المؤلفون: Muller, J., Yurchuk, E., Schlosser, T., Paul, J., Hoffmann, R., Muller, S., Martin, D., Slesazeck, S., Polakowski, P., Sundqvist, J., Czernohorsky, M., Seidel, K., Kucher, P., Boschke, R., Trentzsch, M., Gebauer, K., Schroder, U., Mikolajick, T.

المصدر: 2012 Symposium on VLSI Technology (VLSIT)

الاتاحة: https://doi.org/10.1109/vlsit.2012.6242443
http://xplorestaging.ieee.org/ielx5/6235083/6242429/06242443.pdf?arnumber=6242443

المؤلفون: Arsaev, I. E., Vekshin, Yu. V., Lapshin, A. I., Mardyshkin, V. V., Sargsyan, M. V., Khvostov, E. Yu., Chernov, V. K., Yurchuk, E. F.

المصدر: Measurement Techniques ; volume 61, issue 3, page 284-289 ; ISSN 0543-1972 1573-8906

الاتاحة: http://dx.doi.org/10.1007/s11018-018-1422-5
http://link.springer.com/article/10.1007/s11018-018-1422-5/fulltext.html
http://link.springer.com/content/pdf/10.1007/s11018-018-1422-5.pdf

المؤلفون: Arsaev, I. E., Lapshin, A. I., Sargsyan, M. V., Yurchuk, E. F.

المصدر: Measurement Techniques ; volume 61, issue 3, page 290-296 ; ISSN 0543-1972 1573-8906

الاتاحة: http://dx.doi.org/10.1007/s11018-018-1423-4
http://link.springer.com/article/10.1007/s11018-018-1423-4/fulltext.html
http://link.springer.com/content/pdf/10.1007/s11018-018-1423-4.pdf

المؤلفون: Schroeder, U., Pesic, M., Schenk, T., Mulaosmanovic, H., Slesazeck, S., Ocker, J., Richter, C., Yurchuk, E., Khullar, K., Müller, J., Polakowski, P., Grimley, E.D., LeBeau, J.M., Flachowsky, S., Jansen, S., Kolodinski, S., Bentum, R. van, Kersch, A., Künneth, C., Mikolajick, T.

Relation: European Solid-State Device Research Conference (ESSDERC) 2016; 46th European Solid State Device Research Confernce, ESSDERC 2016; https://publica.fraunhofer.de/handle/publica/394591

الاتاحة: https://publica.fraunhofer.de/handle/publica/394591
https://doi.org/10.1109/ESSDERC.2016.7599662

المؤلفون: Arsaev, I. E., Bykov, V. Yu., Il’in, G. N., Yurchuk, E. F.

المصدر: Measurement Techniques ; volume 60, issue 5, page 497-504 ; ISSN 0543-1972 1573-8906

الاتاحة: http://dx.doi.org/10.1007/s11018-017-1224-1
http://link.springer.com/article/10.1007/s11018-017-1224-1/fulltext.html
http://link.springer.com/content/pdf/10.1007/s11018-017-1224-1.pdf

المؤلفون: Ocker, J., Slesazeck, S., Mikolajick, T., Buschbeck, S., Gunther, S., Yurchuk, E., Hoffmann, R., Beyer, V.

المصدر: 2015 45th European Solid State Device Research Conference (ESSDERC) ; volume 25, page 118-121

الاتاحة: http://dx.doi.org/10.1109/essderc.2015.7324727
http://xplorestaging.ieee.org/ielx7/7300344/7324696/07324727.pdf?arnumber=7324727

المؤلفون: Yurchuk, E., Mueller, S., Martin, D., Slesazeck, S., Schroeder, U., Mikolajick, T., Müller, J., Paul, J., Hoffmann, R., Sundqvist, J., Schlösser, T., Boschke, R., Bentum, R. van, Trentzsch, M.

