المؤلفون: Ian C Flores, Yenny L Casallas-Moreno, Ángel Sacramento, Magali Ramírez-Como, Marlene Camacho-Reynoso, Víctor Cabrera, Yuriy Kudriavtsev, Carlos Rivera-Rodríguez, Luis M Reséndiz

المصدر: Materials Research Express, Vol 11, Iss 12, p 125103 (2024)

مصطلحات موضوعية: non-fullerene acceptor stability, inverted organic solar cells (iOSC), PM6:Y7 active layer degradation, TOF-SIMS, XPS depth profiling, Materials of engineering and construction. Mechanics of materials, TA401-492, Chemical technology, TP1-1185

Relation: https://doi.org/10.1088/2053-1591/ad9c1a; https://doaj.org/toc/2053-1591; https://doaj.org/article/fed25ce239644bb28f44f4981821d2df

الاتاحة: https://doi.org/10.1088/2053-1591/ad9c1a
https://doaj.org/article/fed25ce239644bb28f44f4981821d2df

المؤلفون: Žiga Gosar, Janez Kovač, Denis Đonlagić, Simon Pevec, Gregor Primc, Ita Junkar, Alenka Vesel, Rok Zaplotnik

المصدر: Materials; Volume 13; Issue 9; Pages: 2147

مصطلحات موضوعية: PECVD, HMDSO, PDMS, extremely asymmetric CCP, OES, XPS depth profiling, dust particles

وصف الملف: application/pdf

Relation: Polymeric Materials; https://dx.doi.org/10.3390/ma13092147

الاتاحة: https://doi.org/10.3390/ma13092147

المؤلفون: Y. J. Chen, T. M. Yue, Z. N. Guo

مصطلحات موضوعية: Laser direct joining, Ti/PET interface, laser energy, XPS depth profiling, chemical bond, tensile failure load

Relation: https://zenodo.org/communities/waset; https://doi.org/10.5281/zenodo.1126078; https://doi.org/10.5281/zenodo.1126079; oai:zenodo.org:1126079

الاتاحة: https://doi.org/10.5281/zenodo.1126079

المؤلفون: Aygün, Gülnur, CantaÅŸ, Ayten, ÅžimÅŸek, Yılmaz, Turan, RaÅŸit

مصطلحات موضوعية: Hafnium oxides, Spectroscopic ellipsometer, Fourier transform infrared spectroscopy, X-ray diffraction, XPS depth profiling

جغرافية الموضوع: 10.1016/j.tsf.2010.12.189

Relation: Thin Solid Films; Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı; http://doi.org/10.1016/j.tsf.2010.12.189; http://hdl.handle.net/11147/5033; 519; 17; WOS:000292353900024; 2-s2.0-79958011897; Q3; N/A

الاتاحة: http://hdl.handle.net/11147/5033
https://doi.org/10.1016/j.tsf.2010.12.189

المؤلفون: Ackerl, Norbert, Bork, Alexander Hansen, Hauert, Roland, Müller, Eike, Rottmar, Markus

مصطلحات موضوعية: ultra-short pulsed laser ablation, surface functionalization, biomaterial, ceramic implant, XPS depth profiling, Raman mapping

Relation: Applied Surface Science--Appl. Surf. Sci.--journals:201--0169-4332; empa:24351; journal id: journals:201; ut: 000618315700001; scopus: 2-s2.0-85100104115

الاتاحة: https://doi.org/10.1016/j.apsusc.2021.149020

المؤلفون: Denis Đonlagić, Žiga Gosar, Ita Junkar, Alenka Vesel, Rok Zaplotnik, Simon Pevec, Janez Kovač, Gregor Primc

المصدر: Materials
Materials, Vol 13, Iss 2147, p 2147 (2020)
Volume 13
Issue 9

مصطلحات موضوعية: Hexamethyldisiloxane, Materials science, Plasma parameters, extremely asymmetric CCP, PECVD, Analytical chemistry, 02 engineering and technology, lcsh:Technology, 01 natural sciences, Article, chemistry.chemical_compound, XPS depth profiling, Plasma-enhanced chemical vapor deposition, PDMS, 0103 physical sciences, General Materials Science, HMDSO, Thin film, lcsh:Microscopy, lcsh:QC120-168.85, 010302 applied physics, lcsh:QH201-278.5, lcsh:T, Plasma, Partial pressure, 021001 nanoscience & nanotechnology, dust particles, OES, chemistry, lcsh:TA1-2040, Electrode, lcsh:Descriptive and experimental mechanics, Limiting oxygen concentration, lcsh:Electrical engineering. Electronics. Nuclear engineering, lcsh:Engineering (General). Civil engineering (General), 0210 nano-technology, lcsh:TK1-9971

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a5911e6553f1897424ca766082f2a73e
https://pubmed.ncbi.nlm.nih.gov/32384729

المؤلفون: Anton Manakhov, Jean-Jacques Pireaux, Lenka Zajíčková, David Nečas, Alexandre Felten, Miroslav Michlíček

