المؤلفون: Heesu Lee, Seungjin Hwang, Hong Jin Kong, Kyung Hee Hong, Tae Jun Yu

المصدر: Sensors, Vol 24, Iss 1, p 17 (2023)

مصطلحات موضوعية: white light interferometer, scanning white light interferometer, group refractive index dispersion, thickness, fused silica, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/24/1/17; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/6ed5be6b9df54ba0a576b2c961089d11

المؤلفون: REN De-jun, LI Rui, WANG Ming-lian, LIU Jiu-shan

المصدر: Cailiao gongcheng, Vol 47, Iss 3, Pp 79-86 (2019)

مصطلحات موضوعية: magnetorheological elastomer, metallurgical microscope, white light interferometer, surface roughness, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

Relation: http://jme.biam.ac.cn/CN/Y2019/V47/I3/79; https://doaj.org/toc/1001-4381

URL الوصول: https://doaj.org/article/be2f769a4b764aabaa7bbaf2eab2737e

المؤلفون: Hiromasa Suzuki, Masato Kon, Seiji Sasaki, Taro Watanabe, Tatsuya Yatagawa, Yutaka Ohtake, 今 正人, 佐々木 誠治, 大竹 豊, 渡部 太郎, 谷田川 達也, 鈴木 宏正

المصدر: Proceedings of JSPE Semestrial Meeting. 2022, :313

المؤلفون: Haruhiko Ohashi, Hidekazu Mimura, Hikaru Kishimoto, Takashi Kimura, Takenori Shimamura, Yasunori Senba, Yoko Takeo, 三村 秀和, 仙波 泰徳, 大橋 治彦, 岸本 輝, 島村 勇徳, 木村 隆志, 竹尾 陽子

المصدر: Proceedings of JSPE Semestrial Meeting. 2021, :543

المؤلفون: Sysoev Evgeny, Kosolobov Sergey, Kulikov Rodion, Latyshev Alexander, Sitnikov Sergey, Vykhristyuk Ignat

المصدر: Measurement Science Review, Vol 17, Iss 5, Pp 213-218 (2017)

مصطلحات موضوعية: nanorelief, monatomic steps, low-coherence, white light interferometer, subnanometer resolution, Mathematics, QA1-939

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1335-8871

URL الوصول: https://doaj.org/article/eb16457b055b4008a5d114ef392f399b

المؤلفون: Pawlus Paweł, Reizer Rafał, Wieczorowski Michał

المصدر: Metrology and Measurement Systems, Vol 24, Iss 3, Pp 525-536 (2017)

مصطلحات موضوعية: surface texture measurements, optical method, non-measured points, white light interferometer, Technology

وصف الملف: electronic resource

Relation: http://www.degruyter.com/view/j/mms.2017.24.issue-3/mms-2017-0046/mms-2017-0046.xml?format=INT; https://doaj.org/toc/2300-1941

URL الوصول: https://doaj.org/article/5a32ab13398c471884d683f628c790a2

المؤلفون: Heikkinen, Ville, Nysten, Johan, Byman, Ville, Hemming, Björn, Lassila, Antti

المصدر: Heikkinen , V , Nysten , J , Byman , V , Hemming , B & Lassila , A 2020 , ' Multi-sensor optical profilometer for measurement of large freeforms at nm-level uncertainty ' , Surface Topography: Metrology and Properties , vol. 8 , no. 4 , 045030 . https://doi.org/10.1088/2051-672X/abd293

مصطلحات موضوعية: Confocal, Interferometry, Metrology, Profilometry, Scanning white light interferometer, Stitching

وصف الملف: application/pdf

الاتاحة: https://cris.vtt.fi/en/publications/b219f804-c6ae-4dfd-af8e-e6eccf443e4f
https://doi.org/10.1088/2051-672X/abd293
https://cris.vtt.fi/ws/files/44595386/abd293.pdf
http://www.scopus.com/inward/record.url?scp=85099337737&partnerID=8YFLogxK

