المؤلفون: Wiatr, M., Jasik, P., Kilich, T., Sienkiewicz, J. E., Stoll, H.

مصطلحات موضوعية: Physics - Chemical Physics

URL الوصول: http://arxiv.org/abs/1703.03394

المؤلفون: Murawska-Cialowicz, E, Wiatr, M, Cialowicz, M, Assis, GG, Borowicz, W, Rocha-Rodrigues, S, Paprocka-Borowicz, M, Marques, A

المساهمون: Instituto de Investigação e Inovação em Saúde

مصطلحات موضوعية: BDNF, Cognition, Depression, Exercise training, Mood, Myokines, Physical activity, Theories of depression

وصف الملف: application/pdf

Relation: International Journal of Environmental Research and Public Health, vol.18(14):7553; https://www.mdpi.com/1660-4601/18/14/7553; https://hdl.handle.net/10216/153724

الاتاحة: https://hdl.handle.net/10216/153724
https://doi.org/10.3390/ijerph18147553

المؤلفون: Hirler, Alexander, Biba, Josef, Lipp, D., Lochner, H., Siddabathula, M., Simon, S., Sulima, Torsten, Wiatr, M., Hansch, Walter

المصدر: Hirler, Alexander; Biba, Josef; Lipp, D.; Lochner, H.; Siddabathula, M.; Simon, S.; Sulima, Torsten; Wiatr, M.; Hansch, Walter: Experimental Reliability Study of Cumulative Damage Models on State-of-the-Art Semiconductor Technologies for Step-Stress Tests and Misson Profile Stresses. In: Journal of Vacuum Science & Technology B Jg. 38 (2020) H. 6, S. 064001, DOI:10.1116/6.0000504

Relation: http://athene-forschung.unibw.de/node?id=134813; https://doi.org/10.1116/6.0000504

الاتاحة: http://athene-forschung.unibw.de/node?id=134813
https://doi.org/10.1116/6.0000504

المؤلفون: Schwinge, Caroline, Kühnel, Kati, Emara, Jennifer Salah, Roy, Lisa, Biedermann, Kati, Weinreich, Wenke, Kolodinski, S., Wiatr, M., Gerlach, G., Wagner-Reetz, Maik

Relation: Applied Physics Letters; https://publica.fraunhofer.de/handle/publica/434518

الاتاحة: https://publica.fraunhofer.de/handle/publica/434518
https://doi.org/10.1063/5.0076945

المؤلفون: Strachinaru, M., Romano, G., Tantawy, AA., Forsha, D., Pavasini, R., Porpaczy, A., Kaznica-Wiatr, M., Mccall, PJ., Faber, L., Sciatti, E., Monte, IP., Capotosto, L., Park, CS., Geleijnse, ML., Bosch, JG., De Jong, N., Van Der Steen, AFW, Van Dalen, BM., Vos, HJ., Magro, S., Mina', C., Novo, G., Dell'oglio, S., Falletta, C., Di Gesaro, G., Clemenza, F., Bellavia, D., Habeeb, N., El Sherif, NHK, Abdelhamid, AE., Li, L., Joseph, N., Kutty, S., Freidberg, MK., Cirillo, C., Mordi, I., Grapsa, J., Tzemos, N., Nogradi, A., Strenner, M., Minier, T., Czirjak, L., Komocsi, A., Faludi, R., Nowacka, M., Kopec, G., Waligora, M., Olszowska, M., Podolec, P., Sonecki, P.

المصدر: European Heart Journal – Cardiovascular Imaging ; volume 17, issue suppl 2, page ii242-ii245 ; ISSN 2047-2404 2047-2412

الاتاحة: https://doi.org/10.1093/ehjci/jew262.003
http://academic.oup.com/ehjcimaging/article-pdf/17/suppl_2/ii242/9988343/jew262.003.pdf

المؤلفون: Mart, C., Abdulazhanov, S., Czernohorsky, M., Kämpfe, T., Lehninger, D., Falidas, K., Eßlinger, S., Kühnel, K., Oehler, S., Rudolph, M., Wiatr, M., Kolodinski, S., Seidel, R., Weinreich, W., Eng, L.M.

