المؤلفون: Lee, Jung-Min, Kang, Chang H., Yoo, Juhn S., Hwang, Han W., Hong, Soon K., Ha, Yong M., Choi, Hyean C., Ju, Byeong-Kwon

المصدر: IEEE Transactions on Electron Devices ; volume 69, issue 9, page 4950-4957 ; ISSN 0018-9383 1557-9646

الاتاحة: http://dx.doi.org/10.1109/ted.2022.3189947
http://xplorestaging.ieee.org/ielx7/16/9864631/09830624.pdf?arnumber=9830624

المؤلفون: Pang, Huiqing, Rajan, Kamala, Silvernail, Jeff, Mandlik, Prashant, Ma, Ruiqing, Hack, Mike, Brown, Julie J., Yoo, Juhn S., Jung, Sang-Hoon, Kim, Yong-Cheol, Byun, Seung-Chan, Kim, Jong-Moo, Yoon, Soo-Young, Kim, Chang-Dong, Hwang, Yong-Kee, Chung, In-Jae, Fletcher, Mark, Green, Derek, Pangle, Mike, McIntyre, Jim, Smith, Randal D.

المساهمون: Blankenbach, Karlheinz, Chien, Liang-Chy, Lee, Sin-Doo, Wu, Ming Hsien

المصدر: SPIE Proceedings ; Advances in Display Technologies; and E-papers and Flexible Displays ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.880144

المؤلفون: Ma, Ruiqing, Rajan, Kamala, Silvernail, Jeff, Urbanik, Ken, Paynter, Jason, Mandlik, Prashant, Hack, Mike, Brown, Julie J., Yoo, Juhn S., Kim, Yong‐Chul, Kim, In‐Hwan, Byun, Seung‐Chan, Jung, Sang‐Hoon, Kim, Jong‐Moo, Yoon, Soo‐Young, Kim, Chang‐Dong, Kang, In‐Byeong, Tognoni, Keith, Anderson, Robert, Huffman, David

المصدر: SID Symposium Digest of Technical Papers ; volume 40, issue 1, page 96-99 ; ISSN 0097-966X 2168-0159

الاتاحة: http://dx.doi.org/10.1889/1.3256960
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1889%2F1.3256960
https://onlinelibrary.wiley.com/doi/full/10.1889/1.3256960

المؤلفون: Lee, Hojin, Yoo, Juhn S., Kim, Chang-Dong, Chung, In-Jae, Kanicki, Jerzy

المصدر: Japanese Journal of Applied Physics ; volume 46, issue 3S, page 1343 ; ISSN 0021-4922 1347-4065

الاتاحة: http://dx.doi.org/10.1143/jjap.46.1343
https://iopscience.iop.org/article/10.1143/JJAP.46.1343
https://iopscience.iop.org/article/10.1143/JJAP.46.1343/pdf

المؤلفون: Park, Yong In, Lee, Dae Yoon, Yoo, Juhn S., Kang, HoChul, Lim, Kyoung Moon, Kim, Chang-Dong, Chung, In-Jae

المصدر: SID Symposium Digest of Technical Papers ; volume 36, issue 1, page 341 ; ISSN 0097-966X

الاتاحة: http://dx.doi.org/10.1889/1.2036441
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1889%2F1.2036441
https://onlinelibrary.wiley.com/doi/full/10.1889/1.2036441

المؤلفون: Lim, Kyoung Moon, Lee, KyungEon, Yoo, Juhn S., Yoon, Jin-Mo, Baek, Myoung Kee, Yoo, Jae-Sung, Jung, Young-Sik, Park, JoonKyu, Lee, Seok-Woo, Kang, HoChul, Kim, Chang-Dong, Chung, In-Jae

المصدر: Solid-State Electronics ; volume 49, issue 7, page 1107-1111 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2005.04.022
https://api.elsevier.com/content/article/PII:S003811010500136X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S003811010500136X?httpAccept=text/plain

المؤلفون: Han, Sang‐Soo, Lim, Kyoung‐Moon, Yoo, Juhn S., Jeong, Young‐Sik, Lee, Kyoung‐Eon, Park, JoonKyu, Nam, Dae Hyun, Lee, Seok‐Woo, Yoon, Jin‐Mo, Jung, Yun‐Ho, Seo, Hyun Sik, Kim, Chang‐Dong

المصدر: SID Symposium Digest of Technical Papers ; volume 34, issue 1, page 208-211 ; ISSN 0097-966X 2168-0159

الاتاحة: http://dx.doi.org/10.1889/1.1832239
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1889%2F1.1832239
https://onlinelibrary.wiley.com/doi/full/10.1889/1.1832239

المؤلفون: Park, Yong In, Ahn, Tae Jun, Kim, Sung Ki, Park, Jae Yong, Yoo, Juhn S., Kim, Chang Yeon, Kim, Chang Dong

المصدر: SID Symposium Digest of Technical Papers ; volume 34, issue 1, page 487-489 ; ISSN 0097-966X 2168-0159

الاتاحة: http://dx.doi.org/10.1889/1.1832318
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1889%2F1.1832318
https://onlinelibrary.wiley.com/doi/full/10.1889/1.1832318