يعرض 1 - 20 نتائج من 191 نتيجة بحث عن '"Vladimir P. Markevich"', وقت الاستعلام: 0.50s تنقيح النتائج
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    Academic Journal
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    المساهمون: Brendel, Rolf, Ballif, Christophe, Dubois, Sebastien, Glunz, Stefan, Hahn, Giso, Poortmans, Jef, Verlinden, Pierre, Weeber, Arthur

    المصدر: De Guzman, J A T, Markevich, V P, Mullins, J, Grant, N, Murphy, J D, Hiller, D, Halsall, M P & Peaker, A R 2022, Formation and Elimination of Electrically Active Thermally-Induced Defects in Float-Zone-Grown Silicon Crystals . in R Brendel, C Ballif, S Dubois, S Glunz, G Hahn, J Poortmans, P Verlinden & A Weeber (eds), SiliconPV 2021-11th International Conference on Crystalline Silicon Photovoltaics ., 130003, AIP Conference Proceedings, vol. 2487, American Institute of Physics, 11th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2021, Hamelin, Virtual, Germany, 19/04/21 . https://doi.org/10.1063/5.0089287

    وصف الملف: application/pdf

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    المساهمون: University of Manchester, Department of Electronics and Nanoengineering, University of Aveiro, Nexcel Electronic Technology, Leibniz Institute for Crystal Growth, Aalto-yliopisto, Aalto University

    المصدر: De Guzman, J A T, Markevich, V P, Hawkins, I D, Ayedh, H M, Coutinho, J, Binns, J, Falster, R, Abrosimov, N V, Crowe, I F, Halsall, M P & Peaker, A R 2021, ' Indium-Doped Silicon for Solar Cells—Light-Induced Degradation and Deep-Level Traps ', Physica Status Solidi (A) Applications and Materials Science . https://doi.org/10.1002/pssa.202100108

    وصف الملف: application/pdf

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    المصدر: Jafari, S, Zhu, Y, Rougieux, F, De Guzman, J A T, Markevich, V P, Peaker, A R & Hameiri, Z 2021, ' On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon ', ACS Applied Materials and Interfaces, vol. 13, no. 5, pp. 6140–6146 . https://doi.org/10.1021/acsami.0c17549

    وصف الملف: application/pdf

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    المصدر: Zhu, Y, Rougieux, F, Grant, N E, De Guzman, J A T, Murphy, J D, Markevich, V P, Coletti, G, Peaker, A R & Hameiri, Z 2021, ' Electrical Characterization of Thermally Activated Defects in n-Type Float-Zone Silicon ', IEEE Journal of Photovoltaics, vol. 11, no. 1, 9244147, pp. 26-35 . https://doi.org/10.1109/JPHOTOV.2020.3031382

    وصف الملف: application/pdf

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    المصدر: De Guzman, J A T, Markevich, V P, Hawkins, I D, Coutinho, J, Ayedh, H M, Binns, J, Abrosimov, N V, Lastovskii, S B, Crowe, I F, Halsall, M P & Peaker, A R 2021, ' Acceptor-oxygen defects in silicon : The electronic properties of centers formed by boron, gallium, indium, and aluminum interactions with the oxygen dimer ', Journal of Applied Physics, vol. 130, no. 24, 245703 . https://doi.org/10.1063/5.0076980