Time: 621

Relation: International Electron Devices Meeting (IEDM) 2020; 66th IEEE International Electron Devices Meeting, IEDM 2020; https://publica.fraunhofer.de/handle/publica/412135

الاتاحة: https://publica.fraunhofer.de/handle/publica/412135
https://doi.org/10.1109/IEDM13553.2020.9371967

المؤلفون: Mart, C., Kämpfe, T., Kühnel, K., Czernohorsky, M., Kolodinski, S., Wiatr, M., Weinreich, W., Eng, L.M.

Time: 621

Relation: APL materials; https://publica.fraunhofer.de/handle/publica/268864

الاتاحة: https://publica.fraunhofer.de/handle/publica/268864
https://doi.org/10.1063/5.0051329

المؤلفون: Podolec, P., Kaznica-Wiatr, M., Hlawaty, M., Wilkolek, P., Podolec, Z., Kopec, G., Tracz, W.

مصطلحات موضوعية: Abstracts

وصف الملف: text/html

Relation: http://eurjhfsupp.oxfordjournals.org/cgi/content/short/5/Suppl/171; http://dx.doi.org/10.1016/S1567-4215(06)80483-2

الاتاحة: http://eurjhfsupp.oxfordjournals.org/cgi/content/short/5/Suppl/171
https://doi.org/10.1016/S1567-4215(06)80483-2

المؤلفون: Kaznica-Wiatr, M., Podolec, P., Hlawaty, M., Wilkolek, P., Kopec, G., Tracz, W.

مصطلحات موضوعية: ORAL SESSION: Assessment of pulmonary hypertension: THE RIGHT HEART

وصف الملف: text/html

Relation: http://ejechocard.oxfordjournals.org/cgi/content/short/7/suppl_1/S217-b; http://dx.doi.org/10.1016/S1525-2167(06)60807-X

الاتاحة: http://ejechocard.oxfordjournals.org/cgi/content/short/7/suppl_1/S217-b
https://doi.org/10.1016/S1525-2167(06)60807-X

المؤلفون: Mart, C., Kämpfe, T., Czernohorsky, M., Eßlinger, S., Kolodinski, S., Wiatr, M., Weinreich, W., Eng, L.M.

Time: 621

Relation: Applied Physics Letters; https://publica.fraunhofer.de/handle/publica/265847

الاتاحة: https://publica.fraunhofer.de/handle/publica/265847
https://doi.org/10.1063/5.0012746

المؤلفون: Podolec, P., Kaznica-Wiatr, M., Wilkolek, P., Kroshin, M., Hlawaty, M., Tracz, W.

مصطلحات موضوعية: Poster session 1: THE RIGHT HEART

وصف الملف: text/html

Relation: http://ehjcimaging.oxfordjournals.org/cgi/content/short/6/suppl_1/S26-c; http://dx.doi.org/10.1016/S1525-2167(05)80101-5

الاتاحة: http://ehjcimaging.oxfordjournals.org/cgi/content/short/6/suppl_1/S26-c
https://doi.org/10.1016/S1525-2167(05)80101-5

المؤلفون: Andrieu, F., Pirro, L., Berthelon, R., Morgan, J., Cibrario, G., Wiatr, M., Hoentschel, J., Vinet, M.

المصدر: 2018 IEEE Symposium on VLSI Technology ; page 153-154

الاتاحة: http://dx.doi.org/10.1109/vlsit.2018.8510636
http://xplorestaging.ieee.org/ielx7/8481640/8510617/08510636.pdf?arnumber=8510636

المؤلفون: Andrieu, F., Pirro, L., Berthelon, Rémy, Morgan, J., Cibrario, G., Wiatr, M., Hoentschel, J., Vinet, M.

المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), GLOBALFOUNDRIES, fab 1, STMicroelectronics

المصدر: 2018 IEEE Symposium on VLSI Technology and Circuits
2018 IEEE Symposium on VLSI Technology and Circuits, Jun 2018, Honolulu, United States. pp.153-154, ⟨10.1109/VLSIT.2018.8510636⟩

مصطلحات موضوعية: [SPI]Engineering Sciences [physics]

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::6d301d95409daa4b6f1ffb496e87e349
https://hal-cea.archives-ouvertes.fr/cea-02188622

المؤلفون: Wiatr, M., Jasik, P., Kilich, T., Sienkiewicz, J.E., Stoll, H.

