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1
المؤلفون: Yaroslav A. Peshkov, Sergey V. Kannykin, Alexander V. Sitnikov, Yury A. Yurakov, Sergey A. Ivkov, E. P. Domashevskaya
المصدر: Surface and Interface Analysis. 53:244-249
مصطلحات موضوعية: X-ray reflectivity, Nanostructure, Materials science, business.industry, X-ray crystallography, Materials Chemistry, Optoelectronics, Surfaces and Interfaces, General Chemistry, State (functional analysis), Condensed Matter Physics, business, Surfaces, Coatings and Films
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2
المؤلفون: Yaroslav A. Peshkov, Sergey A. Ivkov, Alexander S. Lenshin, Alexander V. Sitnikov, Yury A. Yurakov
المصدر: The European Physical Journal Applied Physics. 98:6
مصطلحات موضوعية: Condensed Matter Physics, Instrumentation, Electronic, Optical and Magnetic Materials
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3
المصدر: Surface and Interface Analysis. 50:1265-1270
مصطلحات موضوعية: 010302 applied physics, Ion beam sputtering, Materials science, Nanostructure, Silicon, chemistry.chemical_element, 02 engineering and technology, Surfaces and Interfaces, General Chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Surfaces, Coatings and Films, Amorphous solid, Chemical engineering, chemistry, Phase composition, 0103 physical sciences, Materials Chemistry, 0210 nano-technology
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4
المؤلفون: Alexander V. Sitnikov, A. N. Lukin, Yaroslav A. Peshkov, E. P. Domashevskaya, V. A. Terekhov, K. A. Barkov, Yury A. Yurakov
المصدر: The European Physical Journal Applied Physics. 87:21301
مصطلحات موضوعية: Zirconium, Materials science, Silicon, Alloy, Analytical chemistry, chemistry.chemical_element, Infrared spectroscopy, Substrate (electronics), engineering.material, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, X-ray reflectivity, chemistry, Sputtering, engineering, Instrumentation, Cobalt