المؤلفون: Soares, C. S., Furtado, G. F., Rossetto, A. C. J., Wirth, G. I., Vasileska, D.

المساهمون: Coordenação de Aperfeiçoamento de Pessoal de Nível Superior - Brasil, Conselho Nacional de Desenvolvimento Científico e Tecnológico

المصدر: Journal of Computational Electronics ; volume 23, issue 2, page 257-266 ; ISSN 1569-8025 1572-8137

الاتاحة: http://dx.doi.org/10.1007/s10825-024-02145-w
https://link.springer.com/content/pdf/10.1007/s10825-024-02145-w.pdf
https://link.springer.com/article/10.1007/s10825-024-02145-w/fulltext.html

المؤلفون: Hilleringmann, U., Assion, F., Vidor, F. F., Wirth, G. I.

المصدر: Journal of Machine to Machine Communications ; volume 1, issue 3, page 197-214 ; ISSN 2246-137X

الاتاحة: http://dx.doi.org/10.13052/jmmc2246-137x.131
http://riverpublishers.com/journal_read_html_article.php?j=JMMC/1/3/1

المؤلفون: Vidor, F. F., Wirth, G. I., Meyers, T., Reker, J., Hilleringmann, U.

المصدر: 2017 IEEE AFRICON ; page 644-648

الاتاحة: http://dx.doi.org/10.1109/afrcon.2017.8095558
http://xplorestaging.ieee.org/ielx7/8085624/8095433/08095558.pdf?arnumber=8095558

المؤلفون: Vidor, F. F., Meyers, T., Hilleringmann, U., Wirth, G. I.

المصدر: 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO)

الاتاحة: http://dx.doi.org/10.1109/nano.2015.7388836
http://xplorestaging.ieee.org/ielx7/7383413/7388616/07388836.pdf?arnumber=7388836

المؤلفون: Toledano-Luque, M, Kaczer, B, Roussel, Ph. J, Grasser, T, Wirth, G. I, Franco, Jacopo, Vrancken, C, Horiguchi, N, Groeseneken, Guido

مصطلحات موضوعية: negative bias temperature instability, constant voltage stress, ac stress, mosfet, reliability, variability, sion, kinetics, mosfets

Relation: 2011 ieee international reliability physics symposium (irps) pages:-; 49th Annual IEEE International Reliability Physics Symposium (IRPS) Monterey, CA, APR 10-14, 2011; https://lirias.kuleuven.be/handle/123456789/332367

الاتاحة: https://lirias.kuleuven.be/handle/123456789/332367

المؤلفون: Hilleringmann, U., Wolff, K., Assion, F., Vidor, F. F., Wirth, G. I.

المصدر: IEEE Africon '11 ; page 1-6

الاتاحة: http://dx.doi.org/10.1109/afrcon.2011.6071983
http://xplorestaging.ieee.org/ielx5/6062325/6071956/06071983.pdf?arnumber=6071983

المؤلفون: Glösekötter, P., Greveler, U., Wirth, G. I.

Relation: https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/8140

الاتاحة: https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/8140

المؤلفون: Brusamarello, L., Wirth, G. I., Camargo, V., da Silva, M., da Silva, R., Glösekötter, P.

Relation: https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/8138

الاتاحة: https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/8138

المؤلفون: Glösekötter, P., Berekovic, M., Wirth, G. I.

Relation: https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/8141

الاتاحة: https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/8141

المؤلفون: Glösekötter, P., Pacha, C., Goser, K. F., Wirth, G. I., Prost, W., Auer, U., Agethen, M., Tegude, F. J.

Relation: https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/8153

الاتاحة: https://www.hb.fh-muenster.de/opus4/frontdoor/index/index/docId/8153

المؤلفون: da Silva, M. B., Kaczer, B., Van der Plas, G., Wirth, G. I., Groeseneken, G.

المصدر: 2011 IEEE International Integrated Reliability Workshop Final Report; 1/ 1/2011, p90-93, 4p

المؤلفون: Wirth, G. I., Vieira, M. G., Lima Kastensmidt, F. G.

المصدر: IET Circuits, Devices & Systems (Institution of Engineering & Technology); Apr2007, Vol. 1 Issue 2, p137-142, 6p, 3 Diagrams, 4 Graphs

مصطلحات موضوعية: COMPLEMENTARY metal oxide semiconductors, COMPUTER-aided design, ELECTRONICS, SEMICONDUCTORS, ELECTRIC conductivity

المؤلفون: Hilleringmann, U., Wolff, K., Assion, F., Fábio Fedrizzi Vidor, Wirth, G. I.

المصدر: Scopus-Elsevier

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4fec68755c835fd3a99b7ce10e5777b1
http://www.scopus.com/inward/record.url?eid=2-s2.0-85064685109&partnerID=MN8TOARS

المؤلفون: Kaczer, B., Toledano-Luque, M., Franco, J., Grasser, T., Roussel, J., Camargo, V. V. A., Mahato, S., Simoen, E., Catthoor, F., Wirth, G. I., Groeseneken, G.

المصدر: 2011 IEEE International Integrated Reliability Workshop Final Report; 1/ 1/2011, p32-32, 1p