Time: 621

Relation: International Reliability Physics Symposium (IRPS) 2014; IEEE International Reliability Physics Symposium, IRPS 2014. Vol.1; https://publica.fraunhofer.de/handle/publica/387873

الاتاحة: https://publica.fraunhofer.de/handle/publica/387873
https://doi.org/10.1109/IRPS.2014.6860603

المؤلفون: Mikolajick, T., Müller, S., Schenk, T., Yurchuk, E., Slesazeck, S., Schröder, U., Flachowsky, S., Bentum, R. van, Kolodinski, S., Polakowski, P., Müller, J.

Time: 621

Relation: Forum on New Materials 2014; International Ceramics Congress (CIMTEC) 2014; 6th Forum on New Materials 2014. Pt.C: Including: 5th International Conference - Novel functional carbon nanomaterials, 4th International Conference - Mass, charge and spin transport in inorganic materials: fundamentals to devices, International Conference - Novel non-volatile inorganic memory devices: materials, concepts and applications, 7th International Conference - Science and engineering of novel superconductors; https://publica.fraunhofer.de/handle/publica/391950

الاتاحة: https://publica.fraunhofer.de/handle/publica/391950
https://doi.org/10.4028/www.scientific.net/AST.95.136

المؤلفون: Müller, J., Polakowski, P., Riedel, S., Mueller, S., Yurchuk, E., Mikolajick, T.

Time: 621

Relation: Annual Non-Volatile Memory Technology Symposium (NVMTS) 2014; 14th Annual Non-Volatile Memory Technology Symposium, NVMTS 2014; https://publica.fraunhofer.de/handle/publica/391953

الاتاحة: https://publica.fraunhofer.de/handle/publica/391953
https://doi.org/10.1109/NVMTS.2014.7060838

المؤلفون: Yurchuk, E., Müller, J., Knebel, S., Sundqvist, J., Graham, A.P., Melde, T., Schröder, U., Mikolajick, T.

Time: 621

Relation: European Materials Research Society (EMRS Spring Meeting) 2012; Symposium L "Novel Functional Materials and Nanostructures for innovative non-volatile memory devices" 2012; E-MRS 2012 Symposium L: Novel Functional Materials and Nanostructures for innovative non-volatile memory devices; https://publica.fraunhofer.de/handle/publica/380159

الاتاحة: https://publica.fraunhofer.de/handle/publica/380159
https://doi.org/10.1016/j.tsf.2012.11.125

المؤلفون: Mueller, S., Yurchuk, E., Slesazeck, S., Mikolajick, T., Müller, J., Herrmann, T., Zaka, A.

Relation: International Symposium on Applications of Ferroelectric (ISAF) 2013; Workshop on Piezoresponse Force Microscopy (PFM) 2013; IEEE International Symposium on Applications of Ferroelectric and Workshop on Piezoresponse Force Microscopy, ISAF/PFM 2013; https://publica.fraunhofer.de/handle/publica/389345

الاتاحة: https://publica.fraunhofer.de/handle/publica/389345
https://doi.org/10.1109/ISAF.2013.6748709

المؤلفون: Müller, J., Böscke, T.S., Müller, S., Yurchuk, E., Polakowski, P., Paul, J., Martin, D., Schenk, T., Khullar, K., Kersch, A., Weinreich, W., Riedel, S., Seidel, K., Kumar, A., Arruda, T.M., Kalinin, S.V., Schlösser, T., Boschke, R., Bentum, R. van, Schröder, U., Mikolajick, T.

Time: 621

Relation: International Electron Devices Meeting (IEDM) 2013; IEEE International Electron Devices Meeting, IEDM 2013. Proceedings; https://publica.fraunhofer.de/handle/publica/383547

الاتاحة: https://publica.fraunhofer.de/handle/publica/383547
https://doi.org/10.1109/IEDM.2013.6724605

المؤلفون: Schroeder, U., Yurchuk, E., Mueller, S., Mueller, J., Slesazeck, S., Schloesser, T., Trentzsch, M., Mikolajick, T.