المصدر: Applied Surface Science. 394:578-585

مصطلحات موضوعية: TFBA, Inorganic chemistry, Analytical chemistry, General Physics and Astronomy, 02 engineering and technology, 01 natural sciences, chemistry.chemical_compound, X-ray photoelectron spectroscopy, XPS depth profiling, 0103 physical sciences, Molecule, Derivatization, 010302 applied physics, chemistry.chemical_classification, Chemistry, Maleic anhydride, Surfaces and Interfaces, General Chemistry, Polymer, Permeation, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Amine derivatization, Surfaces, Coatings and Films, Polymerization, Amine gas treating, 0210 nano-technology, Plasma polymers, Surface reactions

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ba8a46a2fa2572b00e7ff8b2ada73a20
https://doi.org/10.1016/j.apsusc.2016.10.099

المؤلفون: Zhu, Xiaoli, Todeschini, Matteo, Bastos da Silva Fanta, Alice, Liu, Lintao, Jensen, Flemming, Hübner, Jörg, Jansen, Henri, Han, Anpan, Shi, Peixiong, Ming, Anjie, Xie, Changqing

المصدر: Zhu , X , Todeschini , M , Bastos da Silva Fanta , A , Liu , L , Jensen , F , Hübner , J , Jansen , H , Han , A , Shi , P , Ming , A & Xie , C 2018 , ' In-depth evolution of chemical states and sub-10-nm-resolution crystal orientation mapping of nanograins in Ti(5 nm)/Au(20 nm)/Cr(3 nm) tri-layer thin films ' , Applied Surface Science , vol. 453 , pp. 365-372 . https://doi.org/10.1016/j.apsusc.2018.05.042

مصطلحات موضوعية: Tri-layer thin film, XPS depth profiling, Partial oxidation of adhesion layers, Crystal orientation mapping, Transmission Kikuchi diffraction (TKD)

Relation: https://orbit.dtu.dk/en/publications/6707693d-8444-4bdb-ac1c-b6d8773148da

الاتاحة: https://orbit.dtu.dk/en/publications/6707693d-8444-4bdb-ac1c-b6d8773148da
https://doi.org/10.1016/j.apsusc.2018.05.042

المؤلفون: Oikonomou, C., Dimitrios, Nikas, Hryha, E., Nyborg, L.

المصدر: Surface and Interface Analysis. 46(10-11):1028-1032

مصطلحات موضوعية: FIB-SEM, HR SEM, Metal powder, Surface layers, Thickness determination, XPS, Depth profiling, Geometry, Ion beams, Morphology, Powder metals, X ray photoelectron spectroscopy, Experimental arrangement, FIB SEM, Homogeneous surfaces, Oxide/metal interfaces, Theoretical modeling, XPS depth profiling, Surface roughness, Materials Science, Materialvetenskap

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kau:diva-86929

المؤلفون: Mani, Prabhu Doss, Saraf, Shashank, Singh, Virendra, Real-Robert, Maria, Vijayakumar, Arun

المصدر: Scopus Export 2015-2019

مصطلحات موضوعية: Density of defects, ICP/OES chemical analysis, Ionic conductivity and its correlation, LiPON solid state electrolyte, RF reactive sputter deposition, XPS depth profiling

Relation: https://stars.library.ucf.edu/scopus2015/3311

الاتاحة: https://stars.library.ucf.edu/scopus2015/3311

المؤلفون: Ignatova, V.A., Van Den Berghe, S., Van Dyck, St., Popok, Vladimir, 1966

المصدر: Microscopy and Microanalysis. 12(5):432-437

مصطلحات موضوعية: Subatomic Physics, Subatomär fysik, Condensed Matter Physics, Den kondenserade materiens fysik, PWR steels, XPS depth profiling, XPS quantification, erosion rate calibration

URL الوصول: https://gup.ub.gu.se/publication/63009

المؤلفون: Y. Simsek, Rasit Turan, Ayten Cantas, Gulnur Aygun

المساهمون: TR39698, Aygün, Gülnur, Cantaş, Ayten, Şimşek, Yılmaz, Izmir Institute of Technology. Physics

مصطلحات موضوعية: Suboxide, Materials science, Metals and Alloys, Analytical chemistry, Fourier transform infrared spectroscopy, Surfaces and Interfaces, Substrate (electronics), Sputter deposition, Spectroscopic ellipsometer, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, X-ray diffraction, X-ray photoelectron spectroscopy, Hafnium oxides, XPS depth profiling, Ellipsometry, Sputtering, Materials Chemistry, Thin film

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c23344cb4485e667d90f2634d1c574b4
http://hdl.handle.net/11147/5033

المؤلفون: Seelmann-Eggebert, M.

مصطلحات موضوعية: electro-chemical reaction on HgCdTe, elektrochemische Reaktion von HgCdTe, Tiefenprofil mit XPS, XPD, XPS depth profiling

Time: 621, 667, 533

Relation: Journal of vacuum science and technology B. Microelectronics and nanometer structures; https://publica.fraunhofer.de/handle/publica/181813

الاتاحة: https://publica.fraunhofer.de/handle/publica/181813
https://doi.org/10.1116/1.586280