المؤلفون: Wim Deweerd, S. Van Elshocht, Eddy Simoen, Z.M. Rittersma, M. Vertregt, Purushothaman Srinivasan

المصدر: IEEE Transactions on Electron Devices. 53:1216-1225

مصطلحات موضوعية: Electron mobility, Materials science, business.industry, Gate dielectric, Analytical chemistry, Electrical engineering, Equivalent oxide thickness, Dielectric, Electronic, Optical and Magnetic Materials, MOSFET, Electrical and Electronic Engineering, business, Current density, Leakage (electronics), High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::647662f2d67c8395af4b0d40014ca1b1
https://doi.org/10.1109/ted.2006.872702

المؤلفون: Z.M. Rittersma

المصدر: Sensors and Actuators A: Physical. 96:196-210

مصطلحات موضوعية: Engineering, Hygrometer, business.industry, Capacitive sensing, Metals and Alloys, Transduction (psychology), Condensed Matter Physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Electronic engineering, Systems engineering, ComputerSystemsOrganization_SPECIAL-PURPOSEANDAPPLICATION-BASEDSYSTEMS, Electrical and Electronic Engineering, business, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::46135317a12ba21ee5fd1fba9ca225cc
https://doi.org/10.1016/s0924-4247(01)00788-9

المؤلفون: Z.M. Rittersma, Josef Binder, Wolfgang Benecke, T. Kalinowski

المصدر: Sensors and Actuators B: Chemical. 68:281-285

مصطلحات موضوعية: Materials science, Fabrication, business.industry, Metals and Alloys, Analytical chemistry, Biomass, Condensed Matter Physics, Porous silicon, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Membrane, Plasma-enhanced chemical vapor deposition, Electrode, Materials Chemistry, Optoelectronics, Fermentation, Electrical and Electronic Engineering, business, Instrumentation, Excitation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c96fa793de865d6bbbfbee7c43820e87
https://doi.org/10.1016/s0925-4005(00)00445-7

المؤلفون: Z.M. Rittersma, Alexandra Splinter, André Bödecker, Wolfgang Benecke

المصدر: Sensors and Actuators B: Chemical. 68:210-217

مصطلحات موضوعية: Materials science, Fabrication, business.industry, Capacitive sensing, Metals and Alloys, Response time, Dielectric, Condensed Matter Physics, Porous silicon, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Capacitor, law, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, Resistor, business, Instrumentation, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::632cd439be44464351b2883ebc8cdbce
https://doi.org/10.1016/s0925-4005(00)00431-7

المؤلفون: C. Claeys, Eddy Simoen, Purushothaman Srinivasan, M. Vertregt, Z.M. Rittersma

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

مصطلحات موضوعية: Materials science, business.industry, Gate dielectric, Electrical engineering, Mixed-signal integrated circuit, Hardware_PERFORMANCEANDRELIABILITY, Dielectric, Noise (electronics), Gate oxide, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business, Metal gate, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::862995d90415908aff74e6b5d649676b
https://doi.org/10.1109/essder.2005.1546596

المؤلفون: Koray Karakaya, A. Zinine, J.G.M. van Berkum, P. Graat, M.A. Verheijen, Z.M. Rittersma, A.J.H.M. Rijnders, D.H.A. Blank

المساهمون: Inorganic Materials Science, Physics of Interfaces and Nanomaterials

المصدر: None

مصطلحات موضوعية: METIS-228657

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::febc5c3c37ae3fae484c4888600dbac8
https://research.utwente.nl/en/publications/characterization-of-laminated-ceo2hfo2-highk-gate-delectrics-deposited-by-pulsed-laser-deposition(6b342d0e-8eb2-4f80-954a-beaee0fc39b8).html

المؤلفون: Stefan Kubicek, Richard Lindsay, F.N. Cubaynes, C.J.J. Dachs, Z.M. Rittersma, J.C. Hooker, Josine Loo, Gerben Doornbos, Kirklen Henson, R. J. P. Lander, Youri Victorovitch Ponomarev, R. Surdeanu

المصدر: Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710).

مصطلحات موضوعية: Materials science, business.industry, Transistor, Gate dielectric, Process (computing), Hardware_PERFORMANCEANDRELIABILITY, Dielectric, Laser, law.invention, CMOS, Hardware_GENERAL, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Cmos process, business, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e84eb6a8fa471d0341ea0788c1a513a3
https://doi.org/10.1109/essderc.2003.1256802