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المؤلفون: Fuccio Cristiano, V. Vervisch, Yannick Larmande, Pier-Francesco Fazzini, Frank Torregrosa, H. Etienne, Marc Sentis, Thierry Sarnet, Philippe Delaporte
المصدر: Applied Surface Science. 255:5647-5650
مصطلحات موضوعية: Materials science, Ion beam, Annealing (metallurgy), Doping, Analytical chemistry, General Physics and Astronomy, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Laser, Plasma-immersion ion implantation, Surfaces, Coatings and Films, law.invention, Secondary ion mass spectrometry, Ion implantation, law, Wafer
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المؤلفون: Christine Videlot-Ackermann, Catalin Constantinescu, Anne Patricia Alloncle, Yannick Larmande, Philippe Delaporte, Ludovic Rapp, Abdou Karim Diallo
المساهمون: Laboratoire Lasers, Plasmas et Procédés photoniques (LP3), Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Centre Interdisciplinaire de Nanoscience de Marseille (CINaM), Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS)
المصدر: Sensors and Actuators A: Physical
Sensors and Actuators A: Physical, Elsevier, 2015, 224, pp.111-118. ⟨10.1016/j.sna.2015.01.020⟩
Sensors and Actuators A: Physical, 2015, 224, pp.111-118. ⟨10.1016/j.sna.2015.01.020⟩مصطلحات موضوعية: [PHYS]Physics [physics], Materials science, Laser printing, business.industry, Metals and Alloys, Dielectric, Condensed Matter Physics, Laser, Fluence, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Capacitor, Transducer, Optics, law, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, Optoelectronics, Electrical and Electronic Engineering, Thin film, business, Instrumentation, Gaussian beam
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3
المؤلفون: H. Etienne, Yannick Larmande, Thierry Sarnet, V. Vervisch, Frank Torregrosa, Marc Sentis, Philippe Delaporte, G. Coustillier
المساهمون: Laboratoire Lasers, Plasmas et Procédés photoniques (LP3), Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Ion Beam Service, entreprise, Ion Beam Services, industriel, Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Ion Beam Services (IBS)
المصدر: Materials Science and Engineering: B
Materials Science and Engineering: B, Elsevier, 2012, 177 (18), pp.1628-1632. ⟨10.1016/j.mseb.2012.08.018⟩
Materials Science and Engineering: B, 2012, 177 (18), pp.1628-1632. ⟨10.1016/j.mseb.2012.08.018⟩مصطلحات موضوعية: Materials science, Annealing (metallurgy), 02 engineering and technology, medicine.disease_cause, 01 natural sciences, Optics, 0103 physical sciences, medicine, Light beam, General Materials Science, Electrical measurements, Irradiation, Penetration depth, 010302 applied physics, Photocurrent, business.industry, Mechanical Engineering, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Semiconductor, Mechanics of Materials, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, Optoelectronics, 0210 nano-technology, business, Ultraviolet
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المؤلفون: Yannick Larmande, Vanessa Vervisch, Frank Torregrosa, H. Etienne, Philippe Ch. Delaporte, Thierry Sarnet, Marc Sentis
المساهمون: Laboratoire Lasers, Plasmas et Procédés photoniques (LP3), Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Ion Beam Service, entreprise, Ion Beam Services (IBS), Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Ion Beam Services, industriel
المصدر: Applied Surface Science
Applied Surface Science, 2012, 258 (23), pp.9270-9273. ⟨10.1016/j.apsusc.2012.02.054⟩
Applied Surface Science, Elsevier, 2012, 258 (23), pp.9270-9273. ⟨10.1016/j.apsusc.2012.02.054⟩مصطلحات موضوعية: Materials science, Silicon, Passivation, General Physics and Astronomy, chemistry.chemical_element, Nanotechnology, 02 engineering and technology, 01 natural sciences, 0103 physical sciences, Electrical measurements, Silicon oxide, Sheet resistance, Diode, 010302 applied physics, Dopant, business.industry, Surfaces and Interfaces, General Chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Plasma-immersion ion implantation, Surfaces, Coatings and Films, chemistry, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, Optoelectronics, 0210 nano-technology, business