يعرض 1 - 20 نتائج من 298 نتيجة بحث عن '"Vounckx, R."', وقت الاستعلام: 0.51s تنقيح النتائج
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    المصدر: Journal of Applied Physics; 12/1/2006, Vol. 100 Issue 11, p113120, 11p, 3 Diagrams, 2 Charts, 9 Graphs

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    Academic Journal

    المصدر: Journal of Applied Physics; 4/1/2002, Vol. 91 Issue 7, p3992, 8p, 2 Diagrams, 1 Chart, 6 Graphs

    مصطلحات موضوعية: NONLINEAR theories, OPTICS, ELECTRONS

  9. 9
    Conference

    المساهمون: Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang

    المصدر: SPIE Proceedings ; Optical Micro- and Nanometrology IV ; ISSN 0277-786X

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    Academic Journal

    المصدر: Journal of Applied Physics. 1/1/1997, Vol. 81 Issue 1, p1. 10p. 1 Black and White Photograph, 1 Diagram, 1 Chart, 24 Graphs.

    مصطلحات موضوعية: *PLASMONS (Physics), *WAVEGUIDES

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    Academic Journal

    المؤلفون: Stiens, J., Vounckx, R.

    المصدر: Journal of Applied Physics. 9/15/1994, Vol. 76 Issue 6, p3526. 8p. 4 Charts, 5 Graphs.

    مصطلحات موضوعية: *SEMICONDUCTORS, *ALLOYS

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    Academic Journal

    المؤلفون: Kuijk, M., Vounckx, R.

    المصدر: Journal of Applied Physics. 8/15/1989, Vol. 66 Issue 4, p1544. 5p.

    مصطلحات موضوعية: *FAR infrared lasers, *PHOTONS, *FREE electron lasers, *SEMICONDUCTORS

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    Conference

    المساهمون: UCL - SST/ICTM - Institute for Information and Communication. Technologies, Electronics and Applied Mathematics

    Relation: boreal:67360; http://hdl.handle.net/2078.1/67360; urn:ISSN:0277-786X

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    Conference

    المساهمون: Witzigmann, Bernd, Henneberger, Fritz, Arakawa, Yasuhiko, Osinski, Marek

    المصدر: Physics and Simulation of Optoelectronic Devices XVIII ; SPIE Proceedings ; ISSN 0277-786X

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    Conference

    المساهمون: Witzigmann, Bernd, Henneberger, Fritz, Arakawa, Yasuhiko, Osinski, Marek

    المصدر: Physics and Simulation of Optoelectronic Devices XVIII ; SPIE Proceedings ; ISSN 0277-786X

  17. 17
    Conference

    المؤلفون: Islam, S., Stiens, J., Vounckx, R.

    المساهمون: Johnson, Nigel P., Özbay, Ekmel, Ziolkowski, Richard W., Zheludev, Nikolay I.

    المصدر: SPIE Proceedings ; Metamaterials V ; ISSN 0277-786X

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    Conference

    المساهمون: Johnson, Nigel P., Özbay, Ekmel, Ziolkowski, Richard W., Zheludev, Nikolay I.

    المصدر: SPIE Proceedings ; Metamaterials V ; ISSN 0277-786X

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