المؤلفون: Haruhiko Ohashi, Hidekazu Mimura, Hikaru Kishimoto, Takashi Kimura, Takenori Shimamura, Yasunori Senba, Yoko Takeo, 三村 秀和, 仙波 泰徳, 大橋 治彦, 岸本 輝, 島村 勇徳, 木村 隆志, 竹尾 陽子

المصدر: Proceedings of JSPE Semestrial Meeting. 2021, :664

المؤلفون: Kohei Kobayashi, Makoto Naruse, Mikio Ishikawa, Mitsuru Kitamura, Morihisa Hoga, Naoki Yoshida, Naoya Tate, Tsutomu Matsumoto, Yosuke Ueba, 上羽 陽介, 北村 満, 吉田 直樹, 小林 昂平, 成瀬 誠, 松本 勉, 法元 盛久, 石川 幹雄, 竪 直也

المصدر: JSAP Annual Meetings Extended Abstracts. 2020, :627

المؤلفون: Wen, Yan, Xie, Lechun, Wang, Zhou, Wang, Liqiang, Lu, Weijie, Zhang, Laichang

المصدر: Research outputs 2014 to 2021

مصطلحات موضوعية: Aluminum alloys, Etching, Hardness, Microstructure, Nanoindentation, Scanning electron microscopy, Spheres, Ternary alloys, Titanium alloys, Vanadium alloys, Maximum hardness, Nano-indentation methods, Plastic response, Spherical indentations, Surface etching, Three dimensional contour, Ti-6 Al-4 V, White-light interferometer, Indentation, Spherical loading, Ti-6Al-4V, Engineering

وصف الملف: application/pdf

Relation: https://ro.ecu.edu.au/ecuworkspost2013/6470; https://ro.ecu.edu.au/context/ecuworkspost2013/article/7475/viewcontent/Nanoindentation_characterization_on_local_plastic_response_of_Ti_6Al_4V_under_high_load_spherical_indentation.pdf

الاتاحة: https://ro.ecu.edu.au/ecuworkspost2013/6470
https://doi.org/10.1016/j.jmrt.2019.06.009
https://ro.ecu.edu.au/context/ecuworkspost2013/article/7475/viewcontent/Nanoindentation_characterization_on_local_plastic_response_of_Ti_6Al_4V_under_high_load_spherical_indentation.pdf

المؤلفون: Hidekazu Mimura, Takenori Shimamura, 三村 秀和, 島村 勇徳

المصدر: Proceedings of JSPE Semestrial Meeting. 2019, :764

المؤلفون: Hural, Tetiana, Kyryliuk, Mykola, Ovchar, Mykola, Nastich Viktor, Viktor

المصدر: Вестник Киевского политехнического института. Серия приборостроение; № 54(2) (2017); 32-40 ; Bulletin of Kyiv Polytechnic Institute. Series Instrument Making; No. 54(2) (2017); 32-40 ; Вісник Київського політехнічного інституту. Серія Приладобудування; № 54(2) (2017); 32-40 ; 2663-3450 ; 0321-2211

مصطلحات موضوعية: laser mirrors, ring laser, white light interferometer, лазерные зеркала, кольцевой лазер, интерферометр белого света, лазерні дзеркала, кільцевий лазер, інтерферометр білого світла

وصف الملف: application/pdf

Relation: http://visnykpb.kpi.ua/article/view/119517/114086; http://visnykpb.kpi.ua/article/view/119517

الاتاحة: http://visnykpb.kpi.ua/article/view/119517
https://doi.org/10.20535/1970.54(2).2017.119517

المؤلفون: Hayato Nishioka, Hidekazu Mimura, Hiroto Motoyama, Takenori Shimamura, Yusuke Matsuzawa, 三村 秀和, 島村 勇徳, 本山 央人, 松澤 雄介, 西岡 勇人

