المؤلفون: Zafrani, M., Brandt, J., Strittmatter, R., Sun, B., Zhang, S., Lidow, A.

المصدر: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

الاتاحة: http://dx.doi.org/10.1109/redw56037.2022.9921699
http://xplorestaging.ieee.org/ielx7/9921413/9921434/09921699.pdf?arnumber=9921699

المؤلفون: Lauenstein, J.-M, Goldsman, N, Liu, S, Titus, J, Ladbury, R. L, Kim, H. S, Phan, A. M, Zafrani, M, Sherman, P

مصطلحات موضوعية: Electronics And Electrical Engineering

URL الوصول: https://ntrs.nasa.gov/citations/20110007877

المؤلفون: Ferlet-Cavrois, V., Schwank, J.R., Liu, S., Muschitiello, M., Beutier, Th., Javanainen, A., Hedlund, A., Poivey, C., Zadeh, A., Harboe-Sorensen, R., Santin, G., Nickson, B., Menicucci, A., Binois, C., Peyre, D., Hoeffgen, S.K., Metzger, S., Schardt, D., Kettunen, H., Virtanen, A., Berger, G., Piquet, B., Foy, J.C., Zafrani, M., Truscott, P., Poizat, M., Bezerra, F.

المساهمون: Astrium Toulouse, EADS - European Aeronautic Defense and Space, Grand Accélérateur National d'Ions Lourds (GANIL), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Centre National d'Études Spatiales Toulouse (CNES)

المصدر: 12th European Conference on Radiation and its Effects on Components and Systems (RADECS)
https://hal.in2p3.fr/in2p3-00695719
12th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2011, Sevilla, Spain. pp.690-699, ⟨10.1109/RADECS.2011.6131365⟩

مصطلحات موضوعية: Power MOSFETs, SRAM, ion beam energy, specie effect, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]

جغرافية الموضوع: Sevilla, Spain

Relation: in2p3-00695719; https://hal.in2p3.fr/in2p3-00695719

الاتاحة: https://hal.in2p3.fr/in2p3-00695719
https://doi.org/10.1109/RADECS.2011.6131365

المؤلفون: Ferlet-Cavrois, V., R. Schwank, J., Liu, S., Muschitiello, M., Beutier, T., Javanainen, A., Hedlund, A., Poivey, C., Mohammadzadeh, A., Harboe-Sorensen, R., Santin, G., Nickson, B., Menicucci, A., Binois, C., Peyre, D., K. Hoeffgen, S., Metzger, S., Schardt, D., Kettunen, H., Virtanen, A., Berger, G., Piquet, B., Foy, J.C., Zafrani, M., Truscott, P., Poizat, M., Bezerra, F.

المساهمون: Astrium Toulouse, EADS - European Aeronautic Defense and Space, Grand Accélérateur National d'Ions Lourds (GANIL), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Centre National d'Études Spatiales Toulouse (CNES)

المصدر: ISSN: 0018-9499.

مصطلحات موضوعية: SRAM, Ion beam energy, power MOSFET, species effect, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]

Relation: in2p3-00731111; https://hal.in2p3.fr/in2p3-00731111

الاتاحة: https://hal.in2p3.fr/in2p3-00731111
https://doi.org/10.1109/TNS.2012.2187681

المؤلفون: Morisette, D.T., Cooper, J.A., Melloch, M.R., Dolny, G.M., Shenoy, P.M., Zafrani, M., Gladish, J.

المصدر: IEEE Transactions on Electron Devices ; volume 48, issue 2, page 349-352 ; ISSN 0018-9383

الاتاحة: http://dx.doi.org/10.1109/16.902738
http://xplorestaging.ieee.org/ielx5/16/19522/00902738.pdf?arnumber=902738

المؤلفون: Hobart, K.D., Kub, F.J., Dolny, G., Zafrani, M., Neilson, J.M., Gladish, J., McLachlan, C.

المصدر: 11th International Symposium on Power Semiconductor Devices & ICs ISPSD'99 Proceedings (Cat No99CH36312); 1999, p45-48, 4p

المؤلفون: Schwank, James Ralph, Ferlet-Cavrois, V., Liu, S., Muschitiello, M., Poivey, C., Zadeh, A., Harboe-Sorensen, R., Santin, G., Truscott, P., Nickson, B., Menicucci, A., Poizat, M., Binois, C., Beutier, T., Peyre, D., Carvalho, A., Mangeret, R., Metzger, S., H< U+fffd>ffgen, S., Schardt, D., Virtanen, A., Kettunen, H., Javanainen, A., Berger, G., Piquet, B., Foy, J.-C., Zafrani, M., Bezerra, F., Ecoffet, R.

وصف الملف: application/pdf

Relation: http://www.osti.gov/servlets/purl/1108232; https://www.osti.gov/biblio/1108232

الاتاحة: http://www.osti.gov/servlets/purl/1108232
https://www.osti.gov/biblio/1108232

المؤلفون: Lauenstein, J.-M., Titus, J., Zafrani, M., Ladbury, R. L., Goldsman, N., Liu, S., Phan, A. M., Kim, H. S., Sherman, P.

المصدر: CASI

مصطلحات موضوعية: Electronics and Electrical Engineering

جغرافية الموضوع: Unclassified, Unlimited, Publicly available

وصف الملف: application/pdf

Relation: Document ID: 20110007877; http://hdl.handle.net/2060/20110007877

الاتاحة: http://hdl.handle.net/2060/20110007877

المؤلفون: Dolny, G.M., Morisette, D.T., Shenoy, P.M., Zafrani, M., Gladish, J., Woodall, J.M., Cooper, J.A., Melloch, M.R.

المصدر: 56th Annual Device Research Conference Digest (Cat No98TH8373); 1998, p84-85, 2p