المؤلفون: Kim, Jung-Hun, Park, Ji-Eun, Ji, In-Hee, Won, Chul-Ho, Lee, Jong-Min, Jo, Jin-Ho, Park, Yu-Jin, Nah, Jae-wook

المساهمون: Gómez, Carlos, Schwarzacher, Severin P.

المصدر: Technology and Health Care ; volume 27, page 165-173 ; ISSN 0928-7329 1878-7401

الاتاحة: https://doi.org/10.3233/thc-199016
https://content.iospress.com/download?id=10.3233/THC-199016

المؤلفون: Im, Ki-Sik, Atmaca, Gokhan, Won, Chul-Ho, Caulmilone, Raphael, Cristoloveanu, Sorin, Kim, Yong-Tae, Lee, Jung-Hee

المصدر: IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY 6(1) 354-359

Relation: https://aperta.ulakbim.gov.tr/record/110700; oai:zenodo.org:110700

الاتاحة: https://aperta.ulakbim.gov.tr/record/110700

المؤلفون: Bhuiyan, Maruf A., Zhou, Hong, Chang, Sung-Jae, Lou, Xiabing, Gong, Xian, Jiang, Rong, Gong, Huiqi, Zhang, En Xia, Won, Chul-Ho, Lim, Jong-Won, Lee, Jung-Hee, Gordon, Roy G., Reed, Robert A., Fleetwood, Daniel M., Ye, Peide, Ma, Tso-Ping

المساهمون: DTRA, Center for the Next Generation of Materials by Design, an Energy Frontier Research Center, U.S. DOE, Office of Science, ETRI, Institute for Information and Communications Technology Promotion, Korea Government (MSIP), Semiconductor Industry Collaborative Project between Kyungpook National University and Samsung Electronics Co. Ltd., Air Force Office of Sponsored Research under the Hi-REV Program

المصدر: IEEE Transactions on Nuclear Science ; volume 65, issue 1, page 46-52 ; ISSN 0018-9499 1558-1578

الاتاحة: http://dx.doi.org/10.1109/tns.2017.2774928
http://ieeexplore.ieee.org/ielaam/23/8263287/8114245-aam.pdf
http://xplorestaging.ieee.org/ielx7/23/8263287/08114245.pdf?arnumber=8114245

المؤلفون: Dong, Yan, Wang, Rui, Xie, Zili, Liu, Yanli, Lei, Jianming, Guo, Hui, Dai, Quan, Kim, Jeong-Gil, Kang, Seung-Hyeon, Won, Chul-Ho, Lee, Jung-Hee, Chen, Dunjun, Zhang, Rong, Zheng, Youdou

المساهمون: NSFC, National Natural Science Foundation of China, Jiangsu Provincial Department of Water Resources, China, Natural Science Foundation of China, Postdoctoral Foundation of Jiangsu Provence, Yantai Key Research and Development Program

المصدر: IEEE Sensors Journal ; volume 21, issue 8, page 9771-9776 ; ISSN 1530-437X 1558-1748 2379-9153

الاتاحة: http://dx.doi.org/10.1109/jsen.2020.3047204
http://xplorestaging.ieee.org/ielx7/7361/9379974/09306824.pdf?arnumber=9306824

المؤلفون: YOON, Ki-Won, WOO, Sang-Hyo, LEE, Jyung-Hyun, YOON, Young-Ho, KIM, Min-Kyu, WON, Chul-Ho, CHOI, Hyun-Chul, CHO, Jin-Ho

المصدر: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences; Vol. E89-A, No. 6 June 2006; 1699-1700

وصف الملف: application/pdf

Relation: http://journals.fcla.edu/ietfec-a/article/view/16657/16323; http://journals.fcla.edu/ietfec-a/article/view/16657

الاتاحة: http://journals.fcla.edu/ietfec-a/article/view/16657

المؤلفون: YOON, Young-Ho, LIM, Hyung-Gyu, LEE, Jyung-Hyun, PARK, Hee-Joon, PARK, Il-Yong, KIM, Min-Kyu, WON, Chul-Ho, SONG, Byung-Seop, CHO, Jin-Ho

المصدر: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences; Vol. E89-A, No. 6 June 2006; 1695-1698

