المؤلفون: Zhongyu Wang, Jing Min, Yong Sun, Xuesong Wang, Xiuguo Chen, Zirong Tang, Shiyuan Liu

المصدر: Photoacoustics, Vol 41, Iss , Pp 100678- (2025)

مصطلحات موضوعية: Femtosecond photoacoustic, Metal nanofilms, Critical point model, Dynamic behavior, Optical properties, Physics, QC1-999, Acoustics. Sound, QC221-246, Optics. Light, QC350-467

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2213597924000958; https://doaj.org/toc/2213-5979

URL الوصول: https://doaj.org/article/a3259cfc34b241a682124f1f1d618008

المؤلفون: Jiamin Liu, Jinlong Zhu, Zhe Yu, Xianrui Feng, Zedi Li, Lei Zhong, Jinsong Zhang, Honggang Gu, Xiuguo Chen, Hao Jiang, Shiyuan Liu

المصدر: International Journal of Extreme Manufacturing, Vol 7, Iss 1, p 015601 (2024)

مصطلحات موضوعية: defect inspection, form birefringence breaking, high order difference, anisotropic illumination modes, deep-subwavelength sensitivity, defect classification, Materials of engineering and construction. Mechanics of materials, TA401-492, Industrial engineering. Management engineering, T55.4-60.8, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2631-7990

URL الوصول: https://doaj.org/article/e665f2004f634ebd80fc25d4220811ac

المؤلفون: Zhicheng Zhong, Lin Zhang, Hao Jiang, Wenqi Gong, Honggang Gu, Xiuguo Chen, Shiyuan Liu

المصدر: AIP Advances, Vol 10, Iss 10, Pp 105203-105203-8 (2020)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2158-3226

URL الوصول: https://doaj.org/article/a4bcaea0a29b4ea997f09a0aa6d6cc3c

المؤلفون: Zhicheng Zhong, Wenqi Gong, Hao Jiang, Honggang Gu, Xiuguo Chen, Shiyuan Liu

المصدر: Applied Sciences, Vol 10, Iss 5, p 1584 (2020)

مصطلحات موضوعية: parallel grating pair pulse stretcher, misalignments, spatial chirp, adjustment method, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/10/5/1584; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/8fb70e6f2fb5480098c445d294d77d1f

المؤلفون: Zhengqiong Dong, Xiuguo Chen, Xuanze Wang, Yating Shi, Hao Jiang, Shiyuan Liu

المصدر: Applied Sciences, Vol 9, Iss 19, p 4091 (2019)

مصطلحات موضوعية: optical scatterometry, inverse problem, profile reconstruction, dependence analysis, data refinement, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/9/19/4091; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/46ba07d4bfbb45f6874c6348acff7a77

المؤلفون: Hao Jiang, Zhao Ma, Honggang Gu, Xiuguo Chen, Shiyuan Liu

المصدر: Applied Sciences, Vol 9, Iss 4, p 698 (2019)

مصطلحات موضوعية: ellipsometry, volume grating, nanostructure metrology, distributed dielectric constant model, holography, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/9/4/698; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/0710b1a3d8da4834b5810ad4f04aafbe

المؤلفون: Xin Xiong, Yuki Shimizu, Xiuguo Chen, Hiraku Matsukuma, Wei Gao

المصدر: Applied Sciences, Vol 8, Iss 12, p 2539 (2018)

مصطلحات موضوعية: scale grating, Fizeau interferometer, optical encoder, pitch deviation, out-of-flatness, uncertainty, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/8/12/2539; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/d453c3c46dcd44ba876f27bda69fd7c8

المؤلفون: Chao Chen, Xiuguo Chen, Yating Shi, Honggang Gu, Hao Jiang, Shiyuan Liu

المصدر: Applied Sciences, Vol 8, Iss 12, p 2583 (2018)

مصطلحات موضوعية: ellipsometry, scatterometry, Mueller matrix, diffraction grating, inverse scattering, pitch measurement, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/8/12/2583; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/1bd1e7cc7b894e2e9ebe0bf6a5720698