المصدر: Proceedings of JSPE Semestrial Meeting. 2018, :599

المؤلفون: Naoki YOSHIDA, Tsutomu MATSUMOTO, 吉田 直樹, 松本 勉

المصدر: レーザー研究 / The Review of Laser Engineering. 2019, 47(6):295

المؤلفون: Schlobohm, Jochen, Li, Yinan, Pösch, Andreas, Langmann, Benjamin, Kästner, Markus, Reithmeier, Eduard

المصدر: Proceedings of the 3rd International Conference in Through-life Engineering Services, 4-5 November 2013 ; Procedia CIRP 22 (2014)

مصطلحات موضوعية: Borescope, Fringe projection, Inline measurement, Metrology, Michelson interferometer, Mulstiscale, White light interferometer, Computer generated holography, Geometry, Inspection, Inspection equipment, Interferometers, Interferometry, Measurements, Michelson interferometers, Optical data processing, Optical testing, White-light interferometer, Projection systems, ddc:600, ddc:620, ddc:330, Konferenzschrift

Relation: http://dx.doi.org/10.15488/920; http://www.repo.uni-hannover.de/handle/123456789/944

الاتاحة: http://www.repo.uni-hannover.de/handle/123456789/944
https://doi.org/10.15488/920

المؤلفون: Chuang Li, Jun Yang, Zhangjun Yu, Yonggui Yuan, Jianzhong Zhang, Bing Wu, Feng Peng, Libo Yuan

المصدر: Sensors; Volume 16; Issue 3; Pages: 419

مصطلحات موضوعية: optical fiber sensor, polarization-maintaining fiber, white light interferometer, polarization mode coupling

وصف الملف: application/pdf

Relation: Physical Sensors; https://dx.doi.org/10.3390/s16030419

الاتاحة: https://doi.org/10.3390/s16030419

المؤلفون: Lööf, Pär-Johan, Dimkovski, Zlate, Cabanettes, Frederic, Nilsson, Per H., Rosén, Bengt-Göran

مصطلحات موضوعية: rough surfaces, white light interferometer, elastic contact, Tribology (Interacting Surfaces including Friction, Lubrication and Wear), Tribologi (ytteknik omfattande friktion, nötning och smörjning)

وصف الملف: application/pdf

Relation: http://urn.kb.se/resolve?urn=urn:nbn:se:hh:diva-32667

الاتاحة: http://urn.kb.se/resolve?urn=urn:nbn:se:hh:diva-32667

المؤلفون: Daisuke Yamaguchi, Hatsuzo Tashiro, Kazuhide Kamiya, Kimihisa Matsumoto, Shinya Suzuki, So Ito, Takashi Nomura, 伊東 聡, 山口 大輔, 松本 公久, 田代 発造, 神谷 和秀, 野村 俊, 鈴木 伸哉

المصدر: Proceedings of JSPE Semestrial Meeting. 2017, :959

المؤلفون: Shujie LIU, Yuanliang ZHANG, Zuolan YUAN

المصدر: Sensors & Transducers, Vol 178, Iss 9, Pp 135-139 (2014)

مصطلحات موضوعية: Photoresist measurement, White light interferometer, Multi-array probes, Wide area measurement, Technology (General), T1-995

Relation: http://www.sensorsportal.com/HTML/DIGEST/september_2014/Vol_178/P_2367.pdf; https://doaj.org/toc/2306-8515; https://doaj.org/toc/1726-5479; https://doaj.org/article/352440a6436e499cb0fa38834b9637c1

الاتاحة: https://doaj.org/article/352440a6436e499cb0fa38834b9637c1

المؤلفون: Daisuke Yamaguchi, Hatsuzo Tashiro, Kazuhide Kamiya, Kimihisa Matsumoto, Shinya Suzuki, Takashi Nomura, 山口 大輔, 松本 公久, 田代 発造, 神谷 和秀, 野村 俊, 鈴木 伸哉

المصدر: Proceedings of JSPE Semestrial Meeting. 2016, :33