المصدر: Chemical Physics ; volume 500, page 80-87 ; ISSN 0301-0104

الاتاحة: http://dx.doi.org/10.1016/j.chemphys.2017.10.005
https://api.elsevier.com/content/article/PII:S030101041730602X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S030101041730602X?httpAccept=text/plain

المؤلفون: Hirler, A., Biba, J., Lipp, D., Lochner, H., Siddabathula, M., Simon, S., Sulima, T., Wiatr, M., Hansch, W.

المصدر: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Nov2020, Vol. 38 Issue 6, p1-9, 9p

مصطلحات موضوعية: DAMAGE models, ACCELERATED life testing, SEMICONDUCTOR technology, DIELECTRIC breakdown, SEMICONDUCTOR devices, RANDOM variables, STRAIN energy

المؤلفون: Wulf, U., Kučera, J., Richter, H., Wiatr, M., Höntschel, J.

المصدر: Thin Solid Films ; volume 613, page 6-10 ; ISSN 0040-6090

الاتاحة: http://dx.doi.org/10.1016/j.tsf.2015.09.041
https://api.elsevier.com/content/article/PII:S0040609015009190?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0040609015009190?httpAccept=text/plain

المؤلفون: Hoentschel, J., Shiang Yang Ong, Balzer, T., Sassiat, N., Ran Yan, Herrmann, T., Flachowsky, S., Grass, C., Beyer, S., Kallensee, O., Yu-Yin Lin, Shickova, A., Muehlhoff, A., Kretzschmar, C., Winkler, J., Wiatr, M., Horstmann, M.

المصدر: 2013 14th International Conference on Ultimate Integration on Silicon (ULIS) ; page 37-40

الاتاحة: http://dx.doi.org/10.1109/ulis.2013.6523485
http://xplorestaging.ieee.org/ielx7/6520920/6523476/06523485.pdf?arnumber=6523485

المؤلفون: Ellinger, F., Mikolajik, T., Fettweis, G., Hentschel, D., Kolodinski, S., Warnecke, H., Reppe, T., Tzschoppe, C., Dohl, J., Carta, C., Fritsche, D., Wiatr, M., Kronholz, S.D., Mikalo, R.P., Heinrich, H., Paulo, R., Wolf, R., Hubner, J., Waltsgott, J., Meissner, K., Richter, R., Bausinger, M., Mehlich, H., Hahmann, M., Moller, H., Wiemer, M., Holland, H.-J., Gartner, R., Schubert, S., Richter, A., Strobel, A., Fehske, A., Cech, S., Assmann, U., Hoppner, S., Walter, D., Eisenreich, H., Schuffny, R.

Relation: International Semiconductor Conference Dresden-Grenoble (ISCDG) 2012; International Semiconductor Conference Dresden-Grenoble, ISCDG 2012; https://publica.fraunhofer.de/handle/publica/379356

الاتاحة: https://publica.fraunhofer.de/handle/publica/379356
https://doi.org/10.1109/ISCDG.2012.6360004

المؤلفون: Wiatr, M, Jasik, P, Sienkiewicz, J E

المصدر: Physica Scripta ; volume 90, issue 5, page 054012 ; ISSN 0031-8949 1402-4896

الاتاحة: http://dx.doi.org/10.1088/0031-8949/90/5/054012
http://stacks.iop.org/1402-4896/90/i=5/a=054012/pdf
http://stacks.iop.org/1402-4896/90/i=5/a=054012?key=crossref.cd62709ce20db2d63418e4b125b1c549

المؤلفون: Wiatr, M. A., Heller, R., Hoentschel, J., Geilenkeuser, R., Wong, S. J., Shah, V., Mantei, T., Majer, M., Pruefer, E., Scott, C., Rodes, T., Wieczorek, K., Horstmann, M., Greenlaw, D.

المصدر: 2009 IEEE International Reliability Physics Symposium ; page 266-272 ; ISSN 1541-7026

الاتاحة: http://dx.doi.org/10.1109/irps.2009.5173261
http://xplorestaging.ieee.org/ielx5/5164157/5173200/05173261.pdf?arnumber=5173261