المؤلفون: F. Jamin, C. Wann, Victor Chan, N. Rovedo, J. Sudijono, C.W. Lai, L. Kim, See-Hun Yang, Elaine Hsuen Lim, Wenhe Lin, Rajesh Rengarajan, K.Y. Lim, Phung T. Nguyen, Z. Luo, Heon Lee, J. Lee, I. Yang, Hung Ng, Y.W. Teh

المصدر: Solid-State Electronics. 50:579-586

مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), chemistry.chemical_compound, Strain engineering, Silicon nitride, chemistry, law, MOSFET, Materials Chemistry, Miniaturization, Optoelectronics, Electrical and Electronic Engineering, business, AND gate, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::03b8f017101933bb174cd2b72a4afd62
https://doi.org/10.1016/j.sse.2006.03.031

المؤلفون: J. Pape, Nam-Sung Kim, Martin Ostermayr, Deleep R. Nair, Melanie J. Sherony, Craig S. Lage, Jaeger Daniel, Franck Arnaud, Y. Gao, Deok-Hyung Lee, H.S. Yang, C. Schiller, X. Chen, S. Stiffler, An L. Steegen, Kenneth J. Stein, J. Sudijono, Christopher V. Baiocco, Haoren Zhuang, Robert C. Wong, Y. Takasu, Ho-Kyu Kang, Sayeed A. Badrudduza, J. Wallner, Laegu Kang, James Chingwei Li, Aaron Thean, Y.W. Teh, L. Zhuang, R. Hasumi, S. Samavedam, D.P. Sun, Mukesh Khare

المصدر: 2008 IEEE International Electron Devices Meeting.

مصطلحات موضوعية: Contact process, Materials science, business.industry, Logic gate, Electrical engineering, Process window, Static random-access memory, business, Metal gate, Scaling, High-κ dielectric, Power (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bcc347a597544ead57bce41996b65ef0
https://doi.org/10.1109/iedm.2008.4796660

المؤلفون: C. Wann, N. Rovedo, K.Y. Lim, I. Yang, Hung Ng, Victor Chan, J. Lee, J. Sudijono, Phung T. Nguyen, Y.W. Teh, Wenhe Lin, Elaine Hsuen Lim, Heon Lee, Rajesh Rengarajan, F. Jamin, L. Kim, See-Hun Yang, C.W. Lai, Z. Luo

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

مصطلحات موضوعية: Materials science, business.industry, Transistor, Hardware_PERFORMANCEANDRELIABILITY, Dielectric, Nitride, law.invention, Reliability (semiconductor), law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Node (circuits), business, Scaling, AND gate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b9449b5444a6de313e61db146e28c56f
https://doi.org/10.1109/essder.2005.1546673

المؤلفون: Y.W. Teh

المصدر: Mathware & soft computing; Vol.: XI Núm.: 2-3

وصف الملف: text/html

Relation: http://www.raco.cat/index.php/Mathware/article/view/84903

الاتاحة: http://www.raco.cat/index.php/Mathware/article/view/84903

المؤلفون: M. Battiston, FAVARO, STEFANO, Y. W. Teh

المساهمون: M. Battiston, S. Favaro, Y.W. Teh

مصطلحات موضوعية: Bayesian nonparametric statistic, discovery probability, hierarchical Pitman-Yor proce, multi-armed bandit, species sampling model, Thompson Sampling

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000438960500044; volume:113; firstpage:455; lastpage:466; numberofpages:12; journal:JOURNAL OF THE AMERICAN STATISTICAL ASSOCIATION; http://hdl.handle.net/2318/1617243; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85047325847

الاتاحة: http://hdl.handle.net/2318/1617243
https://doi.org/10.1080/01621459.2016.1261711
https://www.tandfonline.com/doi/full/10.1080/01621459.2016.1261711

المؤلفون: M. Battiston, Y. W. Teh, FAVARO, STEFANO

المساهمون: M. Battiston, S. Favaro, Y.W. Teh

مصطلحات موضوعية: Discovery probability, Thompson Sampling, Hierarchical Pitman-Yor proce, Species sampling models

Relation: info:eu-repo/semantics/altIdentifier/isbn/9788861970618; ispartofbook:Proceedings of the 48th Scientific Meeting of the Italian Statistical Society; 48th Scientific Meeting of the Italian Statistical Society; firstpage:1; lastpage:9; numberofpages:9; http://hdl.handle.net/2318/1611616

