المؤلفون: Matthias Stecher, W. Mamanee, Dionyz Pogany, Erich Gornik, N. Jensen, Sergey Bychikhin, D. Johnsson

المصدر: IEEE Transactions on Device and Materials Reliability. 12:562-569

مصطلحات موضوعية: Range (particle radiation), Electrostatic discharge, Materials science, business.industry, Transistor, Thermal breakdown, Electrical engineering, Electronic, Optical and Magnetic Materials, law.invention, Stress (mechanics), law, Optoelectronics, Electrical and Electronic Engineering, Current (fluid), Safety, Risk, Reliability and Quality, business, Thermal analysis, Failure mode and effects analysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::02dde9ffbbf491cf9b783a1cedea0169
https://doi.org/10.1109/tdmr.2012.2193884

المؤلفون: Dionyz Pogany, Sergey Bychikhin, Michael Heer, Erich Gornik, W. Mamanee

المصدر: Microelectronics Reliability. 51:1592-1596

مصطلحات موضوعية: Engineering, Electrostatic discharge, business.industry, Testing equipment, Gallium nitride, High-electron-mobility transistor, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Interferometry, chemistry.chemical_compound, Filamentation, chemistry, CMOS, Electronic engineering, Transient (oscillation), Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7e55d6f7dd39c7b64546fa26696d5b8e
https://doi.org/10.1016/j.microrel.2011.07.016

المؤلفون: A. Heid, W. Mamanee, P. Grombach, B. Ramler, Sergey Bychikhin, M. Klaussner, Dionyz Pogany, Winfried Soppa, Michael Heer

المصدر: Microelectronics Reliability. 47:1450-1455

مصطلحات موضوعية: Electrostatic discharge, Materials science, Current distribution, business.industry, Numerical analysis, Circuit design, Electrical engineering, Silicon on insulator, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Homogeneity (physics), Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Low voltage, NMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c606dde2ee2b10c09e08784d3be2448f
https://doi.org/10.1016/j.microrel.2007.07.092

المؤلفون: W. Mamanee, D. Johnsson, Dionyz Pogany, Erich Gornik, Sergey Bychikhin, M. Stecher

المصدر: 2008 IEEE International Reliability Physics Symposium.

مصطلحات موضوعية: Stress (mechanics), Materials science, Electrostatic discharge, business.industry, Bipolar junction transistor, Thermal, Optoelectronics, Device simulation, Edge (geometry), Current (fluid), business, Temperature measurement

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::85f67e3d8bab3d88e7af562d3b40d60f
https://doi.org/10.1109/relphy.2008.4558893

المؤلفون: N. Porntheerapat, Nitin Afzulpurkar, W. Mamanee, Tanom Lomas, Anurat Wisitsoraat, Adisorn Tuantranont

المصدر: 2007 7th IEEE Conference on Nanotechnology (IEEE NANO).

مصطلحات موضوعية: Materials science, Fabrication, Microchannel, Pneumatic actuator, business.industry, Microfluidics, Optoelectronics, Micropump, Nanotechnology, Diaphragm (mechanical device), business, Voltage, Volumetric flow rate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0c5cb524feeb83d3d23fc7f68b2a232a
https://doi.org/10.1109/nano.2007.4601399

المؤلفون: Sergey Bychikhin, D. Johnsson, W. Mamanee, V. Dubec, Matthias Stecher, P. Rodin, Dionyz Pogany, Erich Gornik

المصدر: Journal of Applied Physics. 105:084501

مصطلحات موضوعية: Condensed matter physics, Chemistry, Thermal breakdown, Bipolar junction transistor, Transistor, Analytical chemistry, General Physics and Astronomy, Total current, Avalanche breakdown, law.invention, Impact ionization, Temperature gradient, law, Ionization

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9e4bd1189834e2222929d5391e96ce69
https://doi.org/10.1063/1.3097305