Time: 620

Relation: Annual Non-Volatile Memory Technology Symposium (NVMTS) 2012; 12th Annual Non-Volatile Memory Technology Symposium, NVMTS 2012; https://publica.fraunhofer.de/handle/publica/389772

الاتاحة: https://publica.fraunhofer.de/handle/publica/389772
https://doi.org/10.1109/NVMTS.2013.6632863

المؤلفون: Yurchuk, E., Müller, J., Hoffmann, R., Paul, J., Martin, D., Boschke, R., Schlösser, T., Müller, S., Slesazeck, S., Bentum, R. van, Trentzsch, M., Schröder, U., Mikolajick, T.

Time: 620

Relation: International Memory Workshop (IMW) 2012; 4th IEEE International Memory Workshop, IMW 2012; https://publica.fraunhofer.de/handle/publica/379450

الاتاحة: https://publica.fraunhofer.de/handle/publica/379450
https://doi.org/10.1109/IMW.2012.6213620

المؤلفون: Melde, T., Hoffmann, R., Yurchuk, E., Paul, J., Mikolajick, T.

المصدر: 2010 IEEE International Integrated Reliability Workshop Final Report ; volume 68, page 118-120

الاتاحة: http://dx.doi.org/10.1109/iirw.2010.5706502
http://xplorestaging.ieee.org/ielx5/5700633/5706464/05706502.pdf?arnumber=5706502

المؤلفون: Schenk, T., Yurchuk, E., Mueller, S., Schroeder, U., Starschich, Sergej, Böttger, U., Mikolajick, T.

المصدر: Applied physics reviews 1(4), 041103 (2014). doi:10.1063/1.4902396

مصطلحات موضوعية: info:eu-repo/classification/ddc/530

جغرافية الموضوع: DE

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000347159800003; info:eu-repo/semantics/altIdentifier/issn/1931-9401; info:eu-repo/semantics/altIdentifier/issn/0003-6951; https://publications.rwth-aachen.de/record/482061; https://publications.rwth-aachen.de/search?p=id:%22RWTH-2015-04613%22

الاتاحة: https://publications.rwth-aachen.de/record/482061
https://publications.rwth-aachen.de/search?p=id:%22RWTH-2015-04613%22

المؤلفون: Schroeder, U., Yurchuk, E., Müller, J., Martin, D., Schenk, T., Polakowski, P., Adelmann, C., Popovici, M.I., Kalinin, S.V., Mikolajick, T.

Time: 621, 530

Relation: Japanese journal of applied physics; https://publica.fraunhofer.de/handle/publica/241395

الاتاحة: https://publica.fraunhofer.de/handle/publica/241395
https://doi.org/10.7567/JJAP.53.08LE02

المؤلفون: Yurchuk, E., Müller, J., Paul, J., Schlösser, T., Martin, D., Hoffmann, R., Müller, S., Slesazeck, S., Schroeder, U., Boschke, R., Bentum, R. van, Mikolajick, T.

Time: 621

Relation: IEEE transactions on electron devices; https://publica.fraunhofer.de/handle/publica/237822

الاتاحة: https://publica.fraunhofer.de/handle/publica/237822
https://doi.org/10.1109/TED.2014.2354833

المؤلفون: Martin, D., Müller, J., Schenk, T., Arruda, T.M., Kumar, A., Strelcov, E., Yurchuk, E., Müller, S., Pohl, D., Schröder, U., Kalinin, S.V., Mikolajick, T.

Time: 620

Relation: Advanced Materials; https://publica.fraunhofer.de/handle/publica/238309

الاتاحة: https://publica.fraunhofer.de/handle/publica/238309
https://doi.org/10.1002/adma.201403115

المؤلفون: Schroeder, U., Martin, D., Müller, J., Yurchuk, E., Mueller, S., Adelmann, C., Schloesser, T., Bentum, R. van, Mikolajick, T.

Time: 621

Relation: ECS transactions; https://publica.fraunhofer.de/handle/publica/234950

الاتاحة: https://publica.fraunhofer.de/handle/publica/234950
https://doi.org/10.1149/05004.0015ecst