الاتاحة: http://hdl.handle.net/2318/1611616

المؤلفون: J. Arbel, N. Nipoti, Y. W. Teh, FAVARO, STEFANO

المساهمون: J. Arbel, S. Favaro, N. Nipoti, Y.W. Teh

مصطلحات موضوعية: Bayesian nonparametrics, credible intervals, discovery probabilities

Relation: info:eu-repo/semantics/altIdentifier/isbn/9788861970618; ispartofbook:Proceedings of the 48th Scientific Meeting of the Italian Statistical Society; 48th Scientific Meeting of the Italian Statistical Society; firstpage:1; lastpage:5; numberofpages:5; http://hdl.handle.net/2318/1611615

الاتاحة: http://hdl.handle.net/2318/1611615

المؤلفون: M. De Iorio, Y. W. Teh, FAVARO, STEFANO

المساهمون: M. De Iorio, S. Favaro, Y.W. Teh

Relation: info:eu-repo/semantics/altIdentifier/isbn/9783319195186; ispartofbook:Nonparametric Bayesian inference in biostatistics; firstpage:1; lastpage:17; numberofpages:17; http://hdl.handle.net/2318/1611662; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84943423813

الاتاحة: http://hdl.handle.net/2318/1611662

المؤلفون: FAVARO, STEFANO, NIPOTI, BERNARDO, Y. W. Teh

المساهمون: S. Favaro, B.Nipoti, Y.W. Teh

مصطلحات موضوعية: Bayesian nonparametrics, discovery probability, smoothed Good– Turing estimator

Relation: info:eu-repo/semantics/altIdentifier/isbn/9788867874521; ispartofbook:Statistics and Demography: the Legacy of Corrado Gini; Statistics and Demography: the Legacy of Corrado Gini; firstpage:1; lastpage:6; numberofpages:6; http://hdl.handle.net/2318/1611623

الاتاحة: http://hdl.handle.net/2318/1611623

المؤلفون: FAVARO, STEFANO, M. Lomeli, NIPOTI, BERNARDO, Y. W. Teh

المساهمون: S. Favaro, M. Lomeli, B. Nipoti, Y.W. Teh

Relation: info:eu-repo/semantics/altIdentifier/isbn/9788864930190; ispartofbook:Proceedings of the 8th Conference on Statistical Computing and Complex Systems; Statistical computing and complex systems; firstpage:1; lastpage:6; numberofpages:6; http://hdl.handle.net/2318/1611614

الاتاحة: http://hdl.handle.net/2318/1611614

المؤلفون: FAVARO, STEFANO, M. Lomeli, Y. W. Teh

المساهمون: S. Favaro, M. Lomeli, Y.W. Teh

مصطلحات موضوعية: Bayesian nonparametrics, Normalized generalized Gamma process, Marginalized MCMC sampler, Mixture model, σ-Stable Poisson–Kingman model, Two parameter Poisson–Dirichlet process

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000349028500011; volume:25; firstpage:67; lastpage:78; numberofpages:12; journal:STATISTICS AND COMPUTING; http://hdl.handle.net/2318/155546; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84922220638; http://link.springer.com/article/10.1007/s11222-014-9499-4

الاتاحة: http://hdl.handle.net/2318/155546
https://doi.org/10.1007/s11222-014-9499-4
http://link.springer.com/article/10.1007/s11222-014-9499-4

المؤلفون: FAVARO, STEFANO, NIPOTI, BERNARDO, M. Lomeli, Y. W. Teh

المساهمون: S. Favaro, M. Lomeli, B. Nipoti, Y.W. Teh

مصطلحات موضوعية: Bayesian nonparametrics, Beta random variable, exponential tilting-functions, Gamma random variable, discrete random probability measure, sigma-stable Poisson-Kingman model, stick-breaking prior

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000341756500001; volume:8; firstpage:1063; lastpage:1085; numberofpages:23; journal:ELECTRONIC JOURNAL OF STATISTICS; http://hdl.handle.net/2318/155547; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84938891388; http://projecteuclid.org/euclid.ejs/1407243242

الاتاحة: http://hdl.handle.net/2318/155547
https://doi.org/10.1214/14-EJS921
http://projecteuclid.org/euclid.ejs/1407243242