المؤلفون: Yuki Shimizu, Satoshi Kataoka, Tatsuya Ishikawa, Yuan-Liu Chen, Xiuguo Chen, Hiraku Matsukuma, Wei Gao

المصدر: Sensors, Vol 18, Iss 2, p 398 (2018)

مصطلحات موضوعية: three-axis measurement, inclination, linear slide, optical angle sensor, laser autocollimation, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: http://www.mdpi.com/1424-8220/18/2/398; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/c78f3bb7e4834b9ba8e0367b79efacce

المؤلفون: Wei Gao, Xiuguo Chen, Yuanliu Chen, Yuki Shimizu, Zongwei Ren

المصدر: Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21. 2017, :113

المؤلفون: Jing Hu, Xiuguo Chen, Wenlong Chen, Shilong Yang, Yifu Wang, Zirong Tang, Shiyuan Liu

مصطلحات موضوعية: Uncategorized, Instrumentation, Measurement, and Optical Sensors

Relation: https://figshare.com/articles/journal_contribution/Supplementary_document_for_Frequency_properties_of_channeled_spectropolarimetry_an_information_theory_perspective_-_6815704_pdf/24972573

الاتاحة: https://doi.org/10.6084/m9.figshare.24972573.v2
https://figshare.com/articles/journal_contribution/Supplementary_document_for_Frequency_properties_of_channeled_spectropolarimetry_an_information_theory_perspective_-_6815704_pdf/24972573

المؤلفون: Shuo Liu, Xiuguo Chen, Tianjuan Yang, Jiahao Zhang, Shiyuan Liu

مصطلحات موضوعية: Uncategorized, Instrumentation, Measurement, and Optical Sensors

Relation: https://figshare.com/articles/journal_contribution/Supplementary_document_for_Inverse_optical_scatterometry_using_sketch-guided_deep_learning_-_7002462_pdf/25782495

الاتاحة: https://doi.org/10.6084/m9.figshare.25782495.v2
https://figshare.com/articles/journal_contribution/Supplementary_document_for_Inverse_optical_scatterometry_using_sketch-guided_deep_learning_-_7002462_pdf/25782495

المؤلفون: Jiahao Zhang, Xiuguo Chen, Tianjuan Yang, Shiyuan Liu

مصطلحات موضوعية: Uncategorized, Optical Sensors, Measurements, and Metrology

Relation: https://figshare.com/articles/journal_contribution/Supplementary_document_for_X-ray-based_overlay_metrology_using_reciprocal_space_slicing_analysis_-_6604557_pdf/24498283

الاتاحة: https://doi.org/10.6084/m9.figshare.24498283.v2
https://figshare.com/articles/journal_contribution/Supplementary_document_for_X-ray-based_overlay_metrology_using_reciprocal_space_slicing_analysis_-_6604557_pdf/24498283

المؤلفون: Xiuguo Chen, Jing Hu, Wenlong Chen, Shilong Yang, Yifu Wang, Zirong Tang, Shiyuan Liu

مصطلحات موضوعية: Uncategorized, Optical Sensors, Measurements, and Metrology

Relation: https://figshare.com/articles/journal_contribution/Supplementary_document_for_Multi-spectral_snapshot_diffraction-based_overlay_metrology_-_6449897_pdf/23260853

الاتاحة: https://doi.org/10.6084/m9.figshare.23260853.v2
https://figshare.com/articles/journal_contribution/Supplementary_document_for_Multi-spectral_snapshot_diffraction-based_overlay_metrology_-_6449897_pdf/23260853

المؤلفون: Chao Chen, Xiuguo Chen, Sheng Sheng, Zhongwen Xia, Jiacheng Shi, Wen Qiao, Shiyuan Liu

مصطلحات موضوعية: Uncategorized, Instrumentation, Measurement, and Optical Sensors

Relation: https://figshare.com/articles/journal_contribution/Supplementary_document_for_Monitoring_sidewall_tilting_of_pixelated_nanogratings_in_3D_display_-_6232217_pdf/21820131

