILITY, Cellular level, Classifier (UML), Reliability engineering, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ff48feac514a05f41f5bb990e5bd810e
https://doi.org/10.1109/ets48528.2020.9131600