وصف الملف: application/pdf

Relation: http://journals.fcla.edu/ietfec-a/article/view/16656/16322; http://journals.fcla.edu/ietfec-a/article/view/16656

الاتاحة: http://journals.fcla.edu/ietfec-a/article/view/16656

المؤلفون: WON, Chul Ho, KIM, Dong Hun, LEE, Jung Hyun, YOON, Ki Won, WOO, Sang Hyo, YOON, Young Ho, KIM, Min Kyu, CHO, Jin Ho

المصدر: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences; Vol. E89-A, No. 6 June 2006; 1727-1729

وصف الملف: application/pdf

Relation: http://journals.fcla.edu/ietfec-a/article/view/16665/16331; http://journals.fcla.edu/ietfec-a/article/view/16665

الاتاحة: http://journals.fcla.edu/ietfec-a/article/view/16665

المؤلفون: PARK, Hee-Joon, LEE, Jyung-Hyun, MOON, Yeon-Kwan, YOON, Young-Ho, WON, Chul-Ho, CHOI, Hyun-Chul, CHO, Jin-Ho

المصدر: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences; Vol. E88-A, No. 6 June 2005; 1476-1480

وصف الملف: application/pdf

Relation: http://journals.fcla.edu/ietfec-a/article/view/16159/15825; http://journals.fcla.edu/ietfec-a/article/view/16159

الاتاحة: http://journals.fcla.edu/ietfec-a/article/view/16159

المؤلفون: Lee, Sang-Heon, Sohn, Myoung-Kyu, Kim, Byungmin, Lee, Jangwoo, Park, Chiho, Won, Chul-Ho

Relation: http://hdl.handle.net/20.500.11750/47456; 2-s2.0-84871971153; 24th International Conference on Computer Applications in Industry and Engineering, CAINE 2011, pp.248 - 250

الاتاحة: https://hdl.handle.net/20.500.11750/47456

المؤلفون: Son, Dong-Hyeok, Jo, Young-Woo, Won, Chul-Ho, Lee, Jun-Hyeok, Seo, Jae Hwa, Lee, Sang-Heung, Lim, Jong-Won, Kim, Ji Heon, Kang, In Man, Cristoloveanu, Sorin, Lee, Jung-Hee

المساهمون: Kyungpook National University Daegu (KNU), Electronics and Telecommunications Research Institute DaeJeon (ETRI), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )

المصدر: ISSN: 0038-1101 ; Solid-State Electronics ; https://hal.science/hal-02003328 ; Solid-State Electronics, 2018, 141, pp.7-12. ⟨10.1016/j.sse.2017.11.002⟩.

مصطلحات موضوعية: Normally-off, Gate recess, Self-terminating wet etching TMAH solution, Negligible hysteresis, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

الاتاحة: https://hal.science/hal-02003328
https://doi.org/10.1016/j.sse.2017.11.002

المؤلفون: Won, Chul-Ho, Caulmilone, Raphaël, Cristoloveanu, Sorin, Im, Ki-Sik, Lee, Jung-Hee

المساهمون: Kyungpook National University Daegu (KNU), Silicon-on-Insulator Technologies (SOITEC), Parc Technologique des Fontaines, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )

المصدر: ISSN: 1862-6300.

مصطلحات موضوعية: aluminum gallium nitride/gallium nitride, gallium nitride‐on‐insulator, gate‐all‐around, gate controllability, nanowire, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

الاتاحة: https://hal.science/hal-02006973
https://doi.org/10.1002/pssa.201700654

المؤلفون: Son, Dong Hyeok, Jo, Young Woo, Seo, Jae Hwa, Won, Chul Ho, Im, Ki Sik, Lee, Yong Soo, Jang, Hwan Soo, Kim, Dae Hyun, Kang, In Man, Lee, Jung Hee

مصطلحات موضوعية: PERFORMANCE, SILICON, CHANNEL

Relation: http://hdl.handle.net/20.500.11750/13180; 2-s2.0-85045019412; Solid-State Electronics, v.145, pp.1 - 7

الاتاحة: https://hdl.handle.net/20.500.11750/13180
https://doi.org/10.1016/j.sse.2018.03.001

المؤلفون: Dong, Yan, Son, Dong-hyeok, Dai, Quan, Lee, Jun-Hyeok, Won, Chul-Ho, Kim, Jeong-Gil, Kang, Seung-Hyeon, Lee, Jung-Hee, Chen, Dunjun, Lu, Hai, Zhang, Rong, Zheng, Youdou