الاتاحة: https://doi.org/10.6084/m9.figshare.21820131.v3
https://figshare.com/articles/journal_contribution/Supplementary_document_for_Monitoring_sidewall_tilting_of_pixelated_nanogratings_in_3D_display_-_6232217_pdf/21820131

المؤلفون: Chao Chen, Xiuguo Chen, Zhongwen Xia, Jiacheng Shi, Sheng Sheng, Wen Qiao, Shiyuan Liu

مصطلحات موضوعية: Uncategorized, Diffraction and Gratings

Relation: https://figshare.com/articles/journal_contribution/Supplementary_document_for_Characterization_of_pixelated_nanogratings_in_3D_holographic_display_by_imaging_Mueller_matrix_ellipsometry_-_5867297_pdf/20160470

الاتاحة: https://doi.org/10.6084/m9.figshare.20160470.v2
https://figshare.com/articles/journal_contribution/Supplementary_document_for_Characterization_of_pixelated_nanogratings_in_3D_holographic_display_by_imaging_Mueller_matrix_ellipsometry_-_5867297_pdf/20160470

المؤلفون: Sheng Sheng (10948872), Xiuguo Chen (7459694), Chao Chen (195669), Jinfeng Zhuang (11272395), Cai Wang (2604301), Honggang Gu (7459685), Shiyuan Liu (475657)

مصطلحات موضوعية: Uncategorized, Optical Sensors, Measurements, and Metrology

Relation: https://figshare.com/articles/journal_contribution/Supplementary_document_for_Eigenvalue_calibration_method_for_dual_rotating-compensator_Mueller_matrix_polarimetry_-_5388803_pdf/15164154

الاتاحة: https://doi.org/10.6084/m9.figshare.15164154.v2

المؤلفون: Cai Wang (2604301), Xiuguo Chen (7459694), Chao Chen (195669), Sheng Sheng (10948872), Lixuan Song (10948875), Honggang Gu (7459685), Hao Jiang (95017), Chuanwei Zhang (2094829), Shiyuan Liu (475657)

مصطلحات موضوعية: Uncategorized, Instrumentation, Measurement, and Optical Sensors

Relation: https://figshare.com/articles/journal_contribution/Supplementary_document_for_Reconstruction_of_finite_deep_sub-wavelength_nanostructures_by_Mueller-matrix_scattered-field_microscopy_-_5398693_pdf/16601921

الاتاحة: https://doi.org/10.6084/m9.figshare.16601921.v2

المؤلفون: Zhengfeng Guo (10586237), Honggang Gu (7459685), Mingsheng Fang (7459688), Baokun Song (6640829), Wei Wang (17594), Xiuguo Chen (7459694), Chuanwei Zhang (2094829), Hao Jiang (95017), Lin Wang (11986), Shiyuan Liu (475657)

مصطلحات موضوعية: Biophysics, Cell Biology, Science Policy, Space Science, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, giant dispersive birefringence, anisotropy, low-dimensional, Mueller matrix spectroscopic ellips., ZrTe 5, Complete Dielectric Tensor, CP, Quasi-One-Dimensional ZrTe 5 Anisotropy, quasi-one-dimensional ZrTe 5, Giant Optical Anisotropy, mechanism, novel low-symmetry materials, MMSE, device, dielectric function spectra, first-principle calculations

Relation: https://figshare.com/articles/journal_contribution/Complete_Dielectric_Tensor_and_Giant_Optical_Anisotropy_in_Quasi-One-Dimensional_ZrTe_sub_5_sub_/14402570

الاتاحة: https://doi.org/10.1021/acsmaterialslett.1c00026.s001

المؤلفون: Tianjuan Yang, Xiuguo Chen, Jiahao Zhang, Jianyuan Ma, Shiyuan Liu

المصدر: Journal of Applied Crystallography. 56:167-177

مصطلحات موضوعية: General Biochemistry, Genetics and Molecular Biology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::964ead63af0b5c587c088727a1bc97a0
https://doi.org/10.1107/s160057672201130x