المؤلفون: van der Geest, Maarten Leo Simon

المصدر: van der Geest , M L S 2023 , ' Extreme-ultraviolet and nonlinear spectroscopy of thin-film functional materials ' , PhD , Vrije Universiteit Amsterdam . https://doi.org/10.5463/thesis.356

مصطلحات موضوعية: nonlinear spectroscopy, XUV spectroscopy, XEOL, fluoresence, photoresists, lead halide perovskites, insulator-to-metal transitions, XUV transient absorption spectroscopy

وصف الملف: application/pdf

Relation: https://research.vu.nl/en/publications/96a69254-5ce7-4b4a-b3b3-002106e57a8e

الاتاحة: https://research.vu.nl/en/publications/96a69254-5ce7-4b4a-b3b3-002106e57a8e
https://doi.org/10.5463/thesis.356
https://hdl.handle.net/1871.1/96a69254-5ce7-4b4a-b3b3-002106e57a8e
https://research.vu.nl/ws/files/267507726/omslagthesisfin%20-%20651b18dd2afaa.pdf
https://research.vu.nl/ws/files/267507728/titelblada4v2%20-%2064d3555d28949.pdf