المساهمون: Kyungpook National University, Ministry of Education, Government of Jiangsu Province, China Scholarship Council, National Key Research and Development Program of China, Samsung

المصدر: Sensors and Actuators B: Chemical ; volume 260, page 134-139 ; ISSN 0925-4005

الاتاحة: http://dx.doi.org/10.1016/j.snb.2017.12.188
https://api.elsevier.com/content/article/PII:S0925400517325248?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0925400517325248?httpAccept=text/plain

المؤلفون: Vodapally, Sindhuri, Won, Chul-Ho, Cho, In-Tak, Lee, Jong-Ho, Bae, Youngho, Cristoloveanu, Sorin, Im, Ki-Sik, Lee, Jung-Hee

المصدر: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ; page 44-47

الاتاحة: http://dx.doi.org/10.1109/ulis.2016.7440048
http://xplorestaging.ieee.org/ielx7/7435614/7440031/7440048.pdf?arnumber=7440048

المؤلفون: Im, Ki-Sik, Won, Chul-Ho, Seo, Jae Hwa, Kang, In Man, Vodapally, Sindhuri, Lee, Yong Soo, Lee, Jung-Hee, Kim, Yong-Tae, Cristoloveanu, Sorin

المساهمون: Kyungpook National University Daegu (KNU), Korea Advanced Institute of Science and Technology (KAIST), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )

المصدر: 2016 ESSDERC Proceedings
2016 ESSDERC - 46th European Solid-State Device Research Conference
https://hal.science/hal-02006267
2016 ESSDERC - 46th European Solid-State Device Research Conference, Sep 2016, Lausanne, Switzerland. pp.323-326, ⟨10.1109/ESSDERC.2016.7599651⟩

مصطلحات موضوعية: Omega-gate, 2DEG, TMAH, MISHFET, FinFET, Nanowire, AlGaN/GaN, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Lausanne, Switzerland

الاتاحة: https://hal.science/hal-02006267
https://doi.org/10.1109/ESSDERC.2016.7599651

المؤلفون: Kim, Jeong‐Gil, Im, Ki‐Sik, Won, Chul‐Ho, Kang, Seung‐Hyeon, Lee, Sang‐Heung, Lim, Jong‐Won, Kim, Ji Heon, Lee, Jung‐Hee

المساهمون: Ministry of Education

المصدر: physica status solidi (b) ; volume 254, issue 8 ; ISSN 0370-1972 1521-3951

الاتاحة: http://dx.doi.org/10.1002/pssb.201600731
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fpssb.201600731
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssb.201600731

المؤلفون: Cho, Min Su, Kwon, Ra Hee, Seo, Jae Hwa, Yoon, Young Jun, Jang, Young In, Won, Chul-Ho, Kim, Jeong-Gil, Lee, Junsoo, Cho, Seongjae, Lee, Jung-Hee, Kang, In Man

المصدر: Journal of Nanoscience and Nanotechnology ; volume 17, issue 11, page 8355-8359 ; ISSN 1533-4880

الاتاحة: http://dx.doi.org/10.1166/jnn.2017.15134
http://www.ingentaconnect.com/content/asp/jnn/2017/00000017/00000011/art00094

المؤلفون: Kang, Sang-Bum, Lee, Chang-Ju, Won, Chul-Ho, Koo, Yi-Sak, Lee, Jung-Hee, Hahm, Sung-Ho, Hong, Seul-Ki, Cho, Byung-Jin

المصدر: 2015 International Conference on Quality in Research (QiR) ; page 30-33

الاتاحة: http://dx.doi.org/10.1109/qir.2015.7374889
http://xplorestaging.ieee.org/ielx7/7369417/7374873/07374889.pdf?arnumber=7374889

المؤلفون: Kang, SB Kang, Sang-Bum, Hahm, SH Hahm, Sung-Ho, Lee, CJ Lee, Chang-Ju, Koo, YS Koo, Yi-Sak, Won, CH Won, Chul-Ho, Hong, SK Hong, Seul Ki, Cho, BJ Cho, Byung-Jin, Lee, JH Lee, Jung-Hee

الاتاحة: http://hdl.handle.net/10203/198656